Search results
- 1.0540306 - ÚPT 2021 CZ eng A - Abstract
Řiháček, Tomáš - Horák, M. - Schachinger, T. - Mika, Filip - Matějka, Milan - Fořt, Tomáš - Radlička, Tomáš - Novák, L. - Seďa, B. - McMorran, B.J. - Béché, A. - Verbeeck, J. - Müllerová, Ilona
Electron vortex beams in the scanning electron microscope.
Microscopy 2020. Praha: Československá mikroskopická společnost, 2020. s. 42.
[Microscopy 2020. 06.10.2020-07.10.2020, Lednice]
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : electron vortex beams * SEM
OECD category: Electrical and electronic engineering
Permanent Link: http://hdl.handle.net/11104/0317957 - 2.0510323 - ÚPT 2020 DE eng A - Abstract
Řiháček, Tomáš - Mika, Filip - Horák, M. - Schachinger, T. - Matějka, Milan - Krátký, Stanislav - Müllerová, Ilona
Creation and detection of electron vortex beams in a scanning electron microscope.
Microscopy Conference: MC 2019. Abstracts. Berlin: DSE, 2019. s. 409-410.
[Microscopy Conference : MC 2019. 01.09.2019-05.09.2019, Berlin]
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : detection of electron vortex beams * SEM
OECD category: Nano-materials (production and properties)
https://www.microscopy-conference.de
Permanent Link: http://hdl.handle.net/11104/0300832