Search results
- 1.0420896 - ÚPT 2014 RIV GB eng J - Journal Article
Mikmeková, Šárka - Yamada, K. - Noro, H.
TRIP steel microstructure visualized by slow and very slow electrons.
Microscopy. Roč. 62, č. 6 (2013), s. 589-596. ISSN 2050-5698. E-ISSN 2050-5701
R&D Projects: GA TA ČR TE01020118
Institutional support: RVO:68081731
Keywords : SLEEM * SEM * crystallographic contrast * surface sensitivity * multi-phase steels * cathode lens mode
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0227360 - 2.0367162 - ÚPT 2012 CZ eng K - Conference Paper (Czech conference)
Frank, Luděk - Mikmeková, Šárka - Konvalina, Ivo - Müllerová, Ilona - Hovorka, Miloš
Prospects of the scanning low energy electron microscopy in materials science.
Mikroskopie 2011. Nové Město na Moravě: Československá mikroskopická společnost, 2011 - (Frank, L.; Hozák, P.), s. 42. ISBN N.
[Mikroskopie 2011. Nové Město na Moravě (CZ), 17.02.2011-18.02.2011]
Institutional research plan: CEZ:AV0Z20650511
Keywords : SLEEM * cathode lens mode
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0006669 - 3.0350665 - ÚPT 2011 RIV CZ eng C - Conference Paper (international conference)
Mikmeková, Šárka - Hovorka, Miloš - Konvalina, Ivo - Müllerová, Ilona - Frank, Luděk
Prospects of the scanning low energy electron microscopy in materials science.
Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010 - (Mika, F.), s. 37-38. ISBN 978-80-254-6842-5.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./. Skalský dvůr (CZ), 31.05.2010-04.06.2010]
R&D Projects: GA MŠMT OE08012
Institutional research plan: CEZ:AV0Z20650511
Keywords : scanning low energy electron microscopy * scanning electron microscopy * transmission electron microscopy * focused ion beam microscopy * cathode lens mode
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://arl-repository.lib.cas.cz/uloziste_av/UPT-D/cav_un_epca-0350665_01.pdf
Permanent Link: http://hdl.handle.net/11104/0190605 - 4.0315458 - ÚPT 2009 RIV CZ eng C - Conference Paper (international conference)
Müllerová, Ilona - Matsuda, K. - Frank, Luděk
Low Energy Electron Microscopy in Materials Science.
[Nízko energiová elektronová mikroskopie v materiálových vědách.]
Proceedings of the 11th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2008 - (Mika, F.), s. 85-86. ISBN 978-80-254-0905-3.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /11./. Skalský dvůr (CZ), 14.07.2008-18.07.2008]
R&D Projects: GA MŠMT OE08012
Institutional research plan: CEZ:AV0Z20650511
Keywords : collection efficiency * cathode lens mode * material contrast
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0165656 - 5.0094363 - ÚPT 2008 RIV ES eng M - Monography Chapter
Müllerová, Ilona - Frank, Luděk
Very Low Energy Scanning Electron Microscopy.
[Rastrovací elektronová mikroskopie na velmi nízkých energiích.]
Modern Research and Educational Topics in Microscopy. Vol. 2. Badajoz: Formatex, 2007 - (Méndez-Vilas, A.; Diaz, J.), s. 795-804. Microscopy series, 3. ISBN 978-84-611-9420-9
R&D Projects: GA ČR GA102/05/2327; GA ČR GA202/04/0281
Institutional research plan: CEZ:AV0Z20650511
Keywords : electron optics * scanning electron microscopy * low energy electrons * cathode lens mode * surfaces
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0154189 - 6.0050901 - ÚPT 2007 RIV JP eng C - Conference Paper (international conference)
Müllerová, Ilona
Scanning Low Energy Electron Microscopy.
[Rastrovací nízkoenergiová elektronová mikroskopie.]
Proceedings of the 16th International Microscopy Congress - IMC16 (Vol. 2). Sapporo: Japanese Society of Microscopy, 2006, s. 651.
[IMC16 - International Microscopy Congress /16./. Sapporo (JP), 03.09.2006-08.09.2006]
R&D Projects: GA ČR GA102/05/2327
Institutional research plan: CEZ:AV0Z20650511
Keywords : scanning electron microscopy * cathode lens mode * very low energies
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0140934 - 7.0049017 - ÚPT 2007 RIV CZ eng C - Conference Paper (international conference)
Müllerová, Ilona
Cathode Lens Mode in the Scanning Electron Microscope.
[Režim katodové čočky v rastrovacím elektronovém mikroskopu.]
Proceedings of the 10th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: ISI AS CR, 2006 - (Müllerová, I.), s. 49-52. ISBN 80-239-6285-X.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /10./. Skalský dvůr (CZ), 22.05.2006-26.05.2006]
R&D Projects: GA ČR GA102/05/2327
Institutional research plan: CEZ:AV0Z20650511
Keywords : cathode lens mode * SEM * very slow electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0139514 - 8.0049009 - ÚPT 2007 RIV CZ eng C - Conference Paper (international conference)
Frank, Luděk
The Dopant Contrast – A Challenge to Electron Microscopy.
[Kontrast dopantu – otázka pro elektronovou mikroskopii.]
Proceedings of the 10th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: ISI AS CR, 2006 - (Müllerová, I.), s. 19-22. ISBN 80-239-6285-X.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /10./. Skalský dvůr (CZ), 22.05.2006-26.05.2006]
R&D Projects: GA ČR GA202/04/0281
Institutional research plan: CEZ:AV0Z20650511
Keywords : dopant contrast * SEM * PEEM * cathode lens mode
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0139506