Search results
- 1.0481585 - ÚPT 2018 RIV HR eng C - Conference Paper (international conference)
Konvalina, Ivo - Paták, Aleš - Mika, Filip - Müllerová, Ilona
STEM modes in SEM – simulations and experiments.
13th Multinational Congress on Microscopy: Book of Abstracts. Zagreb: Ruder Bošković Institute, Croatian Microscopy Society, 2017 - (Gajović, A.; Weber, I.; Kovačević, G.; Čadež, V.; Šegota, S.; Peharec Štefanić, P.; Vidoš, A.), s. 140-141. ISBN 978-953-7941-19-2.
[Multinational Congress on Microscopy /13./. Rovinj (HR), 24.09.2017-29.09.2017]
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731
Keywords : STEM detector * trajectory simulations * cathode lens * collection efficiency
OECD category: Electrical and electronic engineering
Permanent Link: http://hdl.handle.net/11104/0277129 - 2.0436878 - ÚPT 2016 RIV NL eng J - Journal Article
Frank, Luděk - Nebesářová, Jana - Vancová, Marie - Paták, Aleš - Müllerová, Ilona
Imaging of tissue sections with very slow electrons.
Ultramicroscopy. Roč. 148, JAN 2015 (2015), s. 146-150. ISSN 0304-3991. E-ISSN 1879-2723
R&D Projects: GA TA ČR TE01020118; GA MŠMT(CZ) LO1212
Institutional support: RVO:68081731 ; RVO:60077344
Keywords : Biological STEM * Ultralow energy STEM * Tissue sections * Cathode lens * Depolymerisation
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 2.874, year: 2015
Permanent Link: http://hdl.handle.net/11104/0240520 - 3.0436805 - ÚPT 2015 RIV US eng J - Journal Article
Müllerová, Ilona - Mikmeková, Šárka - Mikmeková, Eliška - Pokorná, Zuzana - Frank, Luděk
Exploitation of Contrasts in Low Energy SEM to Reveal True Microstructure.
Microscopy and Microanalysis. Roč. 20, S3 (2014), s. 858-859. ISSN 1431-9276. E-ISSN 1435-8115
R&D Projects: GA TA ČR TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : scanning low energy electron microscopy * contrast * cathode lens
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.872, year: 2014
Permanent Link: http://hdl.handle.net/11104/0240464 - 4.0423862 - ÚPT 2014 DE eng C - Conference Paper (international conference)
Pokorná, Zuzana - Knápek, Alexandr
Scanning Low Energy Electron Microscopy for the determination of crystallographic orientation of polycrystalline metal grains.
Microscopy conference (MC) 2013. Proceedings. Vol. 2. Regensburg: University of Regensburg, 2013, s. 329-330.
[Microscopy Conference 2013. Regensburg (DE), 25.08.2013-30. 08.2013]
Institutional support: RVO:68081731
Keywords : SLEEM * Crystallographic orientation * polycrystalline metal * cathode lens
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0229924 - 5.0422788 - ÚPT 2014 CZ eng K - Conference Paper (Czech conference)
Frank, Luděk - Nebesářová, Jana - Vancová, Marie - Paták, Aleš - Müllerová, Ilona
Very low energy STEM for biology.
Mikroskopie 2013. Praha: Československá mikroskopická společnost, 2013, s. 19.
[Mikroskopie 2013. Lednice (CZ), 13.05.2013-14.05.2013]
R&D Projects: GA TA ČR TE01020118; GA ČR GAP108/11/2270; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731 ; RVO:60077344
Keywords : tissue sections * ultra-low-energy STEM * cathode lens
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0229236 - 6.0420896 - ÚPT 2014 RIV GB eng J - Journal Article
Mikmeková, Šárka - Yamada, K. - Noro, H.
TRIP steel microstructure visualized by slow and very slow electrons.
Microscopy. Roč. 62, č. 6 (2013), s. 589-596. ISSN 2050-5698. E-ISSN 2050-5701
R&D Projects: GA TA ČR TE01020118
Institutional support: RVO:68081731
Keywords : SLEEM * SEM * crystallographic contrast * surface sensitivity * multi-phase steels * cathode lens mode
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0227360 - 7.0385193 - ÚPT 2013 RIV CH eng J - Journal Article
Frank, Luděk - Hovorka, Miloš - Mikmeková, Šárka - Mikmeková, Eliška - Müllerová, Ilona - Pokorná, Zuzana
Scanning Electron Microscopy with Samples in an Electric Field.
Materials. Roč. 5, č. 12 (2012), s. 2731-2756. E-ISSN 1996-1944
R&D Projects: GA ČR GAP108/11/2270; GA TA ČR TE01020118; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : scanning electron microscopy * slow electrons * low energy SEM * low energy STEM * cathode lens
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 2.247, year: 2012
Permanent Link: http://hdl.handle.net/11104/0214527 - 8.0379933 - ÚPT 2012 RIV CZ eng C - Conference Paper (international conference)
Müllerová, Ilona - Konvalina, Ivo - Mika, Filip
Collection contrast in the immersion objective lens of the scanning electron microscope.
Proceedings of the 13th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2012 - (Mika, F.), -, -, s. 49-50. ISBN 978-80-87441-07-7.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /13./. Skalský dvůr (CZ), 25.06.2012-29.06.2012]
R&D Projects: GA MPO FR-TI3/323
Institutional support: RVO:68081731
Keywords : scanning electron microscope * cathode lens * secondary electrons * backscattered electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0210780 - 9.0379918 - ÚPT 2013 RIV AU eng C - Conference Paper (international conference)
Pokorná, Zuzana - Mikmeková, Šárka - Matsuda, K. - Müllerová, Ilona - Frank, Luděk
Backscattered electrons in examination of materials.
Coneference Proceedings APMC-10, ICONN 2012 and ACMM-22. Wembley: EECW Pty Ltd, 2012, 940:1-2. ISBN 978-1-74052-245-8.
[Asia-Pacific Microscopy Conference (APMC-10) - International Conference on Nanoscience and Nanotechnology (ICONN 2012) - Australian Conference on Microscopy and Microanalysis (ACMM-22). Perth (AU), 05.02.2012-09.02.2012]
R&D Projects: GA ČR GAP108/11/2270
Institutional support: RVO:68081731
Keywords : scanning electron microscope * backscattered electrons * cathode lens
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0210769 - 10.0379917 - ÚPT 2012 RIV AU eng C - Conference Paper (international conference)
Hovorka, Miloš - Müllerová, Ilona - Frank, Luděk
Very Low Energy STEM and Imaging of Free-standing Foils.
Coneference Proceedings APMC-10, ICONN 2012 and ACMM-22. Wembley: EECW Pty Ltd, 2012, 411:1-2. ISBN 978-1-74052-245-8.
[Asia-Pacific Microscopy Conference (APMC-10) - International Conference on Nanoscience and Nanotechnology (ICONN 2012) - Australian Conference on Microscopy and Microanalysis (ACMM-22). Perth (AU), 05.02.2012-09.02.2012]
R&D Projects: GA MPO FR-TI3/323
Institutional support: RVO:68081731
Keywords : scanning low energy electron microscopy * cathode lens * transmitted electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0210768