Search results
- 1.0522528 - ÚTIA 2021 RIV GB eng J - Journal Article
Kostková, Jitka - Flusser, Jan - Lébl, Matěj - Pedone, M.
Handling Gaussian Blur without Deconvolution.
Pattern Recognition. Roč. 103, č. 1 (2020), č. článku 107264. ISSN 0031-3203. E-ISSN 1873-5142
R&D Projects: GA ČR GA18-07247S
Institutional support: RVO:67985556
Keywords : Gaussian blur * Semi-group * Projection operator * Blur invariants * Image moments * Affine transformation * Combined invariants
OECD category: Computer sciences, information science, bioinformathics (hardware development to be 2.2, social aspect to be 5.8)
Impact factor: 7.740, year: 2020
Method of publishing: Limited access
http://library.utia.cas.cz/separaty/2020/ZOI/kostkova-0522528.pdf https://www.sciencedirect.com/science/article/pii/S0031320320300698
Permanent Link: http://hdl.handle.net/11104/0307360 - 2.0506779 - ÚTIA 2020 RIV CH eng C - Conference Paper (international conference)
Kostková, Jitka - Flusser, Jan - Lébl, Matěj - Pedone, M.
Image Invariants to Anisotropic Gaussian Blur.
Image Analysis : 21st Scandinavian Conference, SCIA 2019. Cham: Springer, 2019, s. 140-151. Lecture Notes in Computer Science, 11482. ISBN 978-3-030-20204-0. ISSN 0302-9743. E-ISSN 1611-3349.
[Scandinavian Conference on Image Analysis - SCIA'19. Norkoping (SE), 11.06.2019-14.06.2019]
R&D Projects: GA ČR GA18-07247S
Institutional support: RVO:67985556
Keywords : Gaussian blur * Semi-group * Projection operator * Image moments * Moment invariants
OECD category: Computer sciences, information science, bioinformathics (hardware development to be 2.2, social aspect to be 5.8)
http://library.utia.cas.cz/separaty/2019/ZOI/kostkova-0506779.pdf
Permanent Link: http://hdl.handle.net/11104/0297951 - 3.0476980 - ÚTIA 2018 RIV CH eng C - Conference Paper (international conference)
Zita, Aleš - Flusser, Jan - Suk, Tomáš - Kotera, Jan
Feature Selection on Affine Moment Invariants in Relation to Known Dependencies.
Computer Analysis of Images and Patterns : 17th International Conference, CAIP 2017. Cham: Springer, 2017 - (Felsberg, M.; Heyden, A.; Krüger, N.), s. 285-295. Lecture Notes in Computer Science, LNCS 10425. ISBN 978-3-319-64698-5.
[International Conference on Computer Analysis of Images and Patterns (CAIP 2017) /17./. Ystad (SE), 22.08.2017-24.08.2017]
R&D Projects: GA ČR GA15-16928S
Grant - others:GA UK(CZ) 1094216
Institutional support: RVO:67985556
Keywords : Affine invariants * Image moments * Feature selection * Machine learning * Pattern recognition
OECD category: Automation and control systems
http://library.utia.cas.cz/separaty/2017/ZOI/zita-0476980.pdf
Permanent Link: http://hdl.handle.net/11104/0273427 - 4.0454335 - ÚTIA 2017 RIV US eng J - Journal Article
Flusser, Jan - Farokhi, Sajad - Höschl, Cyril - Suk, Tomáš - Zitová, Barbara - Pedone, M.
Recognition of Images Degraded by Gaussian Blur.
IEEE Transactions on Image Processing. Roč. 25, č. 2 (2016), s. 790-806. ISSN 1057-7149. E-ISSN 1941-0042
R&D Projects: GA ČR(CZ) GA15-16928S
Institutional support: RVO:67985556
Keywords : Blurred image * object recognition * blur invariant comparison * Gaussian blur * projection operators * image moments * moment invariants
Subject RIV: JD - Computer Applications, Robotics
Impact factor: 4.828, year: 2016
http://library.utia.cas.cz/separaty/2016/ZOI/flusser-0454335.pdf
Permanent Link: http://hdl.handle.net/11104/0257080 - 5.0447035 - ÚTIA 2016 RIV DE eng C - Conference Paper (international conference)
Flusser, Jan - Suk, Tomáš - Farokhi, Sajad - Höschl, Cyril
Recognition of Images Degraded by Gaussian Blur.
Computer Analysis of Images and Patterns - CAIP 2015. Vol. I. Switzerland: Springer International Publishing, 2015 - (Azzopardi, G.; Petkov, N.), s. 88-99. Lecture Notes in Computer Science, 9256. ISBN 978-3-319-23192-1. ISSN 0302-9743.
[Computer Analysis of Images and Patterns. Valletta (MT), 02.09.2015-04.09.2015]
R&D Projects: GA ČR(CZ) GA15-16928S
Institutional support: RVO:67985556
Keywords : Blurred image * Object recognition * Blur invariant comparison * Gaussian blur * Projection operators * Image moments * Moment invariants
Subject RIV: IN - Informatics, Computer Science
http://library.utia.cas.cz/separaty/2015/ZOI/flusser-0447035.pdf
Permanent Link: http://hdl.handle.net/11104/0249422 - 6.0434521 - ÚTIA 2017 RIV US eng J - Journal Article
Flusser, Jan - Suk, Tomáš - Boldyš, Jiří - Zitová, Barbara
Projection Operators and Moment Invariants to Image Blurring.
