Search results

  1. 1.
    0522221 - ÚPT 2020 US eng A - Abstract
    Mikmeková, Šárka - Jánský, P. - Kolařík, V. - Müllerová, Ilona
    Surface imaging with UHV SLEEM and SEM LEEM.
    Microscopy and Microanalysis. Roč. 25, S2 (2019), s. 444-445. ISSN 1431-9276.
    [Microscopy & Microanalysis 2019 Meeting. 04.08.2019-08.08.2019, Portland]
    R&D Projects: GA TA ČR(CZ) TE01020118
    Institutional support: RVO:68081731
    Keywords : surface imaging * UHV SLEEM * SEM LEEM
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    OBOR OECD: Materials engineering
    Permanent Link: http://hdl.handle.net/11104/0306716
     
  2. 2.
    0521756 - ÚPT 2020 SK eng A - Abstract
    Kasl, J. - Jandová, D. - Mikmeková, Šárka - Ambrož, Ondřej
    Characterization of microstructure of crept sapmles of dissimilar weld joint using standard and advanced electron microscopy techniques.
    Metallography & Fractography 2019. Abstract Booklet. Košice: Technická univerzita v Košiciach, 2019. s. 44. ISBN 978-80-553-3285-7.
    [Metallography & Fractography 2019. 24.04.2019-26.04.2019, Nový Smokovec]
    R&D Projects: GA TA ČR(CZ) TE01020118
    Institutional support: RVO:68081731
    Keywords : electron microscopy * microstructure * creep test * martensitic steels
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    OBOR OECD: Materials engineering
    Permanent Link: http://hdl.handle.net/11104/0306331
     
  3. 3.
    0519852 - ÚPT 2020 RS eng A - Abstract
    Müllerová, Ilona - Daniel, Benjamin - Konvalina, Ivo - Frank, Luděk - Materna-Mikmeková, Eliška
    Advanced techniques for low- and very-low energy SEM using reflected and transmitted signals.
    MCM 2019. 14th Multinational Congress on Microscopy. Proceedings. Belgrade: University of Belgrade, 2019. s. 98-99. ISBN 978-86-80335-11-7.
    [Multinational Congress on Microscopy /14./. 15.09.2019-20.09.2019, Belgrade]
    R&D Projects: GA TA ČR(CZ) TE01020118
    Institutional support: RVO:68081731
    Keywords : very-low energy electron microscopy * very-low energy electron microscopy
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    OBOR OECD: Electrical and electronic engineering
    Permanent Link: http://hdl.handle.net/11104/0304834
     
  4. 4.
    0510317 - ÚPT 2020 DE eng A - Abstract
    Zouhar, Martin - Daniel, Benjamin - Radlička, Tomáš - Oral, Martin - Konvalina, Ivo
    Simulation of optimal measurement setting and calibration of a novel time-offlight spectrometer.
    Microscopy Conference: MC 2019. Abstracts. Berlin: DSE, 2019. s. 603-604.
    [Microscopy Conference : MC 2019. 01.09.2019-05.09.2019, Berlin]
    R&D Projects: GA TA ČR(CZ) TN01000008; GA TA ČR(CZ) TE01020118
    Institutional support: RVO:68081731
    Keywords : measurement setting and calibration * novel time-offlight
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    OBOR OECD: Electrical and electronic engineering
    https://www.microscopy-conference.de
    Permanent Link: http://hdl.handle.net/11104/0300825
     
  5. 5.
    0510315 - ÚPT 2020 DE eng A - Abstract
    Daniel, Benjamin - Zouhar, Martin - Radlička, Tomáš - Piňos, Jakub - Materna-Mikmeková, Eliška - Konvalina, Ivo - Frank, Luděk - Müllerová, Ilona
    Very Low Energy Electron Transmission Spectro-Microscopy.
    Microscopy Conference: MC 2019. Abstracts. Berlin: DSE, 2019. s. 609-610.
    [Microscopy Conference : MC 2019. 01.09.2019-05.09.2019, Berlin]
    R&D Projects: GA TA ČR(CZ) TN01000008; GA TA ČR(CZ) TE01020118
    Institutional support: RVO:68081731
    Keywords : very low energy * electron transmission spectro-microscopy
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    OBOR OECD: Electrical and electronic engineering
    https://www.microscopy-conference.de
    Permanent Link: http://hdl.handle.net/11104/0300821
     
