Search results
- 1.0465246 - ÚPT 2017 RIV GB eng C - Conference Paper (international conference)
Neděla, Vilém - Bučko, M. - Tihlaříková, Eva - Krajčovič, T. - Gemeiner, P. - Navrátilová, Eva - Hudec, Jiří
In Situ Study of Internal Structure of Spherical Polyelectrolyte Complex Capsules Using ESEM.
EMC2016. The 16th European Microscopy Congress. Proceedings. Oxford: Wiley, 2016, s. 263-264. ISBN 9783527808465.
[EMC2016. European Microscopy Congress /16./. Lyon (FR), 28.08.2016-02.09.2016]
R&D Projects: GA TA ČR(CZ) TE01020118; GA ČR(CZ) GA14-22777S; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : ESEM * morphology * polyelectrolyte complex capsules
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://onlinelibrary.wiley.com/doi/10.1002/9783527808465.EMC2016.5932/pdf
Permanent Link: http://hdl.handle.net/11104/0263896 - 2.0434116 - ÚPT 2015 RIV CZ eng C - Conference Paper (international conference)
Hudec, Jiří - Neděla, Vilém - Polsterová, H.
The study of the different percentage performance of nanoparticles on the properties of epoxy resin.
18th International Microscopy Congres. Proceedings. Praha: Czechoslovak Microscopy Society, 2014. ISBN 978-80-260-6720-7.
[International Microscopy Congres /18./. Praha (CZ), 07.09.2014-12.09.2014]
R&D Projects: GA ČR(CZ) GA14-22777S
Institutional support: RVO:68081731
Keywords : exposy resin * nanoparticles * SEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0238253 - 3.0434114 - ÚPT 2015 RIV CZ eng C - Conference Paper (international conference)
Mašová, Šárka - Neděla, Vilém - Tihlaříková, Eva
Using environmental scanning electron microscopy (ESEM) as a non-invasive method to studying fixed parasites.
18th International Microscopy Congres. Proceedings. Praha: Czechoslovak Microscopy Society, 2014. ISBN 978-80-260-6720-7.
[International Microscopy Congres /18./. Praha (CZ), 07.09.2014-12.09.2014]
R&D Projects: GA ČR(CZ) GA14-22777S
Institutional support: RVO:68081731
Keywords : parasites * ESEM * taxonomy
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0238250 - 4.0434112 - ÚPT 2015 RIV CZ eng C - Conference Paper (international conference)
Neděla, Vilém - Runštuk, Jiří - Klán, P. - Heger, D.
The Study of Ice Impurities Using the Environmental Scanning Electron Microscopy at Higher Pressures and Temperatures.
18th International Microscopy Congres. Proceedings. Praha: Czechoslovak Microscopy Society, 2014. ISBN 978-80-260-6720-7.
[International Microscopy Congres /18./. Praha (CZ), 07.09.2014-12.09.2014]
R&D Projects: GA ČR(CZ) GA14-22777S
Institutional support: RVO:68081731
Keywords : uranyl-salt * BSE * ESEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0238248