IEEE Transactions on Pattern Analysis and Machine Intelligence. Roč. 37, č. 4 (2015), s. 786-802. ISSN 0162-8828. E-ISSN 1939-3539
R&D Projects: GA ČR GA13-29225S; GA ČR GAP103/11/1552
Institutional support: RVO:67985556
Keywords : Blurred image * N-fold rotation symmetry * projection operators * image moments * moment invariants * blur invariants * object recognition
Subject RIV: JD - Computer Applications, Robotics
Impact factor: 6.077, year: 2015
http://library.utia.cas.cz/separaty/2014/ZOI/flusser-0434521.pdf
Permanent Link: http://hdl.handle.net/11104/0239389 - 7.0394390 - ÚTIA 2014 RIV DE eng J - Journal Article
Sedlář, Jiří - Zitová, Barbara - Kopeček, Jaromír - Flusser, Jan - Todorcius, T. - Kratochvílová, Irena
Automatic Determination of the Size of Elliptical Nanoparticles from AFM Images.
Journal of Nanoparticle Research. Roč. 15, č. 8 (2013), s. 1-10. ISSN 1388-0764. E-ISSN 1572-896X
R&D Projects: GA ČR GAP103/11/1552; GA ČR(CZ) GAP304/10/1951; GA TA ČR TA01011165
Institutional support: RVO:67985556 ; RVO:68378271
Keywords : Atomic force microscopy * Image moments * Pyrrole derivatives * Size determination * Watershed segmentation
Subject RIV: JD - Computer Applications, Robotics; BM - Solid Matter Physics ; Magnetism (FZU-D)
Impact factor: 2.278, year: 2013
http://library.utia.cas.cz/separaty/2013/ZOI/sedlar-0394390.pdf
Permanent Link: http://hdl.handle.net/11104/0222935 - 8.0390234 - ÚTIA 2014 RIV US eng J - Journal Article
Farokhi, S. - Shamsuddin, S. M. - Flusser, Jan - Sheikh, U. U. - Khansari, M. - Jafari-Khouzani, K.
Rotation and Noise Invariant Near-Infrared Face Recognition by means of Zernike Moments and Spectral Regression Discriminant Analysis.
Journal of Electronic Imaging. Roč. 22, č. 1 (2013), s. 1-11. ISSN 1017-9909. E-ISSN 1560-229X
R&D Projects: GA ČR GAP103/11/1552
Keywords : face recognition * infrared imaging * image moments
Subject RIV: JD - Computer Applications, Robotics
Impact factor: 0.850, year: 2013
http://library.utia.cas.cz/separaty/2013/ZOI/flusser-rotation and noise invariant near-infrared face recognition by means of zernike moments and spectral regression discriminant analysis.pdf
Permanent Link: http://hdl.handle.net/11104/0219539 - 9.0368768 - ÚTIA 2012 RIV US eng J - Journal Article
Kautsky, J. - Flusser, Jan
Blur Invariants Constructed From Arbitrary Moments.
IEEE Transactions on Image Processing. Roč. 20, č. 12 (2011), s. 3606-3611. ISSN 1057-7149. E-ISSN 1941-0042
R&D Projects: GA ČR GAP103/11/1552
Institutional research plan: CEZ:AV0Z10750506
Keywords : Blur invariants * image moments
Subject RIV: JD - Computer Applications, Robotics
Impact factor: 3.042, year: 2011
http://library.utia.cas.cz/separaty/2011/ZOI/flusser-0368768.pdf
Permanent Link: http://hdl.handle.net/11104/0203017 - 10.0360082 - ÚTIA 2012 RIV CZ eng C - Conference Paper (international conference)
Sedlář, Jiří - Zitová, Barbara - Kopeček, Jaromír - Todorciuc, T. - Kratochvílová, Irena
Detection of Elliptical Particles in Atomic Force Microscopy Images.
ICASSP 2011: IEEE International Conference on Acoustics, Speech, and Signal Processing. Praha: IEEE, 2011, s. 1233-1236. ISBN 978-1-4577-0539-7.
[ICASSP 2011: IEEE International Conference on Acoustics, Speech, and Signal Processing. Praha (CZ), 22.05.2011-27.05.2011]
R&D Projects: GA MŠMT 1M0572; GA ČR GA203/08/1594; GA AV ČR KAN401770651; GA ČR GAP103/11/1552
Institutional research plan: CEZ:AV0Z10750506; CEZ:AV0Z10100520
Keywords : particles detection * atomic force microscopy (AFM) imaging * watershed segmentation * image moments * approximation by ellipses
Subject RIV: IN - Informatics, Computer Science
http://library.utia.cas.cz/separaty/2011/ZOI/sedlar-detection of elliptical particles in atomic force microscopy images.pdf
Permanent Link: http://hdl.handle.net/11104/0197718