Search results

  1. 1.
    0540306 - ÚPT 2021 CZ eng A - Abstract
    Řiháček, Tomáš - Horák, M. - Schachinger, T. - Mika, Filip - Matějka, Milan - Fořt, Tomáš - Radlička, Tomáš - Novák, L. - Seďa, B. - McMorran, B.J. - Béché, A. - Verbeeck, J. - Müllerová, Ilona
    Electron vortex beams in the scanning electron microscope.
    Microscopy 2020. Praha: Československá mikroskopická společnost, 2020. s. 42.
    [Microscopy 2020. 06.10.2020-07.10.2020, Lednice]
    R&D Projects: GA TA ČR(CZ) TN01000008
    Institutional support: RVO:68081731
    Keywords : electron vortex beams * SEM
    OECD category: Electrical and electronic engineering
    Permanent Link: http://hdl.handle.net/11104/0317957
     
     
  2. 2.
    0512151 - ÚPT 2020 JO eng A - Abstract
    Matějka, Milan - Chlumská, Jana - Krátký, Stanislav - Řiháček, Tomáš - Knápek, Alexandr - Kolařík, Vladimír
    Fabrication of functional nanostructures in thin silicon nitride membranes.
    Fourth International Symposium on Dielectric Materials and Applications (ISyDMA 4). Book of Abstracts. Amman: Jordan University of Science & Technology, 2019.
    [The Fourth International Symposium on Dielectric Materials and Applications (ISyDMA 4). 02.05.2019-04.05.2019, Amman]
    Institutional support: RVO:68081731
    Keywords : thin dielectric layers * silicon nitride * membranes * electron beam lithography
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0302363
     
     
  3. 3.
    0512017 - ÚPT 2020 CZ eng A - Abstract
    Matějka, Milan - Krátký, Stanislav - Řiháček, Tomáš - Knápek, Alexandr - Kolařík, Vladimír
    Functional nano–structuring of thin silicon nitride membranes.
    5th IMAPS Flash Conference. Book of Abstracts. Brno: University of Technology, 2019. s. 74-75.
    [International Microelectronics Assembly and Packaging Society Flash Conference /5./. IMAPS. 24.10.2019-25.10.2019, Brno]
    Institutional support: RVO:68081731
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0302234
     
     
  4. 4.
    0510323 - ÚPT 2020 DE eng A - Abstract
    Řiháček, Tomáš - Mika, Filip - Horák, M. - Schachinger, T. - Matějka, Milan - Krátký, Stanislav - Müllerová, Ilona
    Creation and detection of electron vortex beams in a scanning electron microscope.
    Microscopy Conference: MC 2019. Abstracts. Berlin: DSE, 2019. s. 409-410.
    [Microscopy Conference : MC 2019. 01.09.2019-05.09.2019, Berlin]
    R&D Projects: GA TA ČR(CZ) TN01000008
    Institutional support: RVO:68081731
    Keywords : detection of electron vortex beams * SEM
    OECD category: Nano-materials (production and properties)
    https://www.microscopy-conference.de
    Permanent Link: http://hdl.handle.net/11104/0300832
     
     
  5. 5.
    0493460 - ÚPT 2019 DE eng A - Abstract
    Mrňa, Libor - Řiháček, Tomáš - Šarbort, Martin - Horník, Petr
    Solar absorber with structured surface.
    10th International Laser Symposium & International Symposium „Tailored Joining“. Book of Abstracts. Dresden: Fraunhofer, 2018. s. 88.
    [International Laser Symposium & International Symposium „Tailored Joining“ /10./. 27.02.2018-28.02.2018, Dresden]
    R&D Projects: GA TA ČR TA04020456; GA MŠk(CZ) LO1212
    Institutional support: RVO:68081731
    Keywords : solar absorber * laser welding * hydroforming * simulation
    OECD category: Optics (including laser optics and quantum optics)
    Permanent Link: http://hdl.handle.net/11104/0286826
     
     
  6. 6.
    0493331 - ÚPT 2019 US eng A - Abstract
    Mikmeková, Eliška - Paták, Aleš - Müllerová, Ilona - Frank, Luděk - Daniel, Benjamin - Konvalina, Ivo - Řiháček, Tomáš - Zouhar, Martin - Zaporozchenko, A. - Lejeune, M.
    Low and Ultra-low Energy Scanning Electron Microscopy of 2D Transition Metal Dichalcogenides: Experiments and Simulations.
    Microscopy and Microanalysis. Roč. 24, S1 (2018), s. 1564-1565. ISSN 1431-9276. E-ISSN 1435-8115.
    [Microscopy & Microanalysis 2018 Meeting. 05.08.2018-09.08.2018, Baltimore]
    R&D Projects: GA TA ČR(CZ) TE01020118
    Institutional support: RVO:68081731
    Keywords : low and ultra-low energy * SEM * 2D transition metal dichalcogenides * experiments and simulations
    OECD category: Nano-materials (production and properties)
    Permanent Link: http://hdl.handle.net/11104/0286714
     
     
  7. 7.
    0480603 - ÚPT 2018 AT eng A - Abstract
    Řiháček, Tomáš - Müllerová, Ilona
    Effect of axial aberrations on the degree of coherence in SEM.
    Sources, Interaction with Matter, Detection and Analysis of Low Energy Electrons 2017 (SIMDALEE2017). Book of Abstracts.. Wien: Institut für Angewandte Physik, 2017. s. 50.
    [SIMDALEE2017. Sources, Interaction with Matter, Detection and Analysis of Low Energy Electrons. 18.09.2017-22.09.2017, Pula]
    R&D Projects: GA TA ČR(CZ) TE01020118
    EU Projects: European Commission(XE) 606988 - SIMDALEE2
    Institutional support: RVO:68081731
    Keywords : axial aberrations * SEM
    OECD category: Electrical and electronic engineering
    Permanent Link: http://hdl.handle.net/11104/0276339
     
     
  8. 8.
    0452602 - ÚPT 2016 CZ eng A - Abstract
    Řiháček, Tomáš - Müllerová, Ilona
    Recent progress in applications of electron vortex beams.
    Mikroskopie 2015. Praha: Československá mikroskopická společnost, 2015. s. 79-80.
    [Mikroskopie 2015. 12.05.2015-13.05.2015, Lednice]
    R&D Projects: GA TA ČR(CZ) TE01020118
    Institutional support: RVO:68081731
    Keywords : electron vortex beam
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0253557
     
     
  9. 9.
    0431335 - ÚPT 2015 CZ eng A - Abstract
    Řiháček, Tomáš - Lenc, M. - Müllerová, Ilona
    Measurement of coherence properties of scanning electron microscope.
    9th International Conference on Charged Particle Optics. Book of Abstracts. Brno: Institute of Scientific Instruments AS CR, v. v. i, 2014. s. 65. ISBN 978-80-87441-11-4.
    [International Conference on Charged Parrticle Optics /9./. 31.08.2014-05.09.2014, Brno]
    R&D Projects: GA TA ČR TE01020118
    Institutional support: RVO:68081731
    Keywords : coherence * diffraction * scanning electron microscope
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0236396