Search results
- 1.0480451 - ÚPT 2018 RIV GB eng J - Journal Article
Řeřucha, Šimon - Yacoot, A. - Pham, Minh Tuan - Čížek, Martin - Hucl, Václav - Lazar, Josef - Číp, Ondřej
Laser source for dimensional metrology: investigation of an iodine stabilized system based on narrow linewidth 633 nm DBR diode.
Measurement Science and Technology. Roč. 28, č. 4 (2017), s. 1-11, č. článku 045204. ISSN 0957-0233. E-ISSN 1361-6501
R&D Projects: GA ČR GB14-36681G; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01; GA TA ČR TE01020233
Institutional support: RVO:68081731
Keywords : optical metrology * DBR laser diode * frequency stabilization * laser interferometry * dimensional metrology * iodine stabilization * displacement measurement
OECD category: Optics (including laser optics and quantum optics)
Impact factor: 1.685, year: 2017
Permanent Link: http://hdl.handle.net/11104/0276231 - 2.0467526 - ÚPT 2017 PL eng A - Abstract
Řeřucha, Šimon - Pham, Minh Tuan - Čížek, Martin - Hucl, Václav - Lazar, Josef - Číp, Ondřej - Yacoot, A.
DBR diode based laser source working at 633 nm for dimensional nanometrology.
NanoScale 2016. 11th Seminar on Quantitative Microscopy (QM) and 7th Seminar on Nanoscale Calibration Standards and Methods. Wroclaw: Wroclaw University of Technology, 2016. s. 109-110.
[NanoScale 2016. Seminar on Quantitative Microscopy (QM) /11./ and Seminar on Nanoscale Calibration Standards and Methods /7./. 09.03.2016-11.03.2016, Wroclaw]
R&D Projects: GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01; GA ČR GB14-36681G; GA TA ČR TE01020233
Institutional support: RVO:68081731
Keywords : laser metrology * DBR laser diode * laser interferometry * displacement metrology * laser system
Subject RIV: BH - Optics, Masers, Lasers
Permanent Link: http://hdl.handle.net/11104/0265622