Search results
- 1.0456665 - FZÚ 2016 RIV DE eng J - Journal Article
Berger, Jan - Spadafora, Evan - Mutombo, Pingo - Jelínek, Pavel - Švec, Martin
Force-driven single-atom manipulation on a low-reactive Si surface for tip sharpening.
Small. Roč. 11, č. 30 (2015), s. 3686-3693. ISSN 1613-6810. E-ISSN 1613-6829
R&D Projects: GA ČR(CZ) GA14-02079S
Institutional support: RVO:68378271
Keywords : nc-AFM * atomic manipulation * silicon surface * DFT simulation
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 8.315, year: 2015
Permanent Link: http://hdl.handle.net/11104/0257158 - 2.0342573 - FZÚ 2011 RIV DE eng M - Monography Chapter
Pou, P. - Jelínek, Pavel - Pérez, R.
Basic mechanisms for single atom manipulation in semiconductor systems with the FM-AFM.
Noncontact Atomic Force Microscopy. Volume 2. Berlin: Springer, 2009 - (Morita, S.; Giessibl, F.; Wiesendanger, R.), s. 227-248. Nanoscience and Technology. ISBN 978-3-642-01494-9
R&D Projects: GA ČR GA202/09/0775; GA AV ČR IAA100100905
Institutional research plan: CEZ:AV0Z10100521
Keywords : AFM * DFT simulation * atomic manipulation
Subject RIV: BM - Solid Matter Physics ; Magnetism
Permanent Link: http://hdl.handle.net/11104/0185275 - 3.0316218 - FZÚ 2009 RIV US eng J - Journal Article
Sugimoto, Y. - Pou, P. - Custance, Ó. - Jelínek, Pavel - Abe, M. - Perez, R. - Morita, S.
Complex patterning by vertical interchange atom manipulation using atomic force microscopy.
[Komplexní vzorkování pomocí vertikální výměnné manipulace atomu pomocí mikroskopu atomárních sil.]
Science. Roč. 322, č. 5900 (2008), 413-417. ISSN 0036-8075. E-ISSN 1095-9203
R&D Projects: GA AV ČR IAA1010413
Institutional research plan: CEZ:AV0Z10100521
Keywords : AFM * atomic manipulation * DFT simulation
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 28.103, year: 2008
Permanent Link: http://hdl.handle.net/11104/0166209 - 4.0085133 - FZÚ 2008 RIV GB eng J - Journal Article
Sugimoto, Y. - Pou, P. - Abe, M. - Jelínek, Pavel - Pérez, R. - Morita, S. - Custance, Ó.
Chemical identification of individual surface atoms by atomic force microscopy.
[Chemická identifikace jednotlivých atomů na povrchu pomocímikroskopu atomárních sil.]
Nature. Roč. 446, - (2007), s. 64-67. ISSN 0028-0836. E-ISSN 1476-4687
R&D Projects: GA AV ČR IAA100100616; GA MŠMT 1K05020
Institutional research plan: CEZ:AV0Z10100521
Keywords : AFM * DFT simulation * dynamic forces spectroscopy
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 28.751, year: 2007
Permanent Link: http://hdl.handle.net/11104/0147704