Search results
- 1.0563135 - ÚTIA 2023 RIV US eng C - Conference Paper (international conference)
Picek, L. - Novozámský, Adam - Čapková Frydrychová, Radmila - Zitová, Barbara - Mach, P.
Monitoring of Varroa Infestation rate in Beehives: A Simple AI Approach.
IEEE International Conference on Image Processing 2022 : Proceedings. Piscataway: IEEE, 2022, s. 3341-3345. ISBN 978-1-6654-9620-9. ISSN 2381-8549.
[IEEE International Conference on Image Processing 2022 /29./. Bordeaux (FR), 16.10.2022-19.10.2022]
Grant - others:AV ČR(CZ) StrategieAV21/1
Program: StrategieAV
Institutional support: RVO:67985556 ; RVO:60077344
Keywords : Machine learning algorithms * Costs * Image processing * Machine learning * Frequency measurement * Complexity theory
OECD category: Computer hardware and architecture; Zoology (BC-A)
http://library.utia.cas.cz/separaty/2022/ZOI/novozamsky-0563135.pdf
Permanent Link: https://hdl.handle.net/11104/0336399 - 2.0507132 - ÚPT 2020 RIV CZ eng C - Conference Paper (international conference)
Frank, Luděk - Nebesářová, Jana - Vancová, Marie - Paták, Aleš - Mikmeková, Eliška - Müllerová, Ilona
Transmission of very slow electrons as a diagnostic tool.
NANOCON 2013 - 5th International Conference Proceedings. Ostrava: TANGER Ltd, 2014, s. 503-508. ISBN 978-80-87294-47-5.
[International Conference NANOCON 2013 /5./. Brno (CZ), 16.10.2013-18.10.2013]
R&D Projects: GA ČR GAP108/11/2270; GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731 ; RVO:60077344
Keywords : electron microscopy * slow electrons * STEM * graphene * ultrathin tissue sections
OECD category: Nano-materials (production and properties); Civil engineering (BC-A)
Permanent Link: http://hdl.handle.net/11104/0298349 - 3.0465339 - ÚPT 2017 RIV GB eng C - Conference Paper (international conference)
Hrubanová, Kamila - Skoupý, Radim - Nebesářová, Jana - Růžička, F. - Krzyžánek, Vladislav
The sample preparation for cryo-SEM: the real ultrastructure of microbial biofilm or just artifacts?
EMC2016. The 16th European Microscopy Congress. Proceedings. Oxford: Wiley, 2016, s. 203-204. ISBN 9783527808465.
[EMC2016. European Microscopy Congress /16./. Lyon (FR), 28.08.2016-02.09.2016]
R&D Projects: GA ČR(CZ) GA14-20012S; GA ČR(CZ) GA16-12477S
Institutional support: RVO:68081731 ; RVO:60077344
Keywords : biofilm * Cryo-SEM * HPF
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://onlinelibrary.wiley.com/doi/10.1002/9783527808465.EMC2016.6907/pdf
Permanent Link: http://hdl.handle.net/11104/0263955 - 4.0452286 - ÚPT 2016 DE eng C - Conference Paper (international conference)
Krzyžánek, Vladislav - Skoupý, Radim - Hrubanová, Kamila - Kočová, L. - Nebesářová, Jana
Influence of ultrathin resin section aging and its reduction for imaging in the low voltage STEM.
MC 2015. Microscopy Conference Proceedings. Göttingen: DGE, 2015, s. 817-818.
[Microscopy Conference 2015. Göttingen (DE), 06.09.2015-11.09.2015]
R&D Projects: GA ČR(CZ) GA14-20012S; GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731 ; RVO:60077344
Keywords : STEM * ultrathin resin
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0253311 - 5.0452276 - ÚPT 2016 RIV HU eng C - Conference Paper (international conference)
Skoupý, Radim - Krzyžánek, Vladislav - Kočová, L. - Nebesářová, Jana
Electron beam induced mass loss dependence on aging of Epon resin sections.
12th Multinational Congress on Microscopy. Budapest: Akadémiai Kiadó, 2015, s. 112-113. ISBN 978-963-05-9653-4.
[MCM 2015. Multinational Congress on Microscopy /12./. Eger (HU), 23.08.2015-28.08.2015]
R&D Projects: GA ČR(CZ) GA14-20012S; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731 ; RVO:60077344
Keywords : STEM * mass loss * resin * Epon
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0253305