Search results

  1. 1.
    0575427 - ÚPT 2024 GB eng A - Abstract
    Müllerová, Ilona - Konvalina, Ivo - Zouhar, Martin - Paták, Aleš - Daniel, Benjamin - Průcha, Lukáš - Piňos, Jakub - Materna-Mikmeková, Eliška
    Study of Graphene by Scanning Low Energy Electron Microscopy and Time-of-Flight Spectroscopy.
    Microscopy and Microanalysis. Cambridge University Press. Roč. 29, S1 (2023), s. 1861-1862. ISSN 1431-9276. E-ISSN 1435-8115.
    [Microscopy & Microanalysis 2023. 23.07.2023-27.07.2023, Minneapolis]
    R&D Projects: GA ČR(CZ) GA22-34286S
    Grant - others:AV ČR(CZ) StrategieAV21/26
    Program: StrategieAV
    Institutional support: RVO:68081731
    https://academic.oup.com/mam/article/29/Supplement_1/1861/7229038
    Permanent Link: https://hdl.handle.net/11104/0345212
     
     
  2. 2.
    0571040 - ÚPT 2024 GB eng A - Abstract
    Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Průcha, Lukáš - Piňos, Jakub - Müllerová, Ilona - Materna-Mikmeková, Eliška
    Study of Graphene and Thin Foils by a Time-of-Flight Spectrometer for Low Landing Energies.
    Microscopy and Microanalysis. Cambridge University Press. Roč. 28, S1 (2022), s. 2432-2434. ISSN 1431-9276. E-ISSN 1435-8115
    R&D Projects: GA TA ČR(CZ) TN01000008
    Grant - others:AV ČR(CZ) StrategieAV21/26
    Program: StrategieAV
    Institutional support: RVO:68081731
    OECD category: Electrical and electronic engineering
    https://academic.oup.com/mam/article/28/S1/2432/6997288
    Permanent Link: https://hdl.handle.net/11104/0342355
     
     
  3. 3.
    0568482 - ÚPT 2023 RIV CZ eng A - Abstract
    Paták, Aleš - Zouhar, Martin - Konvalina, Ivo - Materna-Mikmeková, Eliška - Průcha, Lukáš - Müllerová, Ilona - Charvátová Campbell, A.
    Ab initio study of angle-resolved electron spectroscopy of graphene.
    16th Multinational Congress on Microscopy, 16MCM, 04-09 September 2022, Brno, Czech Republic. Book of abstracts. Brno: Czechoslovak Microscopy Society, 2022 - (Krzyžánek, V.; Hrubanová, K.; Hozák, P.; Müllerová, I.; Šlouf, M.). s. 156-157. ISBN 978-80-11-02253-2.
    [Multinational Congress on Microscopy /16./. 04.09.2022-09.09.2022, Brno]
    R&D Projects: GA TA ČR(CZ) TN01000008
    Institutional support: RVO:68081731
    Keywords : density-functional theory * low-energy electron microscopy * many-body perturbation theory
    OECD category: Electrical and electronic engineering
    https://www.16mcm.cz/wp-content/uploads/2022/09/16MCM-abstract-book.pdf
    Permanent Link: https://hdl.handle.net/11104/0339786
     
     
  4. 4.
    0568420 - ÚPT 2023 RIV CZ eng A - Abstract
    Zouhar, Martin - Paták, Aleš - Konvalina, Ivo - Fořt, Tomáš - Materna-Mikmeková, Eliška
    Energy-based calibration for quantitative STEM measurements and comparison with 2D-PAD.
    16th Multinational Congress on Microscopy, 16MCM, 04-09 September 2022, Brno, Czech Republic. Book of abstracts. Brno: Czechoslovak Microscopy Society, 2022 - (Krzyžánek, V.; Hrubanová, K.; Hozák, P.; Müllerová, I.; Šlouf, M.). s. 450-451. ISBN 978-80-11-02253-2.
    [Multinational Congress on Microscopy /16./. 04.09.2022-09.09.2022, Brno]
    R&D Projects: GA TA ČR(CZ) TN01000008
    Institutional support: RVO:68081731
    Keywords : STEM segmented detector * pixelated detector * scanning electron microscopy * Monte Carlo simulations * ray tracing * quantitative imaging
    OECD category: Optics (including laser optics and quantum optics)
    https://www.16mcm.cz/wp-content/uploads/2022/09/16MCM-abstract-book.pdf
    Permanent Link: https://hdl.handle.net/11104/0339731
     
     
  5. 5.
    0567527 - ÚPT 2023 CZ eng A - Abstract
    Zouhar, Martin - Daniel, Benjamin - Konvalina, Ivo - Paták, Aleš - Piňos, Jakub - Materna-Mikmeková, Eliška
    Effective IMFP of thin samples via the time-of-flight method.
    16th Multinational Congress on Microscopy, 16MCM, 04-09 September 2022, Brno, Czech Republic. Book of abstracts. Brno: Czechoslovak Microscopy Society, 2022 - (Krzyžánek, V.; Hrubanová, K.; Hozák, P.; Müllerová, I.; Šlouf, M.). s. 168. ISBN 978-80-11-02253-2.
    [Multinational Congress on Microscopy /16./. 04.09.2022-09.09.2022, Brno]
    R&D Projects: GA ČR(CZ) GA22-34286S
    Institutional support: RVO:68081731
    Keywords : time‑of‑flight spectrometer * SLEEM * inelastic mean free path
    OECD category: Electrical and electronic engineering
    https://www.16mcm.cz/wp-content/uploads/2022/09/16MCM-abstract-book.pdf
    Permanent Link: https://hdl.handle.net/11104/0338780
     
