Search results
- 1.0571242 - ÚPT 2023 RIV CZ eng O - Others
Müllerová, Ilona - Materna Mikmeková, Eliška - Konvalina, Ivo
Contamination mitigation strategy for SEMs.
2022
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : contamination * low energy electron microscopy * 2D crystals
OECD category: Materials engineering
Permanent Link: https://hdl.handle.net/11104/0342513 - 2.0481591 - ÚPT 2018 RIV HR eng C - Conference Paper (international conference)
Mikmeková, Eliška - Frank, Luděk - Polčák, J. - Paták, Aleš - Lejeune, M.
Examination of 2D crystals in a low voltage SEM/STEM.
13th Multinational Congress on Microscopy: Book of Abstracts. Zagreb: Ruder Bošković Institute, Croatian Microscopy Society, 2017 - (Gajović, A.; Weber, I.; Kovačević, G.; Čadež, V.; Šegota, S.; Peharec Štefanić, P.; Vidoš, A.), s. 618-619. ISBN 978-953-7941-19-2.
[Multinational Congress on Microscopy /13./. Rovinj (HR), 24.09.2017-29.09.2017]
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731
Keywords : low voltage SEM/STEM * 2D crystals * contamination
OECD category: Coating and films
Permanent Link: http://hdl.handle.net/11104/0277164 - 3.0481338 - ÚPT 2018 CN eng A - Abstract
Mikmeková, Eliška - Paták, Aleš - Frank, Luděk - Sluyterman, S.
Scanning Ultra-Low-Energy Electron Microscopy of 2D Crystals.
BIT's 5th Annual Conference of AnalytiX-2017. Conference Abstract Book. Dalian: BIT Goup Global, 2017. s. 224.
[BIT's Annual Conference of AnalytiX-2017 /5./. 22.03.2017-24.03.2017, Fukuoka]
Institutional support: RVO:68081731
Keywords : ultra-Low-Energy Electron Microscopy * scanning * 2D Crystals
OECD category: Coating and films
Permanent Link: http://hdl.handle.net/11104/0276916 - 4.0450825 - ÚPT 2016 RIV HU eng C - Conference Paper (international conference)
Frank, Luděk - Mikmeková, Eliška
Graphene examined with very slow electrons.
12th Multinational Congress on Microscopy. Budapest: Akadémiai Kiadó, 2015, s. 182-183. ISBN 978-963-05-9653-4.
[MCM 2015. Multinational Congress on Microscopy /12./. Eger (HU), 23.08.2015-28.08.2015]
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731
Keywords : graphene * 2D crystals * ultra-low-energy STEM * ultra-low-energy SEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0252038 - 5.0443322 - ÚPT 2016 RIV US eng J - Journal Article
Frank, Luděk - Mikmeková, Eliška - Müllerová, Ilona - Lejeune, M.
Counting graphene layers with very slow electrons.
Applied Physics Letters. Roč. 106, 09 JAN (2015), 013117:1-5. ISSN 0003-6951. E-ISSN 1077-3118
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212
Institutional support: RVO:68081731
Keywords : graphene * ultralow energy STEM * counting graphene layers * cleaning of graphene * 2D crystals
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 3.142, year: 2015
Permanent Link: http://hdl.handle.net/11104/0246044