Search results
- 1.0554683 - ÚFM 2023 RIV CH eng J - Journal Article
Pechoušek, J. - Kuzmann, E. - Vondrášek, R. - Olina, A. - Vrba, V. - Kouřil, L. - Ingr, T. - Král, Petr - Mashlan, M.
Successive Grinding and Polishing Effect on the Retained Austenite in the Surface of 42CrMo4 Steel.
Metals. Roč. 12, č. 1 (2022), č. článku 119. E-ISSN 2075-4701
Institutional support: RVO:68081723
Keywords : kinetic-behavior * mossbauer * alloys * steel microstructure * grinding * polishing * austenite * Mossbauer spectroscopy * 42CrMo4
OECD category: Materials engineering
Impact factor: 2.9, year: 2022
Method of publishing: Open access
https://www.mdpi.com/2075-4701/12/1/119
Permanent Link: http://hdl.handle.net/11104/0331037 - 2.0538151 - ÚFP 2021 RIV GB eng J - Journal Article
Novotný, L. - Čeřovský, Jaroslav - Dhyani, P. - Ficker, O. - Havránek, M. - Hejtmánek, M. - Janoška, Z. - Kafka, V. - Kulkov, S. - Marčišovská, M. - Marcisovský, M. - Neue, G. - Svihra, P. - Svoboda, V. - Tomášek, L. - Tunkl, M. - Vrba, V.
Runaway electron diagnostics using silicon strip detector.
Journal of Instrumentation. Roč. 15, č. 7 (2020), č. článku C07015. ISSN 1748-0221. E-ISSN 1748-0221
R&D Projects: GA ČR(CZ) GA18-02482S
Institutional support: RVO:61389021
Keywords : Runaway electrons * silicon strip detector
OECD category: Fluids and plasma physics (including surface physics)
Impact factor: 1.415, year: 2020
Method of publishing: Limited access
https://iopscience.iop.org/article/10.1088/1748-0221/15/07/C07015/pdf
Permanent Link: http://hdl.handle.net/11104/0315973 - 3.0538009 - FZÚ 2021 RIV GB eng J - Journal Article
Marčišovská, M. - Dudas, D. - Havránek, M. - Kabátová, A. - Kafka, V. - Kostina, A. - Macková, A. - Marcisovský, M. - Mitrofanov, S. V. - Popule, Jiří - Romanenko, Oleksandr V. - Tomášek, L. - Vrba, V.
TID and SEU testing of the novel X-CHIP-03 monolithic pixel detector.
Journal of Instrumentation. Roč. 15, č. 1 (2020), s. 1-11, č. článku C01043. ISSN 1748-0221. E-ISSN 1748-0221
R&D Projects: GA MŠMT EF16_013/0001812
Institutional support: RVO:68378271 ; RVO:61389005
Keywords : radiation damage to detector materials (solid state) * radiation damage to electronic components * radiation-hard detectors * radiation-hard electronics
OECD category: Particles and field physics; Nuclear physics (UJF-V)
Impact factor: 1.415, year: 2020
Method of publishing: Limited access
https://doi.org/10.1088/1748-0221/15/01/C01043
Permanent Link: http://hdl.handle.net/11104/0315849 - 4.0519329 - FZÚ 2020 RIV GB eng J - Journal Article
Marčišovská, Mária - Benka, T. - Havránek, Miroslav - Hejtmánek, M. - Janoška, Z. - Kafka, V. - Marcisovský, M. - Neue, G. - Popule, Jiří - Svihra, P. - Tomášek, L. - Vančura, P. - Vrba, V.
A comparative study of the TID radiation effects on ASICs manufactured in 180 nm commercial technologies.
