Search results
- 1.0554502 - ÚPT 2022 RIV US eng C - Conference Paper (international conference)
Allaham, Mohammad M. - Mousa, M. S. - Burda, Daniel - AlSa'eed, M. - AlJrawen, S. - Knápek, Alexandr … Total 8 authors
Analyses of field electron emission Molybdenum current-voltage data using Fowler-Nordheim and Murphy-Good plots.
International Vacuum Nanoelectronics Conference. In: 2021 34th International Vacuum Nanoelectronics Conference (IVNC). New York: IEEE, 2021 - (Purcell, S.; Mazellier, J.), (2021), s. 151-152. ISBN 978-1-6654-2589-6. ISSN 2380-6311.
[International Vacuum Nanoelectronics Conference (IVNC) /34./. online (FR), 05.07.2021-09.07.2021]
R&D Projects: GA MV(CZ) VI20192022147
Institutional support: RVO:68081731
Keywords : Field electron emission * Murphy-Good plots * Molybdenum Single tip field emitter * Orthodoxy test limits * kinked field emission characteristics
OECD category: Condensed matter physics (including formerly solid state physics, supercond.)
https://ieeexplore.ieee.org/document/9600771
Permanent Link: http://hdl.handle.net/11104/0329217 - 2.0554500 - ÚPT 2022 RIV US eng C - Conference Paper (international conference)
Burda, Daniel - Allaham, Mohammad M. - Knápek, Alexandr - Sobola, Dinara - Mousa, M. S. … Total 7 authors
Field emission properties of sharp tungsten cathodes coated with a thin resilient oxide barrier.
International Vacuum Nanoelectronics Conference. In: 2021 34th International Vacuum Nanoelectronics Conference (IVNC). New York: IEEE, 2021 - (Purcell, S.; Mazellier, J.), (2021), s. 178-179. ISBN 978-1-6654-2589-6. ISSN 2380-6311.
[International Vacuum Nanoelectronics Conference (IVNC) /34./. online (FR), 05.07.2021-09.07.2021]
R&D Projects: GA MV(CZ) VI20192022147
Research Infrastructure: CzechNanoLab - 90110
Institutional support: RVO:68081731
Keywords : field electron microscopy * electrochemical etching * tungsten single tip field emitter * atomic layer deposition * Al2O3 nanolayer * Murphy-Good plot
OECD category: Condensed matter physics (including formerly solid state physics, supercond.)
https://ieeexplore.ieee.org/document/9600704
Permanent Link: http://hdl.handle.net/11104/0329215 - 3.0553018 - ÚPT 2022 RIV US eng C - Conference Paper (international conference)
Allaham, Mohammad M. - Knápek, Alexandr - Mousa, M. S. - Forbes, R. G.
User-friendly method for testing field electron emission data: Technical report.
International Vacuum Nanoelectronics Conference. In: 2021 34th International Vacuum Nanoelectronics Conference (IVNC). New York: IEEE, 2021 - (Purcell, S.; Mazellier, J.), (2021), s. 138-139. ISBN 978-1-6654-2589-6. ISSN 2380-6311.
[International Vacuum Nanoelectronics Conference (IVNC) /34./. online (FR), 05.07.2021-09.07.2021]
R&D Projects: GA MV(CZ) VI20192022147
Institutional support: RVO:68081731
Keywords : field emission analysis tool * Murphy-Good plot * voltage conversion length * field enhancement factor * formal emission area * formal area efficiency
OECD category: Condensed matter physics (including formerly solid state physics, supercond.)
https://ieeexplore.ieee.org/document/9600769
Permanent Link: http://hdl.handle.net/11104/0328068