Search results
- 1.0544223 - ÚPT 2022 RIV US eng J - Journal Article
Ma, Haili - Mikmeková, Šárka - Konvalina, Ivo - Yin, X. - Sun, F. - Piňos, Jakub - Vaškovicová, Naděžda - Průcha, Lukáš - Müllerová, Ilona - Mikmeková, Eliška - Chen, D.
Imaging ferroelectric nanodomains in strained BiFeO3 nanoscale films using scanning low-energy electron microscopy: Implications for low-power devices.
ACS Applied Nano Materials. Roč. 4, č. 4 (2021), s. 3725-3733. ISSN 2574-0970
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : scanning low-energy electron microscopy (SLEEM) * BiFeO3 nanoscale films * ferroelectric nanodomains * low-loss backscattered electrons * multiferroic
OECD category: Electrical and electronic engineering
Impact factor: 6.140, year: 2021
Method of publishing: Limited access
https://pubs.acs.org/doi/10.1021/acsanm.1c00204
Permanent Link: http://hdl.handle.net/11104/0321265 - 2.0493332 - ÚPT 2019 US eng A - Abstract
Müllerová, Ilona - Frank, Luděk - Konvalina, Ivo - Mikmeková, Eliška
Role of the Angular Distribution of Backscattered Electrons in Low Energy Scanning Electron Microscope.
Microscopy and Microanalysis. Cambridge University Press. Roč. 24, S1 (2018), s. 638-639. ISSN 1431-9276. E-ISSN 1435-8115.
[Microscopy & Microanalysis 2018 Meeting. 05.08.2018-09.08.2018, Baltimore]
R&D Projects: GA TA ČR(CZ) TE01020118
EU Projects: European Commission(XE) 606988 - SIMDALEE2
Institutional support: RVO:68081731
Keywords : angular distribution * backscattered electrons * low energy * SEM
OECD category: Nano-materials (production and properties)
Permanent Link: http://hdl.handle.net/11104/0286715 - 3.0477097 - ÚPT 2018 RIV GB eng J - Journal Article
Piňos, Jakub - Mikmeková, Šárka - Frank, Luděk
About the information depth of backscattered electron imaging.
Journal of Microscopy. Roč. 266, č. 3 (2017), s. 335-342. ISSN 0022-2720. E-ISSN 1365-2818
Institutional support: RVO:68081731
Keywords : backscattered electrons * information depth * penetration of electrons
OECD category: Materials engineering
Impact factor: 1.693, year: 2017
Permanent Link: http://hdl.handle.net/11104/0273494 - 4.0379933 - ÚPT 2012 RIV CZ eng C - Conference Paper (international conference)
Müllerová, Ilona - Konvalina, Ivo - Mika, Filip
Collection contrast in the immersion objective lens of the scanning electron microscope.
Proceedings of the 13th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2012 - (Mika, F.), -, -, s. 49-50. ISBN 978-80-87441-07-7.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /13./. Skalský dvůr (CZ), 25.06.2012-29.06.2012]
R&D Projects: GA MPO FR-TI3/323
Institutional support: RVO:68081731
Keywords : scanning electron microscope * cathode lens * secondary electrons * backscattered electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0210780 - 5.0379919 - ÚPT 2013 RIV AU eng C - Conference Paper (international conference)
Neděla, Vilém - Konvalina, Ivo - Lencová, B. - Zlámal, J. - Jirák, J.
New detection systems of secondary and backscattered electrons for environmental scanning electron microscopes.
Coneference Proceedings APMC-10, ICONN 2012 and ACMM-22. Wembley: EECW Pty Ltd, 2012, 370:1-2. ISBN 978-1-74052-245-8.
[Asia-Pacific Microscopy Conference (APMC-10) - International Conference on Nanoscience and Nanotechnology (ICONN 2012) - Australian Conference on Microscopy and Microanalysis (ACMM-22). Perth (AU), 05.02.2012-09.02.2012]
R&D Projects: GA ČR GAP102/10/1410; GA MŠMT EE.2.3.20.0103
Institutional support: RVO:68081731
Keywords : environmental scanning electron microscope * detection systems * secondary electrons * backscattered electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0210770 - 6.0379918 - ÚPT 2013 RIV AU eng C - Conference Paper (international conference)
Pokorná, Zuzana - Mikmeková, Šárka - Matsuda, K. - Müllerová, Ilona - Frank, Luděk
Backscattered electrons in examination of materials.
