Search results
- 1.0584784 - ÚPT 2024 SK eng A - Abstract
Košelová, Zuzana - Knápek, Alexandr - Fohlerová, Z.
Fabrication and Characterization of Thermally Oxidized Tungsten-Based Thin Films for Application in Cold Field Emission Sources.
SURFINT-SREN VIII. Extended Abstract Book. Bratislava: Comenius University, 2023 - (Brunner, R.). s. 20-21. ISBN 978-80-223-5713-5.
[SURFINT-SREN /8./ Progress in Applied Surface, Interface and Thin Film Science, Solar Renewable Energy News 2023. 20.11.2023-22.11.2023, Bratislava]
R&D Projects: GA TA ČR(CZ) FW03010504
Research Infrastructure: CzechNanoLab - 90110
Institutional support: RVO:68081731
Keywords : Thermal Oxidation * Tungsten Tips * XPS * AFM * Cold Field Emmision
OECD category: Coating and films
Permanent Link: https://hdl.handle.net/11104/0352629 - 2.0584778 - ÚPT 2024 CZ cze A - Abstract
Brunn, Ondřej - Knápek, Alexandr - Matějka, Milan - Krátký, Stanislav - Horáček, Miroslav - Meluzín, Petr - Chlumská, Jana - Sadílek, Jakub - Burda, Daniel - Král, Stanislav - Ondříšková, Martina - Podstránský, Jáchym - Košelová, Zuzana - Allaham, Mohammad M. - Kolařík, Vladimír
Elektronová litografie a funkční nanostruktury.
IMAPS Flash Conference. 9th International Microelectronics Assembly and Packaging Society Flash Conference. Extended abstracts. Brno: Brno University of Technology, FEEC, 2023 - (Otáhal, A.; Szendiuch, I.; Skácel, J.). s. 12-13. ISBN 978-80-214-6185-7.
[IMAPS Flash Conference 2023. International Microelectronics Assembly and Packaging Society Flash Conference /9./. 26.10.2023-27.10.2023, Brno]
Research Infrastructure: CzechNanoLab - 90110
Institutional support: RVO:68081731
OECD category: Electrical and electronic engineering
Permanent Link: https://hdl.handle.net/11104/0352625 - 3.0584774 - ÚPT 2024 CZ eng A - Abstract
Burda, Daniel - Allaham, Mohammad M. - Knápek, Alexandr
Fabrication and characterization of coated tungsten field emitters by atomic layer deposition method.
IMAPS Flash Conference. 9th International Microelectronics Assembly and Packaging Society Flash Conference. Extended abstracts. Brno: Brno University of Technology, FEEC, 2023 - (Otáhal, A.; Szendiuch, I.; Skácel, J.). s. 44-45. ISBN 978-80-214-6185-7.
[IMAPS Flash Conference 2023. International Microelectronics Assembly and Packaging Society Flash Conference /9./. 26.10.2023-27.10.2023, Brno]
Research Infrastructure: CzechNanoLab - 90110
Institutional support: RVO:68081731
Permanent Link: https://hdl.handle.net/11104/0352622 - 4.0584772 - ÚPT 2024 CZ eng A - Abstract
Košelová, Zuzana - Horáková, L. - Allaham, Mohammad M. - Burda, Daniel - Knápek, Alexandr - Fohlerová, Z.
Cleaning of tungsten tips for subsequent cold field emission application.
IMAPS Flash Conference. 9th International Microelectronics Assembly and Packaging Society Flash Conference. Extended abstracts. Brno: Brno University of Technology, FEEC, 2023 - (Otáhal, A.; Szendiuch, I.; Skácel, J.). s. 50-51. ISBN 978-80-214-6185-7.
[IMAPS Flash Conference 2023. International Microelectronics Assembly and Packaging Society Flash Conference /9./. 26.10.2023-27.10.2023, Brno]
Research Infrastructure: CzechNanoLab - 90110
Institutional support: RVO:68081731
Keywords : Cleaning * Cold field emission * Tungsten tips * Macroetching * Hydrofluoric acid
OECD category: Electrical and electronic engineering
Permanent Link: https://hdl.handle.net/11104/0352620 - 5.0567629 - ÚPT 2023 CZ eng A - Abstract
Podstránský, Jáchym - Drozd, Michal - Knápek, Alexandr
Automated defectoscopy of thin poly(methyl methacrylate) layers.
