Search results
- 1.0481585 - ÚPT 2018 RIV HR eng C - Conference Paper (international conference)
Konvalina, Ivo - Paták, Aleš - Mika, Filip - Müllerová, Ilona
STEM modes in SEM – simulations and experiments.
13th Multinational Congress on Microscopy: Book of Abstracts. Zagreb: Ruder Bošković Institute, Croatian Microscopy Society, 2017 - (Gajović, A.; Weber, I.; Kovačević, G.; Čadež, V.; Šegota, S.; Peharec Štefanić, P.; Vidoš, A.), s. 140-141. ISBN 978-953-7941-19-2.
[Multinational Congress on Microscopy /13./. Rovinj (HR), 24.09.2017-29.09.2017]
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731
Keywords : STEM detector * trajectory simulations * cathode lens * collection efficiency
OECD category: Electrical and electronic engineering
Permanent Link: http://hdl.handle.net/11104/0277129 - 2.0452656 - ÚPT 2016 AT eng A - Abstract
Walker, Christopher - Mika, Filip - Konvalina, Ivo - Müllerová, Ilona - Frank, Luděk
Experiment-Simulation comparison of the transmission of electrons through thin films in an SEM with a STEM Detector.
Low Energy Electrons: Dynamics and Correlation near Surfaces and Nanostructures (LEE2015). Vienna: IAP, 2015. s. 45.
[Low Energy Electrons: Dynamics and Correlation near Surfaces and Nanostructures (LEE2015). 07.09.2015-11.09.2015, Herstein]
R&D Projects: GA MŠMT(CZ) LO1212
Institutional support: RVO:68081731
Keywords : SEM * STEM detector * Monte-Carlo simulations
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0257883 - 3.0399770 - ÚFM 2014 RIV CZ eng C - Conference Paper (international conference)
Petrenec, M. - Strunz, Pavel - Gasser, U. - Heczko, Milan - Zálešák, J. - Polák, Jaroslav
NANOSTRUCTURE CHARACTERIZATION OF IN738LC SUPERALLOY FATIGUED AT HIGH TEMPERATURE.
NANOCON 2013 Conference Proceedings. Ostrava: Tanger, 2013, art. no. 2001. ISBN 978-80-87294-44-4.
[NANOCON 2013. International Conference /5./. Brno (CZ), 16.10.2013-18.10.2013]
R&D Projects: GA ČR(CZ) GAP204/11/1453; GA MŠMT(CZ) ED1.1.00/02.0068; GA MŠMT LM2011019
Institutional support: RVO:68081723 ; RVO:61389005
Keywords : superalloys * nano-precipitation * neutron scattering * STEM detector * TEM
OECD category: Audio engineering, reliability analysis
Permanent Link: http://hdl.handle.net/11104/0226982