Search results
- 1.0546409 - ÚPT 2022 RIV CH eng J - Journal Article
Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Müllerová, Ilona - Frank, Luděk - Piňos, Jakub - Průcha, Lukáš - Radlička, Tomáš - Werner, W. S. M. - Mikmeková, Eliška
Low-energy electron inelastic mean free path of graphene measured by a time-of-flight spectrometer.
Nanomaterials. Roč. 11, č. 9 (2021), č. článku 2435. E-ISSN 2079-4991
R&D Projects: GA TA ČR(CZ) TN01000008
Grant - others:AV ČR(CZ) StrategieAV21/6
Program: StrategieAV
Institutional support: RVO:68081731
Keywords : time-of-flight spectrometer * inelastic mean free path * density-functional theory * many-body perturbation theory * energy-loss spectrum * density of states * band structure * graphene
OECD category: Electrical and electronic engineering
Impact factor: 5.719, year: 2021
Method of publishing: Open access
https://www.mdpi.com/2079-4991/11/9/2435
Permanent Link: http://hdl.handle.net/11104/0322930
Research data: Zenodo - 2.0544223 - ÚPT 2022 RIV US eng J - Journal Article
Ma, Haili - Mikmeková, Šárka - Konvalina, Ivo - Yin, X. - Sun, F. - Piňos, Jakub - Vaškovicová, Naděžda - Průcha, Lukáš - Müllerová, Ilona - Mikmeková, Eliška - Chen, D.
Imaging ferroelectric nanodomains in strained BiFeO3 nanoscale films using scanning low-energy electron microscopy: Implications for low-power devices.
ACS Applied Nano Materials. Roč. 4, č. 4 (2021), s. 3725-3733. ISSN 2574-0970
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : scanning low-energy electron microscopy (SLEEM) * BiFeO3 nanoscale films * ferroelectric nanodomains * low-loss backscattered electrons * multiferroic
OECD category: Electrical and electronic engineering
Impact factor: 6.140, year: 2021
Method of publishing: Limited access
https://pubs.acs.org/doi/10.1021/acsanm.1c00204
Permanent Link: http://hdl.handle.net/11104/0321265 - 3.0536755 - ÚPT 2021 RIV US eng J - Journal Article
Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Piňos, Jakub - Radlička, Tomáš - Frank, Luděk - Müllerová, Ilona - Materna Mikmeková, Eliška
Very Low Energy Electron Transmission Spectroscopy of 2D Materials.
Microscopy and Microanalysis. Roč. 26, S2 (2020), s. 2636-2638. ISSN 1431-9276. E-ISSN 1435-8115
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : spectroscopy * very low energy electron transmission * 2D materials
OECD category: Electrical and electronic engineering
Impact factor: 4.127, year: 2020
Method of publishing: Open access
https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/very-low-energy-electron-transmission-spectroscopy-of-2d-materials/2F6DF5F745E2CCA1AFA45F451D68BD41
Permanent Link: http://hdl.handle.net/11104/0314644 - 4.0535190 - ÚPT 2021 RIV CZ cze J - Journal Article
Mikmeková, Šárka - Ambrož, Ondřej - Piňos, Jakub
Přínos moderní rastrovací elektronové mikroskopie pro studium ocelí.
[Contribution of modern scanning electron microscopy for the study of steels.]
Jemná mechanika a optika. Roč. 65, č. 6 (2020), s. 171-174. ISSN 0447-6441
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : SEM * characterization of microstructure * TRIP steel * COST F * thin layers and coating
OECD category: Materials engineering
Method of publishing: Limited access
https://jmo.fzu.cz/sites/jmo.fzu.cz/files/oldweb/2020/2020-06/jmo_20_06_obsah.pdf
Permanent Link: http://hdl.handle.net/11104/0313276 - 5.0482374 - ÚPT 2018 RIV US eng J - Journal Article
Fialová, D. - Skoupý, Radim - Drozdová, E. - Paták, Aleš - Piňos, Jakub - Šín, L. - Beňuš, R. - Klíma, B.
The Application of Scanning Electron Microscopy with Energy-Dispersive X-Ray Spectroscopy (SEM-EDX) in Ancient Dental Calculus for the Reconstruction of Human Habits.
Microscopy and Microanalysis. Roč. 23, č. 6 (2017), s. 1207-1213. ISSN 1431-9276. E-ISSN 1435-8115
R&D Projects: GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : ancient dental calculus * SEM-EDX * human habits * the Great Moravian Empire * Napoleonic Wars
OECD category: Electrical and electronic engineering
Impact factor: 2.124, year: 2017
Permanent Link: http://hdl.handle.net/11104/0279713 - 6.0481766 - ÚPT 2018 RIV CZ cze J - Journal Article
Piňos, Jakub - Mikmeková, Eliška - Mikmeková, Šárka - Müllerová, Ilona - Frank, Luděk
Mikroskopie velmi pomalými elektrony v ultrazvukovém vakuu.
[Very slow electrons microscope in ultrahigh vacuum.]
Jemná mechanika a optika. Roč. 62, č. 10 (2017), s. 264-265. ISSN 0447-6441
R&D Projects: GA MŠMT(CZ) LO1212
Institutional support: RVO:68081731
Keywords : scanning microscopy * slow electrons * ultrahigh vacuum * graphene
OECD category: Materials engineering
Permanent Link: http://hdl.handle.net/11104/0277308 - 7.0477097 - ÚPT 2018 RIV GB eng J - Journal Article
Piňos, Jakub - Mikmeková, Šárka - Frank, Luděk
About the information depth of backscattered electron imaging.
Journal of Microscopy. Roč. 266, č. 3 (2017), s. 335-342. ISSN 0022-2720. E-ISSN 1365-2818
Institutional support: RVO:68081731
Keywords : backscattered electrons * information depth * penetration of electrons
OECD category: Materials engineering
Impact factor: 1.693, year: 2017
Permanent Link: http://hdl.handle.net/11104/0273494