     
  6. 6.
    0567516 - ÚPT 2023 RIV CZ eng A - Abstract
    Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Průcha, Lukáš - Piňos, Jakub - Müllerová, Ilona - Materna-Mikmeková, Eliška
    Time-of-Flight Spectrometer for Low Landing Energies.
    16th Multinational Congress on Microscopy, 16MCM, 04-09 September 2022, Brno, Czech Republic. Book of abstracts. Brno: Czechoslovak Microscopy Society, 2022 - (Krzyžánek, V.; Hrubanová, K.; Hozák, P.; Müllerová, I.; Šlouf, M.). s. 160-161. ISBN 978-80-11-02253-2.
    [Multinational Congress on Microscopy /16./. 04.09.2022-09.09.2022, Brno]
    R&D Projects: GA TA ČR(CZ) TN01000008
    Institutional support: RVO:68081731
    Keywords : time‑of‑flight spectrometer * graphene * inelastic mean free path * energy‑loss spectrum
    OECD category: Electrical and electronic engineering
    https://www.16mcm.cz/wp-content/uploads/2022/09/16MCM-abstract-book.pdf
    Permanent Link: https://hdl.handle.net/11104/0338771
     
     
  7. 7.
    0552322 - ÚPT 2022 CZ eng A - Abstract
    Zouhar, Martin - Paták, Aleš - Materna-Mikmeková, Eliška
    Density‑functional theory based study of graphene.
    15th International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) expanded to Geo-Eerth Science & Civil Design / Engineering (ES&CDE). Abstract book. Institute of Scientific Instruments of the CAS: Brno, 2021. s. 85.
    [International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) /15./. 18.10.2021-19.10.2021, online]
    Grant - others:AV ČR(CZ) StrategieAV21/6
    Program: StrategieAV
    Institutional support: RVO:68081731
    Keywords : density‑functional theory * graphene * band structure * density of states * electron energy‑loss spectrum
    https://icpmat2021.com/_files/200001189-a9feaa9fec/icpmat-2021-abstract-book.pdf
    Permanent Link: http://hdl.handle.net/11104/0327451
     
     
  8. 8.
    0552272 - ÚPT 2022 CZ eng A - Abstract
    Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Piňos, Jakub - Průcha, Lukáš - Frank, Luděk - Müllerová, Ilona - Materna-Mikmeková, Eliška
    Study of Graphene by a Time‑of‑Flight Spectrometer for Low Landing Energies.
    15th International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) expanded to Geo-Eerth Science & Civil Design / Engineering (ES&CDE). Abstract book. Institute of Scientific Instruments of the CAS: Brno, 2021. s. 84.
    [International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) /15./. 18.10.2021-19.10.2021, online]
    Grant - others:AV ČR(CZ) StrategieAV21/6
    Program: StrategieAV
    Institutional support: RVO:68081731
    Keywords : time‑of‑flight spectrometer * graphene * inelastic mean free path * energy‑loss spectrum * density‑functional theory
    OECD category: Electrical and electronic engineering
    https://ava2016-autumn.webnode.cz/
    Permanent Link: http://hdl.handle.net/11104/0327405
     
     
  9. 9.
    0551131 - ÚPT 2022 RIV US eng A - Abstract
    Konvalina, Ivo - Zouhar, Martin - Daniel, Benjamin - Paták, Aleš - Piňos, Jakub - Frank, Luděk - Müllerová, Ilona - Materna-Mikmeková, Eliška
    The time-of-flight (ToF) analysis of transmitted electrons at energies of hundred of eV for pure elements.
    Microscopy and Microanalysis. Cambridge University Press. Roč. 27, S1 (2021), s. 612-615. ISSN 1431-9276. E-ISSN 1435-8115
    Institutional support: RVO:68081731
    Keywords : time of flight spectrometer * inelastic mean free path * energy loss spectrum * density functional theory
    OECD category: Electrical and electronic engineering
    https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/timeofflight-tof-analysis-of-transmitted-electrons-at-energies-of-hundred-of-ev-for-pure-elements/13DD7110753D4BB9830773B5B732F086
    Permanent Link: http://hdl.handle.net/11104/0326576
     
     
  10. 10.
    0536979 - ÚPT 2021 CZ eng A - Abstract
    Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Piňos, Jakub - Radlička, Tomáš - Frank, Luděk - Müllerová, Ilona - Materna-Mikmeková, Eliška
    Study of electron scattering phenomena of advanced materials by UHV SLEEM/ToF.
    Microscopy 2020. Praha: Československá mikroskopická společnost, 2020. s. 95-96.
    [Microscopy 2020. 06.10.2020-07.10.2020, Lednice]
    R&D Projects: GA TA ČR(CZ) TN01000008
    Institutional support: RVO:68081731
    Keywords : electron scattering phenomena
    OECD category: Electrical and electronic engineering
    Permanent Link: http://hdl.handle.net/11104/0314731
     
     

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