Search results
- 1.0387384 - ÚPT 2013 RIV CZ eng C - Conference Paper (international conference)
Mikmeková, Šárka - Mrňa, Libor - Mikmeková, Eliška - Müllerová, Ilona - Frank, Luděk
Examination of metals and alloys with slow and very slow electrons.
METAL 2012 Conference Proceedings. 21st International Conference on Metallurgy and Materials. Ostrava: TANGER Ltd, 2012. ISBN 978-80-87294-29-1.
[METAL 2012. International Conference on Metallurgy and Materials /21./. Brno (CZ), 23.05.2012-25.05.2012]
R&D Projects: GA MPO FR-TI3/323; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : scanning low energy electron microscopy * microstructure characterization * chemical composition analysis * residual stress
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0216605 - 2.0379933 - ÚPT 2012 RIV CZ eng C - Conference Paper (international conference)
Müllerová, Ilona - Konvalina, Ivo - Mika, Filip
Collection contrast in the immersion objective lens of the scanning electron microscope.
Proceedings of the 13th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2012 - (Mika, F.), -, -, s. 49-50. ISBN 978-80-87441-07-7.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /13./. Skalský dvůr (CZ), 25.06.2012-29.06.2012]
R&D Projects: GA MPO FR-TI3/323
Institutional support: RVO:68081731
Keywords : scanning electron microscope * cathode lens * secondary electrons * backscattered electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0210780 - 3.0379917 - ÚPT 2012 RIV AU eng C - Conference Paper (international conference)
Hovorka, Miloš - Müllerová, Ilona - Frank, Luděk
Very Low Energy STEM and Imaging of Free-standing Foils.
Coneference Proceedings APMC-10, ICONN 2012 and ACMM-22. Wembley: EECW Pty Ltd, 2012, 411:1-2. ISBN 978-1-74052-245-8.
[Asia-Pacific Microscopy Conference (APMC-10) - International Conference on Nanoscience and Nanotechnology (ICONN 2012) - Australian Conference on Microscopy and Microanalysis (ACMM-22). Perth (AU), 05.02.2012-09.02.2012]
R&D Projects: GA MPO FR-TI3/323
Institutional support: RVO:68081731
Keywords : scanning low energy electron microscopy * cathode lens * transmitted electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0210768 - 4.0379916 - ÚPT 2012 RIV AU eng C - Conference Paper (international conference)
Müllerová, Ilona - Konvalina, Ivo - Hovorka, Miloš - Mika, Filip
Approaches to the Collection Contrast in the Immersion Objective Lens of the Scanning Electron Microscope.
Coneference Proceedings APMC-10, ICONN 2012 and ACMM-22. Wembley: EECW Pty Ltd, 2012, 410:1-2. ISBN 978-1-74052-245-8.
[Asia-Pacific Microscopy Conference (APMC-10) - International Conference on Nanoscience and Nanotechnology (ICONN 2012) - Australian Conference on Microscopy and Microanalysis (ACMM-22). Perth (AU), 05.02.2012-09.02.2012]
R&D Projects: GA MPO FR-TI3/323
Institutional support: RVO:68081731
Keywords : scanning electron microscopy * cathode lens * secondary electrons * backscattered electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0210767 - 5.0379915 - ÚPT 2012 RIV AU eng C - Conference Paper (international conference)
Müllerová, Ilona - Mikmeková, Šárka - Matsuda, K. - Mikmeková, Eliška - Ikeno, S. - Shiojiri, M.
SLEEM and its Applications in Material Research.
Coneference Proceedings APMC-10, ICONN 2012 and ACMM-22. Wembley: EECW Pty Ltd, 2012, 409: 1-2. ISBN 978-1-74052-245-8.
[Asia-Pacific Microscopy Conference (APMC-10) - International Conference on Nanoscience and Nanotechnology (ICONN 2012) - Australian Conference on Microscopy and Microanalysis (ACMM-22). Perth (AU), 05.02.2012-09.02.2012]
R&D Projects: GA MPO FR-TI3/323; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : scanning low energy electron microscopy * cathode lens
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0210766