  6. 6.
    0505221 - ÚMCH 2020 CZ eng A - Abstract
    Krejčíková, Sabina - Hromádková, Jiřina - Fulín, P. - Jahoda, D. - Pokorný, D. - Šlouf, Miroslav
    Microscopic analysis and surface area calculation of model and in vivo UHMWPE wear particles.
    Microscopy 2019. Praha: Československá mikroskopická společnost, 2019. s. 79-80.
    [Microscopy 2019. 13.05.2019-15.05.2019, Lednice na Moravě]
    R&D Projects: GA MZd(CZ) NV15-31269A; GA TA ČR(CZ) TE01020118; GA TA ČR(CZ) TN01000008; GA MŠk(CZ) LO1507
    Institutional support: RVO:61389013
    Keywords : UHMWPE * wear particle * total hip arthroplasty
    Subject RIV: CD - Macromolecular Chemistry
    OBOR OECD: Polymer science
    Permanent Link: http://hdl.handle.net/11104/0296882
     
  7. 7.
    0505220 - ÚMCH 2020 CZ eng A - Abstract
    Hromádková, Jiřina - Stará, Hana - Sysel, P. - Novák, I. - Patáková, Z. - Šlouf, Miroslav
    Polymer composites in a modern SEM microscope: separating topographic and compositional contrast.
    Microscopy 2019. Praha: Československá mikroskopická společnost, 2019. s. 77-78.
    [Microscopy 2019. 13.05.2019-15.05.2019, Lednice na Moravě]
    R&D Projects: GA TA ČR(CZ) TE01020118; GA TA ČR(CZ) TN01000008; GA MŠk(CZ) LO1507
    Institutional support: RVO:61389013
    Keywords : SEM microscopy * polymer composites * SE imaging
    Subject RIV: CD - Macromolecular Chemistry
    OBOR OECD: Polymer science
    Permanent Link: http://hdl.handle.net/11104/0296881
     
  8. 8.
    0505219 - ÚMCH 2020 CZ eng A - Abstract
    Gajdošová, Veronika - Vlková, Helena - Hromádková, Jiřina - Krejčíková, Sabina - Piorkowska, E. - Vaněček, J. - Šlouf, Miroslav
    Micromechanical properties of polymers: detailed interpretation with the help of SEM and 3D-LM microscopy.
    Microscopy 2019. Praha: Československá mikroskopická společnost, 2019. s. 31-32.
    [Microscopy 2019. 13.05.2019-15.05.2019, Lednice na Moravě]
    R&D Projects: GA TA ČR(CZ) TE01020118; GA TA ČR(CZ) TN01000008; GA MŠk(CZ) LO1507
    Grant - others:AV ČR(CZ) PAN-17-18
    Program:Bilaterální spolupráce
    Institutional support: RVO:61389013
    Keywords : indentation hardness testing * synthetic polymers * creep
    Subject RIV: CD - Macromolecular Chemistry
    OBOR OECD: Polymer science
    Permanent Link: http://hdl.handle.net/11104/0296880
     
  9. 9.
    0505216 - ÚMCH 2020 CZ eng A - Abstract
    Šlouf, Miroslav - Gajdošová, Veronika - Hromádková, Jiřina - Vlčková, B. - Vohlídal, J. - Šloufová, I.
    Controlled tuning of AgNPs size distributions by THF: spectrophotometric and microscopic study.
    Microscopy 2019. Praha: Československá mikroskopická společnost, 2019. s. 75-76.
    [Microscopy 2019. 13.05.2019-15.05.2019, Lednice na Moravě]
    R&D Projects: GA ČR(CZ) GA17-05007S; GA TA ČR(CZ) TE01020118; GA TA ČR(CZ) TN01000008; GA MŠk(CZ) LO1507
    Institutional support: RVO:61389013
    Keywords : silver nanoparticles * controled size distribution * TEM microscopy
    Subject RIV: CD - Macromolecular Chemistry
    OBOR OECD: Polymer science
    Permanent Link: http://hdl.handle.net/11104/0296879
     
  10. 10.
    0502126 - ÚPT 2019 NL eng A - Abstract
    Konvalina, Ivo - Paták, Aleš - Materna-Mikmeková, Eliška - Müllerová, Ilona
    STEM detector in SEM.
    FEELIS-III. Amsterdam: ARCNL, 2018. s. 55-56.
    [LEELIS-III. Low Energy Elwctrons: Lithography, Imaging and Soft Matter. 12.11.2018-13.11.2018, Amsterdam]
    R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠk(CZ) LO1212; GA MŠk ED0017/01/01
    Institutional support: RVO:68081731
    Keywords : STEM * SEM
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    OBOR OECD: Electrical and electronic engineering
    Permanent Link: http://hdl.handle.net/11104/0294115