Search results

  1. 1.
    0549376 - ÚPT 2022 RIV GB eng J - Journal Article
    Hanzelka, Pavel - Dupák, Libor - Krutil, Vojtěch - Krzyžánek, Vladislav - Skoupý, Radim - Srnka, Aleš - Vlček, Ivan - Urban, Pavel
    Low conductive thermal insulation pad with high mechanical stiffness.
    International Journal of Refrigeration. Roč. 132, December (2021), s. 92-99. ISSN 0140-7007. E-ISSN 1879-2081
    R&D Projects: GA TA ČR TE01020233
    Institutional support: RVO:68081731
    Keywords : Cryogenics * Thermal insulation * Microscopy * Sample holder
    OECD category: Thermodynamics
    Impact factor: 4.140, year: 2021
    Method of publishing: Open access
    https://www.sciencedirect.com/science/article/pii/S0140700721003777?via%3Dihub
    Permanent Link: http://hdl.handle.net/11104/0325387
     
     
  2. 2.
    0543086 - ÚPT 2022 RIV NL eng J - Journal Article
    Řeřucha, Šimon - Holá, Miroslava - Šarbort, Martin - Hrabina, Jan - Oulehla, Jindřich - Číp, Ondřej - Lazar, Josef
    Compact differential plane interferometer with in-axis mirror tilt detection.
    Optics and Lasers in Engineering. Roč. 141, June (2021), č. článku 106568. ISSN 0143-8166. E-ISSN 1873-0302
    R&D Projects: GA MPO(CZ) FV10336; GA TA ČR TE01020233; GA TA ČR(CZ) TN01000008; GA MŠMT ED0017/01/01; GA MŠMT(CZ) LO1212; GA MŠMT(CZ) EF16_026/0008460
    EU Projects: European Commission(XE) 17IND03 - LaVa
    Institutional support: RVO:68081731
    Keywords : Laser interferometry * Optical metrology * Dimensional measurement * Common path interferometer * Differential interferometer * Tilt compensation
    OECD category: Optics (including laser optics and quantum optics)
    Impact factor: 5.666, year: 2021
    Method of publishing: Open access
    https://www.sciencedirect.com/science/article/pii/S0143816621000385
    Permanent Link: http://hdl.handle.net/11104/0320376
     
     
  3. 3.
    0525154 - ÚPT 2021 RIV US eng J - Journal Article
    Valero, A.C. - Kislov, D. - Gurvitz, E.A. - Shamkhi, H. - Pavlov, A.A. - Redka, D. - Yankin, S. - Zemánek, Pavel - Shalin, A.S.
    Nanovortex-Driven All-Dielectric Optical Diffusion Boosting and Sorting Concept for Lab-on-a-Chip Platforms.
    Advanced Science. Roč. 7, č. 11 (2020), č. článku 1903049. E-ISSN 2198-3844
    R&D Projects: GA ČR(CZ) GA19-17765S; GA TA ČR TE01020233
    Institutional support: RVO:68081731
    Keywords : all-dielectric nanophotonics * lab-on-a-chip platforms * nanofluidics * optomechanical manipulations * spin-orbit couplings
    OECD category: Optics (including laser optics and quantum optics)
    Impact factor: 16.806, year: 2020
    Method of publishing: Open access
    https://onlinelibrary.wiley.com/doi/full/10.1002/advs.201903049
    Permanent Link: http://hdl.handle.net/11104/0309357
     
     
  4. 4.
    0511898 - ÚPT 2020 RIV US eng J - Journal Article
    Šarbort, Martin - Holá, Miroslava - Pavelka, Jan - Schovánek, P. - Řeřucha, Šimon - Oulehla, Jindřich - Fořt, Tomáš - Lazar, Josef
    Comparison of three focus sensors for optical topography measurement of rough surfaces.
    Optics Express. Roč. 27, č. 23 (2019), s. 33459-33473. ISSN 1094-4087
    R&D Projects: GA MŠMT(CZ) EF16_026/0008460; GA TA ČR TE01020233; GA TA ČR(CZ) TN01000008; GA MŠMT ED0017/01/01; GA MŠMT(CZ) LO1212
    Institutional support: RVO:68081731
    Keywords : profilometry * stylus * beam
    OECD category: Optics (including laser optics and quantum optics)
    Impact factor: 3.669, year: 2019
    Method of publishing: Open access
    https://www.osapublishing.org/oe/fulltext.cfm?uri=oe-27-23-33459&id=422804
    Permanent Link: http://hdl.handle.net/11104/0302138
     
     
  5. 5.
    0508751 - ÚPT 2020 RIV CH eng J - Journal Article
    Konvalina, Ivo - Mika, Filip - Krátký, Stanislav - Materna Mikmeková, Eliška - Müllerová, Ilona
    In-Lens Band-Pass Filter for Secondary Electrons in Ultrahigh Resolution SEM.
    Materials. Roč. 12, č. 14 (2019), č. článku 2307. E-ISSN 1996-1944
    R&D Projects: GA TA ČR(CZ) TE01020118; GA TA ČR TE01020233; GA TA ČR(CZ) TN01000008
    Institutional support: RVO:68081731
    Keywords : band-pass filter of signal electrons * SE detection * trajectory simulations
    OECD category: Electrical and electronic engineering
    Impact factor: 3.057, year: 2019
    Method of publishing: Open access
    https://www.mdpi.com/1996-1944/12/14/2307/htm
    Permanent Link: http://hdl.handle.net/11104/0299576
     
