Search results

  1. 1.
    0494363 - ÚPT 2019 RIV CZ eng C - Conference Paper (international conference)
    Saqib, M. - Knápek, Alexandr - Jelenc, J. - Pirker, L.
    Field emission from W5O14 nanowires.
    Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 34-35. ISBN 978-80-87441-23-7.
    [Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
    R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠk(CZ) LO1212; GA MŠk ED0017/01/01
    EU Projects: European Commission(XE) 606988 - SIMDALEE2
    Institutional support: RVO:68081731
    Keywords : field emission * W5O14 nanowires
    OECD category: Nano-materials (production and properties)
    Permanent Link: http://hdl.handle.net/11104/0287594

               
     
     
  2. 2.
    0494360 - ÚPT 2019 RIV CZ eng C - Conference Paper (international conference)
    Daniel, Benjamin - Radlička, Tomáš - Piňos, Jakub - Mikmeková, Šárka - Konvalina, Ivo - Frank, Luděk - Müllerová, Ilona
    Very low energy electron transmission spectromicroscopy.
    Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 14-15. ISBN 978-80-87441-23-7.
    [Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
    EU Projects: European Commission(XE) 606988 - SIMDALEE2
    Institutional support: RVO:68081731
    Keywords : low energy scanning electron microscopy * electron microscopy * time of flight * electron energy lost spectroscopy
    OECD category: Electrical and electronic engineering
    Permanent Link: http://hdl.handle.net/11104/0287590

               
     
     
  3. 3.
    0460199 - ÚPT 2017 RIV CZ eng C - Conference Paper (international conference)
    Daniel, Benjamin - Radlička, Tomáš - Piňos, Jakub - Frank, Luděk - Müllerová, Ilona
    Very low energy STEM/TOF system.
    Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016 - (Mika, F.), s. 6-7. ISBN 978-80-87441-17-6.
    [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./. Skalský dvůr (CZ), 29.05.2016-03.06.2016]
    EU Projects: European Commission(XE) 606988 - SIMDALEE2
    Institutional support: RVO:68081731
    Keywords : elecvtron microscopy * SLEEM * UHV SLEEM
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    http://www.trends.isibrno.cz/
    Permanent Link: http://hdl.handle.net/11104/0260331