Search results
- 1.0522221 - ÚPT 2020 US eng A - Abstract
Mikmeková, Šárka - Jánský, P. - Kolařík, V. - Müllerová, Ilona
Surface imaging with UHV SLEEM and SEM LEEM.
Microscopy and Microanalysis. Cambridge University Press. Roč. 25, S2 (2019), s. 444-445. ISSN 1431-9276. E-ISSN 1435-8115.
[Microscopy & Microanalysis 2019 Meeting. 04.08.2019-08.08.2019, Portland]
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731
Keywords : surface imaging * UHV SLEEM * SEM LEEM
OECD category: Materials engineering
Permanent Link: http://hdl.handle.net/11104/0306716 - 2.0521756 - ÚPT 2020 SK eng A - Abstract
Kasl, J. - Jandová, D. - Mikmeková, Šárka - Ambrož, Ondřej
Characterization of microstructure of crept sapmles of dissimilar weld joint using standard and advanced electron microscopy techniques.
Metallography & Fractography 2019. Abstract Booklet. Košice: Technická univerzita v Košiciach, 2019. s. 44. ISBN 978-80-553-3285-7.
[Metallography & Fractography 2019. 24.04.2019-26.04.2019, Nový Smokovec]
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731
Keywords : electron microscopy * microstructure * creep test * martensitic steels
OECD category: Materials engineering
Permanent Link: http://hdl.handle.net/11104/0306331 - 3.0519852 - ÚPT 2020 RS eng A - Abstract
Müllerová, Ilona - Daniel, Benjamin - Konvalina, Ivo - Frank, Luděk - Materna Mikmeková, Eliška
Advanced techniques for low- and very-low energy SEM using reflected and transmitted signals.
MCM 2019. 14th Multinational Congress on Microscopy. Proceedings. Belgrade: University of Belgrade, 2019. s. 98-99. ISBN 978-86-80335-11-7.
[Multinational Congress on Microscopy /14./. 15.09.2019-20.09.2019, Belgrade]
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731
Keywords : very-low energy electron microscopy * very-low energy electron microscopy
OECD category: Electrical and electronic engineering
Permanent Link: http://hdl.handle.net/11104/0304834 - 4.0510317 - ÚPT 2020 DE eng A - Abstract
Zouhar, Martin - Daniel, Benjamin - Radlička, Tomáš - Oral, Martin - Konvalina, Ivo
Simulation of optimal measurement setting and calibration of a novel time-offlight spectrometer.
Microscopy Conference: MC 2019. Abstracts. Berlin: DSE, 2019. s. 603-604.
[Microscopy Conference : MC 2019. 01.09.2019-05.09.2019, Berlin]
R&D Projects: GA TA ČR(CZ) TN01000008; GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731
Keywords : measurement setting and calibration * novel time-offlight
OECD category: Electrical and electronic engineering
https://www.microscopy-conference.de
Permanent Link: http://hdl.handle.net/11104/0300825 - 5.0510315 - ÚPT 2020 DE eng A - Abstract
Daniel, Benjamin - Zouhar, Martin - Radlička, Tomáš - Piňos, Jakub - Materna Mikmeková, Eliška - Konvalina, Ivo - Frank, Luděk - Müllerová, Ilona
Very Low Energy Electron Transmission Spectro-Microscopy.
Microscopy Conference: MC 2019. Abstracts. Berlin: DSE, 2019. s. 609-610.
[Microscopy Conference : MC 2019. 01.09.2019-05.09.2019, Berlin]
R&D Projects: GA TA ČR(CZ) TN01000008; GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731
Keywords : very low energy * electron transmission spectro-microscopy
OECD category: Electrical and electronic engineering
https://www.microscopy-conference.de
Permanent Link: http://hdl.handle.net/11104/0300821 - 6.0505221 - ÚMCH 2020 CZ eng A - Abstract
Krejčíková, Sabina - Hromádková, Jiřina - Fulín, P. - Jahoda, D. - Pokorný, D. - Šlouf, Miroslav
Microscopic analysis and surface area calculation of model and in vivo UHMWPE wear particles.