Coneference Proceedings APMC-10, ICONN 2012 and ACMM-22. Wembley: EECW Pty Ltd, 2012, 940:1-2. ISBN 978-1-74052-245-8.
[Asia-Pacific Microscopy Conference (APMC-10) - International Conference on Nanoscience and Nanotechnology (ICONN 2012) - Australian Conference on Microscopy and Microanalysis (ACMM-22). Perth (AU), 05.02.2012-09.02.2012]
R&D Projects: GA ČR GAP108/11/2270
Institutional support: RVO:68081731
Keywords : scanning electron microscope * backscattered electrons * cathode lens
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0210769 - 7.0379916 - ÚPT 2012 RIV AU eng C - Conference Paper (international conference)
Müllerová, Ilona - Konvalina, Ivo - Hovorka, Miloš - Mika, Filip
Approaches to the Collection Contrast in the Immersion Objective Lens of the Scanning Electron Microscope.
Coneference Proceedings APMC-10, ICONN 2012 and ACMM-22. Wembley: EECW Pty Ltd, 2012, 410:1-2. ISBN 978-1-74052-245-8.
[Asia-Pacific Microscopy Conference (APMC-10) - International Conference on Nanoscience and Nanotechnology (ICONN 2012) - Australian Conference on Microscopy and Microanalysis (ACMM-22). Perth (AU), 05.02.2012-09.02.2012]
R&D Projects: GA MPO FR-TI3/323
Institutional support: RVO:68081731
Keywords : scanning electron microscopy * cathode lens * secondary electrons * backscattered electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0210767 - 8.0352422 - ÚPT 2011 RIV BR eng C - Conference Paper (international conference)
Müllerová, Ilona - Hovorka, Miloš - Frank, Luděk
Advances in Low Energy Scanning Electron Microscopy.
Proceedings of the 17th IFSM International Microscopy Congress. Rio de Janeiro: Sociedade Brasileira de Microscopia e Microanilise, 2010, s. 256-257. ISBN 978-85-63273-06-2.
[International Microscopy Congress (IMC17) /17./. Rio de Janeiro (BR), 19.09.2010-24.09.2010]
R&D Projects: GA AV ČR IAA100650902
Institutional research plan: CEZ:AV0Z20650511
Keywords : electron microscopy * cathode lens * slow backscattered electrons * STEM * VLESTEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0191930 - 9.0352416 - ÚPT 2011 RIV BR eng C - Conference Paper (international conference)
Mikmeková, Šárka - Hovorka, Miloš - Müllerová, Ilona - Frank, Luděk
Low Energy Reflection and High Angle Reflection of Electrons in the SEM.
Proceedings of the 17th IFSM International Microscopy Congress. Rio de Janeiro: Sociedade Brasileira de Microscopia e Microanilise, 2010, I3.7: 1-2. ISBN 978-85-63273-06-2.
[International Microscopy Congress (IMC17) /17./. Rio de Janeiro (BR), 19.09.2010-24.09.2010]
R&D Projects: GA MŠMT OE08012
Institutional research plan: CEZ:AV0Z20650511
Keywords : scanning electron microscopy * crystallinic structure * slow backscattered electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0191924 - 10.0205672 - UPT-D 20030054 CZ cze K - Conference Paper (Czech conference)
Wandrol, Petr
Angular distribution of backscattered electrons signal in Environmental Scanning Electron Microscopy.
[Angular distribution of backscattered electrons signal in Environmental Scanning Electron Microscopy.]
3. ročník přehlídky doktorských prací Elektrotechnika a informatika 2002. Plzeň: Západočeská univerzita v Plzni, 2002, s. 325 - 328. ISBN 80-7082-904-4.
[Elektrotechnika a informatika 2002. Zámek Nečtiny (CZ), 23.10.2002-24.10.2002]
R&D Projects: GA ČR GA102/01/1271; GA AV ČR IBS2065107
Institutional research plan: CEZ:AV0Z2065902
Keywords : solid angle * detection * backscattered electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0101285