Journal of Instrumentation. Roč. 13, č. 12 (2018), s. 1-10, č. článku C12003. ISSN 1748-0221. E-ISSN 1748-0221
Institutional support: RVO:68378271
Keywords : radiation damage to electronic components * radiation-hard detectors * radiation-hard electronics * solid state detectors
OECD category: Particles and field physics
Impact factor: 1.366, year: 2018
Method of publishing: Limited access
https://doi.org/10.1088/1748-0221/13/12/c12003
Permanent Link: http://hdl.handle.net/11104/0304325 - 5.0509572 - ÚFP 2020 RIV AT eng J - Journal Article
Ficker, Ondřej - Tomešová, Eva - Mlynář, Jan - Břeň, D. - Casolari, Andrea - Čeřovský, Jaroslav - Farník, Michal - Grover, Ondřej - Havlíček, Josef - Havránek, Aleš - Hron, Martin - Imríšek, Martin - Jeřáb, Martin - Krbec, Jaroslav - Kulhánek, Petr - Linhart, V. - Marcisovský, M. - Markovič, Tomáš - Naydenkova, Diana - Pánek, Radomír - Šos, Miroslav - Svihra, P. - Svoboda, Vojtěch - Tomeš, Matěj - Urban, Jakub - Varju, Jozef - Vlainic, Milos - Vondráček, Petr - Vrba, V. - Weinzettl, Vladimír - Carnevale, D. - Decker, J. - Gobbin, M. - Gospodarczyk, M. - Papp, G. - Peysson, Y. - Plyusnin, V.V. - Rabinski, M. - Reux, C.
Runaway electron beam stability and decay in COMPASS.
Nuclear Fusion. Roč. 59, č. 9 (2019), č. článku 096036. ISSN 0029-5515. E-ISSN 1741-4326
R&D Projects: GA ČR(CZ) GA18-02482S; GA MŠMT(CZ) LM2015045; GA MŠMT(CZ) 8D15001
EU Projects: European Commission(XE) 633053 - EUROfusion
Institutional support: RVO:61389021
Keywords : disruptions * runaway electrons * Tokamaks * tomography
OECD category: Fluids and plasma physics (including surface physics)
Impact factor: 3.706, year: 2019
Method of publishing: Limited access
https://iopscience.iop.org/article/10.1088/1741-4326/ab210f
Permanent Link: http://hdl.handle.net/11104/0300282File Download Size Commentary Version Access Runaway electron beam stability and decay in COMPASS.pdf 6 2.3 MB Publisher’s postprint require - 6.0509566 - ÚFP 2020 RIV NL eng J - Journal Article
Svihra, P. - Břeň, D. - Casolari, Andrea - Čeřovský, Jaroslav - Dhyani, P. - Farník, Michal - Ficker, Ondřej - Havránek, M. - Hejtmanek, M. - Janoška, Z. - Kafka, V. - Kulhánek, Petr - Linhart, V. - Tomešová, Eva - Marčišovská, M. - Marcisovský, M. - Mlynář, Jan - Neue, G. - Novotný, L. - Svoboda, V. - Tomášek, L. - Urban, Jakub - Vančura, P. - Varju, Jozef - Vrba, V. - Weinzettl, Vladimír
Runaway electrons diagnostics using segmented semiconductor detectors.
Fusion Engineering and Design. Roč. 146, September (2019), s. 316-319. ISSN 0920-3796. E-ISSN 1873-7196
R&D Projects: GA ČR(CZ) GA18-02482S; GA MŠMT(CZ) LM2015045
Institutional support: RVO:61389021
Keywords : Runaway electrons * Semiconductor detectors * Tokamaks
OECD category: Fluids and plasma physics (including surface physics)
Impact factor: 1.692, year: 2019
Method of publishing: Limited access
https://www.sciencedirect.com/science/article/abs/pii/S0920379618308196?via%3Dihub
Permanent Link: http://hdl.handle.net/11104/0300275 - 7.0501816 - FZÚ 2019 RIV GB eng J - Journal Article
Havránek, M. - Benka, T. - Hejtmanek, M. - Janoška, Z. - Kafka, Z. - Kopeček, Jaromír - Kuklová, M. - Marčišovská, M. - Marcisovský, M. - Neue, G. - Svihra, P. - Tomášek, L. - Vančura, P. - Vrba, V.
MAPS sensor for radiation imaging designed in 180 nm SOI CMOS technology.
Journal of Instrumentation. Roč. 13, č. 6 (2018), s. 1-10, č. článku C06004. ISSN 1748-0221. E-ISSN 1748-0221
R&D Projects: GA MŠMT LM2015058
Institutional support: RVO:68378271
Keywords : active pixel sensor * X-ray detectors
OECD category: Nuclear physics
Impact factor: 1.366, year: 2018
Permanent Link: http://hdl.handle.net/11104/0293800