Microscopy 2019. Praha: Československá mikroskopická společnost, 2019. s. 79-80.
[Microscopy 2019. 13.05.2019-15.05.2019, Lednice na Moravě]
R&D Projects: GA MZd(CZ) NV15-31269A; GA TA ČR(CZ) TE01020118; GA TA ČR(CZ) TN01000008; GA MŠMT(CZ) LO1507
Institutional support: RVO:61389013
Keywords : UHMWPE * wear particle * total hip arthroplasty
OECD category: Polymer science
Permanent Link: http://hdl.handle.net/11104/0296882 - 7.0505220 - ÚMCH 2020 CZ eng A - Abstract
Hromádková, Jiřina - Stará, Hana - Sysel, P. - Novák, I. - Patáková, Z. - Šlouf, Miroslav
Polymer composites in a modern SEM microscope: separating topographic and compositional contrast.
Microscopy 2019. Praha: Československá mikroskopická společnost, 2019. s. 77-78.
[Microscopy 2019. 13.05.2019-15.05.2019, Lednice na Moravě]
R&D Projects: GA TA ČR(CZ) TE01020118; GA TA ČR(CZ) TN01000008; GA MŠMT(CZ) LO1507
Institutional support: RVO:61389013
Keywords : SEM microscopy * polymer composites * SE imaging
OECD category: Polymer science
Permanent Link: http://hdl.handle.net/11104/0296881 - 8.0505219 - ÚMCH 2020 CZ eng A - Abstract
Gajdošová, Veronika - Vlková, Helena - Hromádková, Jiřina - Krejčíková, Sabina - Piorkowska, E. - Vaněček, J. - Šlouf, Miroslav
Micromechanical properties of polymers: detailed interpretation with the help of SEM and 3D-LM microscopy.
Microscopy 2019. Praha: Československá mikroskopická společnost, 2019. s. 31-32.
[Microscopy 2019. 13.05.2019-15.05.2019, Lednice na Moravě]
R&D Projects: GA TA ČR(CZ) TE01020118; GA TA ČR(CZ) TN01000008; GA MŠMT(CZ) LO1507
Grant - others:AV ČR(CZ) PAN-17-18
Program: Bilaterální spolupráce
Institutional support: RVO:61389013
Keywords : indentation hardness testing * synthetic polymers * creep
OECD category: Polymer science
Permanent Link: http://hdl.handle.net/11104/0296880 - 9.0505216 - ÚMCH 2020 CZ eng A - Abstract
Šlouf, Miroslav - Gajdošová, Veronika - Hromádková, Jiřina - Vlčková, B. - Vohlídal, J. - Šloufová, I.
Controlled tuning of AgNPs size distributions by THF: spectrophotometric and microscopic study.
Microscopy 2019. Praha: Československá mikroskopická společnost, 2019. s. 75-76.
[Microscopy 2019. 13.05.2019-15.05.2019, Lednice na Moravě]
R&D Projects: GA ČR(CZ) GA17-05007S; GA TA ČR(CZ) TE01020118; GA TA ČR(CZ) TN01000008; GA MŠMT(CZ) LO1507
Institutional support: RVO:61389013
Keywords : silver nanoparticles * controled size distribution * TEM microscopy
OECD category: Polymer science
Permanent Link: http://hdl.handle.net/11104/0296879 - 10.0502126 - ÚPT 2019 NL eng A - Abstract
Konvalina, Ivo - Paták, Aleš - Materna Mikmeková, Eliška - Müllerová, Ilona
STEM detector in SEM.
FEELIS-III. Amsterdam: ARCNL, 2018. s. 55-56.
[LEELIS-III. Low Energy Elwctrons: Lithography, Imaging and Soft Matter. 12.11.2018-13.11.2018, Amsterdam]
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : STEM * SEM
OECD category: Electrical and electronic engineering
Permanent Link: http://hdl.handle.net/11104/0294115