Search results
- 1.0574279 - ÚPT 2024 RIV NL eng J - Journal Article
Průcha, Lukáš - Lejeune, M. - Kizovský, Martin - Materna-Mikmeková, Eliška
In-situ thermal Raman spectroscopy of single-layer graphene on different substrates.
Materials Today Communications. Roč. 35, June (2023), č. článku 105921. ISSN 2352-4928. E-ISSN 2352-4928
R&D Projects: GA ČR(CZ) GA22-34286S
Institutional support: RVO:68081731
Keywords : Graphene * Raman spectroscopy * Thermal measurements * Graphene decomposition * Thermal decomposition
OECD category: Atomic, molecular and chemical physics (physics of atoms and molecules including collision, interaction with radiation, magnetic resonances, Mössbauer effect)
Impact factor: 3.800, year: 2022
Method of publishing: Limited access
https://www.sciencedirect.com/science/article/pii/S2352492823006128
Permanent Link: https://hdl.handle.net/11104/0344614
- 2.0558867 - ÚPT 2023 RIV US eng J - Journal Article
Tang, C. - Thomas, B. - Ramirez-Hernandez, M. - Materna-Mikmeková, Eliška - Asefa, T.
Metal-Functionalized Hydrogels as Efficient Oxygen Evolution Electrocatalysts.
ACS Applied Materials and Interfaces. Roč. 14, č. 18 (2022), s. 20919-20929. ISSN 1944-8244. E-ISSN 1944-8252
Institutional support: RVO:68081731
Keywords : hydrogel * conducting polymer * oxygen evolution reaction * phytic acid * polyaniline
OECD category: Electrical and electronic engineering
Impact factor: 9.500, year: 2022
Method of publishing: Limited access
https://pubs.acs.org/doi/10.1021/acsami.2c01667
Permanent Link: https://hdl.handle.net/11104/0333399
- 3.0551125 - ÚPT 2023 RIV CH eng J - Journal Article
Konvalina, Ivo - Paták, Aleš - Zouhar, Martin - Müllerová, Ilona - Fořt, Tomáš - Unčovský, M. - Materna-Mikmeková, Eliška
Quantification of stem images in high resolution sem for segmented and pixelated detectors.
Nanomaterials. Roč. 12, č. 1 (2022), č. článku 71. E-ISSN 2079-4991
R&D Projects: GA TA ČR(CZ) TN01000008
Grant - others:AV ČR(CZ) StrategieAV21/6
Program: StrategieAV
Institutional support: RVO:68081731
Keywords : STEM segmented detector * pixelated detector * scanning electron microscopy * Monte Carlo simulations * ray tracing * quantitative imaging
OECD category: Electrical and electronic engineering
Impact factor: 5.300, year: 2022
Method of publishing: Open access
https://www.mdpi.com/2079-4991/12/1/71
Permanent Link: http://hdl.handle.net/11104/0326569
- 4.0536755 - ÚPT 2021 RIV US eng J - Journal Article
Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Piňos, Jakub - Radlička, Tomáš - Frank, Luděk - Müllerová, Ilona - Materna-Mikmeková, Eliška
Very Low Energy Electron Transmission Spectroscopy of 2D Materials.
Microscopy and Microanalysis. Roč. 26, S2 (2020), s. 2636-2638. ISSN 1431-9276. E-ISSN 1435-8115
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : spectroscopy * very low energy electron transmission * 2D materials
OECD category: Electrical and electronic engineering
Impact factor: 4.127, year: 2020
Method of publishing: Open access
https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/very-low-energy-electron-transmission-spectroscopy-of-2d-materials/2F6DF5F745E2CCA1AFA45F451D68BD41
Permanent Link: http://hdl.handle.net/11104/0314644
- 5.0525529 - ÚPT 2021 RIV NL eng J - Journal Article
Materna-Mikmeková, Eliška - Müllerová, Ilona - Frank, Luděk - Paták, Aleš - Polčák, J. - Sluyterman, S. - Lejeune, M. - Konvalina, Ivo
Low-energy electron microscopy of graphene outside UHV: electron-induced removal of PMMA residues used for graphene transfer.
Journal of Electron Spectroscopy and Related Phenomena. Roč. 241, MAY (2020), č. článku 146873. ISSN 0368-2048. E-ISSN 1873-2526
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠk(CZ) LO1212; GA MŠk ED0017/01/01
EU Projects: European Commission(XE) 606988 - SIMDALEE2
Institutional support: RVO:68081731
Keywords : graphene * PMMA * slow electron treatment * XPS * Raman spectroscopy
OECD category: Electrical and electronic engineering
Impact factor: 1.957, year: 2020
Method of publishing: Open access
https://www.sciencedirect.com/science/article/pii/S0368204818302068
Permanent Link: http://hdl.handle.net/11104/0309642
- 6.0508751 - ÚPT 2020 RIV CH eng J - Journal Article
Konvalina, Ivo - Mika, Filip - Krátký, Stanislav - Materna-Mikmeková, Eliška - Müllerová, Ilona
In-Lens Band-Pass Filter for Secondary Electrons in Ultrahigh Resolution SEM.
Materials. Roč. 12, č. 14 (2019), č. článku 2307. E-ISSN 1996-1944
R&D Projects: GA TA ČR(CZ) TE01020118; GA TA ČR TE01020233; GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : band-pass filter of signal electrons * SE detection * trajectory simulations
OECD category: Electrical and electronic engineering
Impact factor: 3.057, year: 2019
Method of publishing: Open access
https://www.mdpi.com/1996-1944/12/14/2307/htm
Permanent Link: http://hdl.handle.net/11104/0299576