IMAPS Flash Conference, 8th International Microelectronics Assembly and Packaging Society Flash Conference. Extended abstracts. Brno: Brno University of Technology, 2022 - (Otáhal, A.; Szendiuch, I.; Skácel, J.). s. 41-42. ISBN 978-80-214-6111-6.
[IMAPS Flash Conference 2022. International Microelectronics Assembly and Packaging Society Flash Conference /8./. 26.10.2022-27.10.2022, Brno]
Institutional support: RVO:68081731
Keywords : defects in resist * rtificial intelligence * image processing * automatization
OECD category: Automation and control systems
Permanent Link: https://hdl.handle.net/11104/0338861 - 6.0536984 - ÚPT 2021 MA eng A - Abstract
Al Soud, A. - Boll, T. - Knápek, Alexandr - Mousa, M. S.
Observations on the effect of coating Nano-Tip Apex with a thin layer of dielectric material on both electron and Ion Emission Mechanisms.
Fifth edition of International Symposium on Dielectric Materials and Applications. ISyDMA’5 Virtual Edition. Semlalia: Semlalia Cadi Ayyad University, 2020. s. 135.
[International Symposium on Dielectric Materials and Applications. ISyDMA’5 /5./. 15.04.2020-17.04.2020, Semlalia]
Institutional support: RVO:68081731
Keywords : field electron emission * field ion emission * epoxylite resin
OECD category: Coating and films
Permanent Link: http://hdl.handle.net/11104/0314738 - 7.0514120 - ÚPT 2020 JO eng A - Abstract
Mousa, M. S. - Chlumská, Jana - Knápek, Alexandr
Similarities and Differences between two researches in Field Electron Emission: Way to develop more powerful electron source.
Fourth International Symposium on Dielectric Materials and Applications (ISyDMA 4). Book of Abstracts. Amman: Jordan University of Science & Technology, 2019.
[The Fourth International Symposium on Dielectric Materials and Applications (ISyDMA 4). 02.05.2019-04.05.2019, Amman]
Institutional support: RVO:68081731
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0302366 - 8.0512152 - ÚPT 2020 JO eng A - Abstract
Mousa, M. S. - Al-Soud, A. - Knápek, Alexandr
Analysis of the various effects of coating W tips with dielectric Epoxylite 478 and EPR 4 resin coatings under similar operational conditions.
Fourth International Symposium on Dielectric Materials and Applications (ISyDMA 4). Book of Abstracts. Amman: Jordan University of Science & Technology, 2019.
[The Fourth International Symposium on Dielectric Materials and Applications (ISyDMA 4). 02.05.2019-04.05.2019, Amman]
Institutional support: RVO:68081731
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0302364 - 9.0512151 - ÚPT 2020 JO eng A - Abstract
Matějka, Milan - Chlumská, Jana - Krátký, Stanislav - Řiháček, Tomáš - Knápek, Alexandr - Kolařík, Vladimír
Fabrication of functional nanostructures in thin silicon nitride membranes.
Fourth International Symposium on Dielectric Materials and Applications (ISyDMA 4). Book of Abstracts. Amman: Jordan University of Science & Technology, 2019.
[The Fourth International Symposium on Dielectric Materials and Applications (ISyDMA 4). 02.05.2019-04.05.2019, Amman]
Institutional support: RVO:68081731
Keywords : thin dielectric layers * silicon nitride * membranes * electron beam lithography
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0302363 - 10.0512149 - ÚPT 2020 JO eng A - Abstract
Knápek, Alexandr - Drozd, Michal - Matějka, Milan - Chlumská, Jana - Král, Stanislav - Kolařík, Vladimír
Automated system for optical inspection of defects in resist coated non-patterned wafer.
Fourth International Symposium on Dielectric Materials and Applications (ISyDMA 4). Book of Abstracts. Amman: Jordan University of Science & Technology, 2019.
[The Fourth International Symposium on Dielectric Materials and Applications (ISyDMA 4). 02.05.2019-04.05.2019, Amman]
R&D Projects: GA MPO FV10618
Institutional support: RVO:68081731
Keywords : dielectric surface inspection * resist coated wafer
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0302361