     
  6. 6.
    0501458 - ÚPT 2020 RIV SK eng J - Journal Article
    Kolařík, Vladimír - Horáček, Miroslav - Knápek, Alexandr - Krátký, Stanislav - Matějka, Milan - Meluzín, Petr
    Spiral arrangement: From nanostructures to packaging.
    Journal of Electrical Engineering - Elektrotechnický časopis. Roč. 70, č. 1 (2019), s. 74-77. ISSN 1335-3632. E-ISSN 1339-309X
    R&D Projects: GA MPO FV10618; GA TA ČR TG03010046; GA TA ČR TE01020233; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
    Institutional support: RVO:68081731
    Keywords : electron beam lithography * phyllotaxis * spiral arrangement * parastichy
    OECD category: Electrical and electronic engineering
    Impact factor: 0.686, year: 2019
    Method of publishing: Open access
    https://content.sciendo.com/view/journals/jee/70/1/article-p74.xml?lang=en
    Permanent Link: http://hdl.handle.net/11104/0293484
     
     
  7. 7.
    0489593 - ÚPT 2019 RIV GB eng J - Journal Article
    Damková, Jana - Chvátal, Lukáš - Ježek, Jan - Oulehla, Jindřich - Brzobohatý, Oto - Zemánek, Pavel
    Enhancement of the 'tractor-beam' pulling force on an optically bound structure.
    Light-Science & Applications. Roč. 7, JAN (2018), č. článku 17135. ISSN 2047-7538. E-ISSN 2047-7538
    R&D Projects: GA ČR(CZ) GA14-16195S; GA TA ČR TE01020233; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
    Institutional support: RVO:68081731
    Keywords : binding * microscopy
    OECD category: Optics (including laser optics and quantum optics)
    Impact factor: 14.000, year: 2018
    Permanent Link: http://hdl.handle.net/11104/0283978
     
     
  8. 8.
    0480451 - ÚPT 2018 RIV GB eng J - Journal Article
    Řeřucha, Šimon - Yacoot, A. - Pham, Minh Tuan - Čížek, Martin - Hucl, Václav - Lazar, Josef - Číp, Ondřej
    Laser source for dimensional metrology: investigation of an iodine stabilized system based on narrow linewidth 633 nm DBR diode.
    Measurement Science and Technology. Roč. 28, č. 4 (2017), s. 1-11, č. článku 045204. ISSN 0957-0233. E-ISSN 1361-6501
    R&D Projects: GA ČR GB14-36681G; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01; GA TA ČR TE01020233
    Institutional support: RVO:68081731
    Keywords : optical metrology * DBR laser diode * frequency stabilization * laser interferometry * dimensional metrology * iodine stabilization * displacement measurement
    OECD category: Optics (including laser optics and quantum optics)
    Impact factor: 1.685, year: 2017
    Permanent Link: http://hdl.handle.net/11104/0276231
     
     
  9. 9.
    0477782 - ÚPT 2018 RIV NL eng J - Journal Article
    Krátký, Stanislav - Kolařík, Vladimír - Horáček, Miroslav - Meluzín, Petr - Král, Stanislav
    Combined e-beam lithography using different energies.
    Microelectronic Engineering. Roč. 177, JUN (2017), s. 30-34. ISSN 0167-9317. E-ISSN 1873-5568
    R&D Projects: GA TA ČR TE01020233; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
    Institutional support: RVO:68081731
    Keywords : grayscale e-beam lithography * mix and match process * absorbed energy density * resist sensitivity * micro-optical elements
    OECD category: Nano-processes (applications on nano-scale)
    Impact factor: 2.020, year: 2017
    Permanent Link: http://hdl.handle.net/11104/0274006
     
     
  10. 10.
    0452397 - ÚPT 2016 RIV CZ cze J - Journal Article
    Lazar, Josef - Holá, Miroslava - Hrabina, Jan - Oulehla, Jindřich - Číp, Ondřej - Vychodil, M. - Sedlář, P. - Provazník, M.
    Pokročilé interferometrické systémy pro měření polohy v nanometrologii.
    [Advanced interferometry systems for dimensional measurement in nanometrology.]
    Jemná mechanika a optika. Roč. 60, č. 1 (2015), s. 14-17. ISSN 0447-6441
    R&D Projects: GA ČR GB14-36681G; GA TA ČR TA02010711; GA TA ČR TA01010995; GA TA ČR TE01020233; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
    Institutional support: RVO:68081731
    Keywords : interferometry systems * dimensional measurement * nanometrology
    Subject RIV: BH - Optics, Masers, Lasers
    Permanent Link: http://hdl.handle.net/11104/0253412
     
     

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