Search results
- 1.0436622 - ÚPT 2015 RIV US eng J - Journal Article
Novotná, V. - Hrubanová, Kamila - Nebesářová, J. - Krzyžánek, Vladislav
Investigation of Electron Beam Induced Mass Loss of Embedding Media in the Low Voltage STEM.
Microscopy and Microanalysis. Roč. 20, S3 (2014), s. 1270-1271. ISSN 1431-9276. E-ISSN 1435-8115
R&D Projects: GA MŠMT EE.2.3.20.0103; GA MŠMT(CZ) LO1212; GA ČR(CZ) GA14-20012S; GA TA ČR TE01020118
Institutional support: RVO:68081731
Keywords : mass loss * mass-thickness measurement * low voltage STEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.872, year: 2014
Permanent Link: http://hdl.handle.net/11104/0240333 - 2.0436621 - ÚPT 2015 RIV US eng J - Journal Article
Krzyžánek, Vladislav - Hrubanová, Kamila - Nebesářová, J. - Růžička, F.
Cryo-SEM of Perpendicular Cross Freeze-Fractures Through a High-Pressure-frozen Biofilm.
Microscopy and Microanalysis. Roč. 20, S3 (2014), s. 1232-1233. ISSN 1431-9276. E-ISSN 1435-8115
R&D Projects: GA MŠMT EE.2.3.20.0103; GA MŠMT(CZ) LO1212; GA TA ČR TE01020118; GA ČR GAP205/11/1687
Institutional support: RVO:68081731
Keywords : biofilm * cryo-SEM * high-pressure-freezing
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.872, year: 2014
Permanent Link: http://hdl.handle.net/11104/0240330 - 3.0436617 - ÚPT 2015 RIV US eng J - Journal Article
Hrubanová, Kamila - Voberková, S. - Hermanová, S. - Krzyžánek, Vladislav
Characterization of Polycaprolactone Films Biodeterioration by Scanning Electron Microscopy.
Microscopy and Microanalysis. Roč. 20, S3 (2014), s. 1950-1951. ISSN 1431-9276. E-ISSN 1435-8115
R&D Projects: GA MŠMT EE.2.3.20.0103; GA MŠMT(CZ) LO1212
Institutional support: RVO:68081731
Keywords : polycaprolactone films * biodeterioration * scanning electron microscopy
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.872, year: 2014
Permanent Link: http://hdl.handle.net/11104/0240320 - 4.0434470 - ÚPT 2015 RIV US eng J - Journal Article
Neděla, Vilém - Tihlaříková, Eva - Hřib, Jiří - Runštuk, Jiří
Comparison of Classical SEM and ESEM Protocols for Study of Conifer Embryogénie Tissues with Using Low Temperature Conditions of ESEM.
Microscopy and Microanalysis. Roč. 20, S2 (2014), s. 1230-1231. ISSN 1431-9276. E-ISSN 1435-8115
R&D Projects: GA ČR(CZ) GA14-22777S; GA MŠMT EE.2.3.20.0103; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : eSEM * AQUASEM II * plant samples * methodology
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.872, year: 2014
Permanent Link: http://hdl.handle.net/11104/0238538 - 5.0434469 - ÚPT 2015 RIV US eng J - Journal Article
Čudek, P. - Jirák, Josef - Neděla, Vilém
Optimization of Signal Detection in Scintillation Secondary Electron Detector for ESEM and SEM.
Microscopy and Microanalysis. Roč. 19, S2 (2014), s. 40-41. ISSN 1431-9276. E-ISSN 1435-8115
R&D Projects: GA MŠMT EE.2.3.20.0103; GA ČR(CZ) GA14-22777S
Institutional support: RVO:68081731
Keywords : signal detection * scintillation secondary electron detector * ESEM * SEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.872, year: 2014
Permanent Link: http://hdl.handle.net/11104/0238537 - 6.0434355 - ÚPT 2015 JP eng J - Journal Article
Neděla, Vilém - Tihlaříková, Eva - Shiojiri, M.
New Environmental Scanning Electron Microscopy and Observation if Live Nature.
kenbikyo. Roč. 49, č. 1 (2014), s. 64-67. ISSN 1349-0958
R&D Projects: GA ČR GAP102/10/1410
Institutional support: RVO:68081731
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0238676 - 7.0431982 - ÚPT 2015 RIV BG eng J - Journal Article
Dupák, Libor
Electron beam micromachining of plastics.
Elektrotechnica & Elektronica. Roč. 49, 5-6 (2014), s. 310-314. ISSN 0861-4717
R&D Projects: GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01; GA MŠMT EE.2.3.20.0103
Institutional support: RVO:68081731
Keywords : micromachining of plastics * Electron beam
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0236493 - 8.0430357 - ÚPT 2015 RIV US eng J - Journal Article
Bok, Jan - Schauer, Petr
Performance of SEM Scintillation Detector Evaluated by Modulation Transfer Function and Detective Quantum Efficiency Function.
Scanning. Roč. 36, č. 4 (2014), s. 384-393. ISSN 0161-0457. E-ISSN 1932-8745
R&D Projects: GA TA ČR TE01020118; GA ČR GAP102/10/1410; GA MŠMT EE.2.3.20.0103
Institutional support: RVO:68081731
Keywords : MTF * DQE * image detection * scintillator * e-beam scanning
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.891, year: 2014
Permanent Link: http://hdl.handle.net/11104/0235314 - 9.0421779 - ÚPT 2014 RIV US eng J - Journal Article
Hrubanová, Kamila - Nebesářová, Jana - Růžička, F. - Dluhoš, J. - Krzyžánek, Vladislav
Characterization of Yeast Biofilm by Cryo-SEM and FIB-SEM.
Microscopy and Microanalysis. Roč. 19, S2 (2013), s. 226-227. ISSN 1431-9276. E-ISSN 1435-8115
R&D Projects: GA MŠMT EE.2.3.20.0103; GA TA ČR TE01020118; GA ČR GAP205/11/1687
Institutional support: RVO:68081731 ; RVO:60077344
Keywords : yeast biofilm * cryo-SEM * FIB-SEM
Subject RIV: BH - Optics, Masers, Lasers
Impact factor: 2.161, year: 2013
Permanent Link: http://hdl.handle.net/11104/0228043 - 10.0421778 - ÚPT 2014 RIV US eng J - Journal Article
Krzyžánek, Vladislav - Tacke, S. - Hrubanová, Kamila - Reichelt, R.
Beyond Imaging: Scanning Electron Microscope for the Quantitative Mass Measurement.
Microscopy and Microanalysis. Roč. 19, S2 (2013), s. 130-131. ISSN 1431-9276. E-ISSN 1435-8115
R&D Projects: GA MŠMT EE.2.3.20.0103
Institutional support: RVO:68081731
Keywords : STEM * mass measurement * cryo-preparation
Subject RIV: BH - Optics, Masers, Lasers
Impact factor: 2.161, year: 2013
Permanent Link: http://hdl.handle.net/11104/0228041