Search results

  1. 1.
    0494373 - ÚPT 2019 RIV CZ eng C - Conference Paper (international conference)
    Řiháček, Tomáš - Horák, M. - Schachinger, T. - Matějka, Milan - Mika, Filip - Müllerová, Ilona
    Creation of electron vortex beams using the holographic reconstruction method in a scanning electron microscope.
    Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 66-67. ISBN 978-80-87441-23-7.
    [Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
    R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠk(CZ) LO1212; GA MŠk ED0017/01/01
    Institutional support: RVO:68081731
    Keywords : electron vortex beams * scanning electron microscopy * electron diffraction
    OECD category: Nano-materials (production and properties)
    Permanent Link: http://hdl.handle.net/11104/0287630
     
     
  2. 2.
    0464387 - ÚPT 2018 RIV CZ eng C - Conference Paper (international conference)
    Matějka, Milan - Krátký, Stanislav - Řiháček, Tomáš - Kolařík, Vladimír - Chlumská, Jana - Urbánek, Michal
    Nanopatterning of Silicon Nitride Membranes.
    NANOCON 2016. 8th International Conference on Nanomaterials - Research and Application. Conference Proceedings. Ostrava: Tanger, 2017, s. 709-714. ISBN 978-80-87294-71-0.
    [NANOCON 2016. International Conference on Nanomaterials - Research and Application /8./. Brno (CZ), 19.10.2016-21.10.2016]
    R&D Projects: GA TA ČR TE01020233; GA MŠk(CZ) LO1212; GA MŠk ED0017/01/01
    Institutional support: RVO:68081731
    Keywords : e-beam writer * silicon nitride membranes * nano patterning * anisotropic etching
    OECD category: Nano-processes (applications on nano-scale)
    Permanent Link: http://hdl.handle.net/11104/0270768
     
     
  3. 3.
    0460211 - ÚPT 2017 RIV CZ eng C - Conference Paper (international conference)
    Řiháček, Tomáš - Mika, Filip - Matějka, Milan - Krátký, Stanislav - Müllerová, Ilona
    Difraction in a scanning electron microscopie.
    Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016 - (Mika, F.), s. 56-57. ISBN 978-80-87441-17-6.
    [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./. Skalský dvůr (CZ), 29.05.2016-03.06.2016]
    R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠk(CZ) LO1212; GA MŠk ED0017/01/01
    Institutional support: RVO:68081731
    Keywords : electron microscopy * TEM * STEM
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    http://www.trends.isibrno.cz/
    Permanent Link: http://hdl.handle.net/11104/0260343
     
     
  4. 4.
    0448612 - ÚPT 2016 DE eng C - Conference Paper (international conference)
    Řiháček, Tomáš - Mika, Filip - Matějka, Milan - Krátký, Stanislav - Müllerová, Ilona
    Study of the coherence of the primary beam in the low energy scanning electron microscope.
    MC 2015. Microscopy Conference Proceedings. Göttingen: DGE, 2015, s. 611-612.
    [Microscopy Conference 2015. Göttingen (DE), 06.09.2015-11.09.2015]
    R&D Projects: GA TA ČR(CZ) TE01020118
    Institutional support: RVO:68081731
    Keywords : scanning electron microscope * coherence of the primary beam
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0250357