Search results
- 1.0525529 - ÚPT 2021 RIV NL eng J - Journal Article
Materna Mikmeková, Eliška - Müllerová, Ilona - Frank, Luděk - Paták, Aleš - Polčák, J. - Sluyterman, S. - Lejeune, M. - Konvalina, Ivo
Low-energy electron microscopy of graphene outside UHV: electron-induced removal of PMMA residues used for graphene transfer.
Journal of Electron Spectroscopy and Related Phenomena. Roč. 241, MAY (2020), č. článku 146873. ISSN 0368-2048. E-ISSN 1873-2526
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
EU Projects: European Commission(XE) 606988 - SIMDALEE2
Institutional support: RVO:68081731
Keywords : graphene * PMMA * slow electron treatment * XPS * Raman spectroscopy
OECD category: Electrical and electronic engineering
Impact factor: 1.957, year: 2020 ; AIS: 0.507, rok: 2020
Method of publishing: Open access
Result website:
https://www.sciencedirect.com/science/article/pii/S0368204818302068DOI: https://doi.org/10.1016/j.elspec.2019.06.005
Permanent Link: http://hdl.handle.net/11104/0309642 - 2.0525062 - ÚPT 2021 RIV NL eng J - Journal Article
Frank, Luděk - Hovorka, Miloš - El Gomati, M. M. - Müllerová, Ilona - Mika, Filip - Mikmeková, Eliška
Acquisition of the dopant contrast in semiconductors with slow electrons.
Journal of Electron Spectroscopy and Related Phenomena. Roč. 241, MAY (2020), č. článku 146836. ISSN 0368-2048. E-ISSN 1873-2526
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
EU Projects: European Commission(XE) 606988 - SIMDALEE2
Institutional support: RVO:68081731
Keywords : semiconductors * dopant contrast * low energy SEM * PEEM * mirror electron microscopy * surface treatments
OECD category: Electrical and electronic engineering
Impact factor: 1.957, year: 2020 ; AIS: 0.507, rok: 2020
Method of publishing: Open access
Result website:
https://www.sciencedirect.com/science/article/pii/S036820481830135XDOI: https://doi.org/10.1016/j.elspec.2019.03.004
Permanent Link: http://hdl.handle.net/11104/0309284 - 3.0524948 - ÚPT 2021 RIV NL eng J - Journal Article
Saqib, M. - Jelenc, J. - Pirker, L. - Škapin, S.D. - De Pietro, L. - Ramsperger, U. - Knápek, Alexandr - Müllerová, Ilona - Remškar, M.
Field emission properties of single crystalline W5O14 and W18O49 nanowires.
Journal of Electron Spectroscopy and Related Phenomena. Roč. 241, MAY (2020), č. článku 146837. ISSN 0368-2048. E-ISSN 1873-2526
R&D Projects: GA TA ČR(CZ) TE01020118
EU Projects: European Commission(XE) 606988 - SIMDALEE2
Institutional support: RVO:68081731
Keywords : nanowires * tungsten oxides * electron emitter * field enhancement factor * work function
OECD category: Condensed matter physics (including formerly solid state physics, supercond.)
Impact factor: 1.957, year: 2020 ; AIS: 0.507, rok: 2020
Method of publishing: Open access
Result website:
https://www.sciencedirect.com/science/article/pii/S0368204818301567DOI: https://doi.org/10.1016/j.elspec.2019.03.005
Permanent Link: http://hdl.handle.net/11104/0309164 - 4.0522074 - ÚPT 2020 RIV US eng J - Journal Article
Werner, W. S. M. - Oral, Martin - Radlička, Tomáš - Zelinka, Jiří - Müllerová, Ilona - Bellissimo, A. - Bertolini, G. - Cabrera, H. - Gurlu, O.
Scanning tunneling microscopy in the field-emission regime: Formation of a two-dimensional electron cascade.
Applied Physics Letters. Roč. 115, č. 25 (2019), č. článku 251604. ISSN 0003-6951. E-ISSN 1077-3118
EU Projects: European Commission(XE) 606988 - SIMDALEE2
Institutional support: RVO:68081731
Keywords : spin polarization * diffraction
OECD category: Atomic, molecular and chemical physics (physics of atoms and molecules including collision, interaction with radiation, magnetic resonances, Mössbauer effect)
Impact factor: 3.597, year: 2019 ; AIS: 0.876, rok: 2019
Method of publishing: Limited access
Result website:
https://aip.scitation.org/doi/10.1063/1.5128300DOI: https://doi.org/10.1063/1.5128300
Permanent Link: http://hdl.handle.net/11104/0306577 - 5.0489596 - ÚPT 2019 RIV NL eng J - Journal Article
Walker, Christopher - Konvalina, Ivo - Mika, Filip - Frank, Luděk - Müllerová, Ilona
Quantitative comparison of simulated and measured signals in the STEM mode of a SEM.
Nuclear Instruments & Methods in Physics Research Section B. Roč. 415, JAN (2018), s. 17-24. ISSN 0168-583X. E-ISSN 1872-9584
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
EU Projects: European Commission(XE) 606988 - SIMDALEE2
Institutional support: RVO:68081731
Keywords : low-energy electrons * multiple scattering * elastic-scattering * transmission
OECD category: Coating and films
Impact factor: 1.210, year: 2018 ; AIS: 0.362, rok: 2018
DOI: https://doi.org/10.1016/j.nimb.2017.10.034
Permanent Link: http://hdl.handle.net/11104/0283980 - 6.0467245 - ÚPT 2017 RIV US eng J - Journal Article
Walker, C. - Frank, Luděk - Müllerová, Ilona
Simulations and measurements in scanning electron microscopes at low electron energy.
Scanning. Roč. 38, č. 6 (2016), s. 802-818. ISSN 0161-0457. E-ISSN 1932-8745
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
EU Projects: European Commission(XE) 606988 - SIMDALEE2
Institutional support: RVO:68081731
Keywords : Monte Carlo modeling * scanned probe * computer simulation * electron-solid interactions * surface analysis
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.345, year: 2016 ; AIS: 0.399, rok: 2016
DOI: https://doi.org/10.1002/sca.21330
Permanent Link: http://hdl.handle.net/11104/0265392 - 7.0459573 - ÚPT 2017 RIV CH eng J - Journal Article
Mikmeková, Eliška - Frank, Luděk - Müllerová, Ilona - Li, B. W. - Ruoff, R. S. - Lejeune, M.
Study of multi-layered graphene by ultra-low energy SEM/STEM.
Diamond and Related Materials. Roč. 63, March 2016 (2016), s. 136-142. ISSN 0925-9635. E-ISSN 1879-0062
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212
EU Projects: European Commission(XE) 606988 - SIMDALEE2
Institutional support: RVO:68081731
Keywords : scanning ultra low energy electron microscopy * graphene * contamination * CVD
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 2.561, year: 2016 ; AIS: 0.484, rok: 2016
DOI: https://doi.org/10.1016/j.diamond.2015.12.012
Permanent Link: http://hdl.handle.net/11104/0259759