Search results

  1. 1.
    0493332 - ÚPT 2019 US eng A - Abstract
    Müllerová, Ilona - Frank, Luděk - Konvalina, Ivo - Mikmeková, Eliška
    Role of the Angular Distribution of Backscattered Electrons in Low Energy Scanning Electron Microscope.
    Microscopy and Microanalysis. Roč. 24, S1 (2018), s. 638-639. ISSN 1431-9276. E-ISSN 1435-8115.
    [Microscopy & Microanalysis 2018 Meeting. 05.08.2018-09.08.2018, Baltimore]
    R&D Projects: GA TA ČR(CZ) TE01020118
    EU Projects: European Commission(XE) 606988 - SIMDALEE2
    Institutional support: RVO:68081731
    Keywords : angular distribution * backscattered electrons * low energy * SEM
    OECD category: Nano-materials (production and properties)
    Permanent Link: http://hdl.handle.net/11104/0286715

               
     
     
  2. 2.
    0481331 - ÚPT 2018 CZ eng A - Abstract
    Frank, Luděk - Mikmeková, Eliška
    SEM without black rectangles?
    Mikroskopie 2017. Praha: Československá mikroskopická společnost, 2017. s. 20-21.
    [Mikroskopie 2017. 09.05.2017-10.05.2017, Bratislava]
    R&D Projects: GA TA ČR(CZ) TE01020118
    EU Projects: European Commission(XE) 606988 - SIMDALEE2
    Institutional support: RVO:68081731
    Keywords : SEM * EBID of carbon * graphene
    OECD category: Coating and films
    Permanent Link: http://hdl.handle.net/11104/0276909

               
     
     
  3. 3.
    0481149 - ÚPT 2018 AT eng A - Abstract
    Daniel, Benjamin - Radlička, Tomáš - Piňos, Jakub - Frank, Luděk - Müllerová, Ilona
    Very low energy STEM / TOF system.
    Sources, Interaction with Matter, Detection and Analysis of Low Energy Electrons (SIMDALEE2017). Book of Abstracts. Wien: Technische Universitaet Wien, 2017. s. 70.
    [SIMDALEE2017. Sources, Interaction with Matter, Detection and Analysis of Low Energy Electrons. 18.09.2017-22.09.2017, Pula]
    EU Projects: European Commission(XE) 606988 - SIMDALEE2
    Institutional support: RVO:68081731
    Keywords : STEM/TOF system * ultrathin films * UHV SLEEM
    OECD category: Electrical and electronic engineering
    Permanent Link: http://hdl.handle.net/11104/0276755

               
     
     
  4. 4.
    0481148 - ÚPT 2018 AT eng A - Abstract
    Müllerová, Ilona - Mikmeková, Šárka - Mikmeková, Eliška - Frank, Luděk
    What’s next in Scanning Low Energy Electron Microscopy?
    Sources, Interaction with Matter, Detection and Analysis of Low Energy Electrons (SIMDALEE2017). Book of Abstracts. Wien: Technische Universitaet Wien, 2017. s. 22.
    [SIMDALEE2017. Sources, Interaction with Matter, Detection and Analysis of Low Energy Electrons. 18.09.2017-22.09.2017, Pula]
    R&D Projects: GA TA ČR(CZ) TE01020118
    EU Projects: European Commission(XE) 606988 - SIMDALEE2
    Institutional support: RVO:68081731
    Keywords : SLEEM * primary beam energy * signal electrons
    OECD category: Nano-materials (production and properties)
    Permanent Link: http://hdl.handle.net/11104/0276751

               
     
     
  5. 5.
    0480603 - ÚPT 2018 AT eng A - Abstract
    Řiháček, Tomáš - Müllerová, Ilona
    Effect of axial aberrations on the degree of coherence in SEM.
    Sources, Interaction with Matter, Detection and Analysis of Low Energy Electrons 2017 (SIMDALEE2017). Book of Abstracts.. Wien: Institut für Angewandte Physik, 2017. s. 50.
    [SIMDALEE2017. Sources, Interaction with Matter, Detection and Analysis of Low Energy Electrons. 18.09.2017-22.09.2017, Pula]
    R&D Projects: GA TA ČR(CZ) TE01020118
    EU Projects: European Commission(XE) 606988 - SIMDALEE2
    Institutional support: RVO:68081731
    Keywords : axial aberrations * SEM
    OECD category: Electrical and electronic engineering
    Permanent Link: http://hdl.handle.net/11104/0276339