Search results
- 1.0398028 - ÚPT 2014 RIV US eng J - Journal Article
Frank, Luděk - Mikmeková, Šárka - Pokorná, Zuzana - Müllerová, Ilona
Scanning Electron Microscopy With Slow Electrons.
Microscopy and Microanalysis. Roč. 19, S2 (2013), s. 372-373. ISSN 1431-9276. E-ISSN 1435-8115
R&D Projects: GA ČR GAP108/11/2270; GA TA ČR TE01020118
Institutional support: RVO:68081731
Keywords : Scanning Electron Microscopy * Slow Electrons * Grain Contrast * Contrast of the Density of States * Angle-resolved BSE
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 2.161, year: 2013
Permanent Link: http://hdl.handle.net/11104/0225603 - 2.0397636 - ÚPT 2014 RIV NL eng J - Journal Article
Mikmeková, Šárka - Mašek, B. - Jirková, H. - Aišman, D. - Müllerová, Ilona - Frank, Luděk
Microstructure of X210Cr12 steel after the forming in semi-solid state visualized by very low energy SEM in ultra high vacuum.
Applied Surface Science. Roč. 275, 15 June (2013), s. 403-408. ISSN 0169-4332. E-ISSN 1873-5584
R&D Projects: GA ČR GAP108/11/2270
Institutional support: RVO:68081731
Keywords : Very low energy SEM * Crystallographic contrast * Strain mapping * Semi-solid state processing
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 2.538, year: 2013
Permanent Link: http://hdl.handle.net/11104/0225250 - 3.0395127 - ÚPT 2014 RIV GB eng J - Journal Article
Mikmeková, Eliška - Bouyanfif, H. - Lejeune, M. - Müllerová, Ilona - Hovorka, Miloš - Unčovský, M. - Frank, Luděk
Very low energy electron microscopy of graphene flakes.
Journal of Microscopy. Roč. 251, č. 2 (2013), s. 123-127. ISSN 0022-2720. E-ISSN 1365-2818
R&D Projects: GA ČR GAP108/11/2270; GA TA ČR TE01020118; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : graphene * very low energy STEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 2.150, year: 2013
Permanent Link: http://hdl.handle.net/11104/0225233 - 4.0385193 - ÚPT 2013 RIV CH eng J - Journal Article
Frank, Luděk - Hovorka, Miloš - Mikmeková, Šárka - Mikmeková, Eliška - Müllerová, Ilona - Pokorná, Zuzana
Scanning Electron Microscopy with Samples in an Electric Field.
Materials. Roč. 5, č. 12 (2012), s. 2731-2756. E-ISSN 1996-1944
R&D Projects: GA ČR GAP108/11/2270; GA TA ČR TE01020118; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : scanning electron microscopy * slow electrons * low energy SEM * low energy STEM * cathode lens
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 2.247, year: 2012
Permanent Link: http://hdl.handle.net/11104/0214527 - 5.0384097 - ÚPT 2013 RIV US eng J - Journal Article
Pokorná, Zuzana - Mikmeková, Šárka - Müllerová, Ilona - Frank, Luděk
Characterization of the local crystallinity via reflectance of very slow electrons.
Applied Physics Letters. Roč. 100, č. 26 (2012), 261602:1-4. ISSN 0003-6951. E-ISSN 1077-3118
R&D Projects: GA ČR GAP108/11/2270; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : very slow electrons * crystal system * electron backscatter diffraction analyses
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 3.794, year: 2012
Permanent Link: http://hdl.handle.net/11104/0213844