Search results
- 1.0421042 - ÚPT 2014 CN eng C - Conference Paper (international conference)
Bok, Jan - Schauer, Petr
Two-state model for cathodoluminiscence kinetics of YAG:Ce single-crystal scintillators.
Proceedings of the 12th International Conference on Inorganic Scintillators and Their Applications. Shanghai: Shaghai Institute of Ceramic, CAS, 2013, s. 18.
[SCINT 2013. International Conference on Inorganic Scintillators and Their Applications /12./. Shanghai (CN), 15.04.2013-19.04.2013]
R&D Projects: GA TA ČR TE01020118; GA ČR GAP102/10/1410; GA MŠMT EE.2.3.20.0103
Institutional support: RVO:68081731
Keywords : scintillator * YAG:Ce * cathodoluminiscence
Subject RIV: BH - Optics, Masers, Lasers
Permanent Link: http://hdl.handle.net/11104/0227465 - 2.0390639 - ÚPT 2013 RIV TH eng C - Conference Paper (international conference)
Neděla, Vilém - Tihlaříková, Eva - Makoto, S.
New Environmental Scanning Electron Microscopy and Observation of Live Nature.
MST30 2013. Proceedings of the 30th Annual Conference of the Microscopy Society of Thailand. Chanthaburi: Microscopy Society of Thailand, 2013, s. 19-20. ISBN 978-974-7533-16-3.
[MST30 2013. The 30th Annual Conference of the Microscopy Society of Thailand. Chanthaburi (TH), 23.01.2013-25.01.2013]
R&D Projects: GA ČR GAP102/10/1410; GA MŠMT EE.2.3.20.0103
Institutional support: RVO:68081731
Keywords : Environmental Scanning Electron Microscopy * Observation of Live Nature
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0219660 - 3.0386399 - ÚPT 2013 RIV CZ eng C - Conference Paper (international conference)
Schauer, Petr - Bok, Jan
Current state and prospects of scintillation materials for detectors in SEM.
Proceedings of the 13th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2012 - (Mika, F.), s. 67-68. ISBN 978-80-87441-07-7.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /13./. Skalský dvůr (CZ), 25.06.2012-29.06.2012]
R&D Projects: GA ČR GAP102/10/1410; GA MŠMT EE.2.3.20.0103
Institutional support: RVO:68081731
Keywords : SEM * scintillation materials
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0215698 - 4.0386386 - ÚPT 2013 RIV CZ eng C - Conference Paper (international conference)
Bok, Jan - Schauer, Petr
Quality assessment of scintillation detector in SEM using MFT.
Proceedings of the 13th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2012 - (Mika, F.), s. 9-10. ISBN 978-80-87441-07-7.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /13./. Skalský dvůr (CZ), 25.06.2012-29.06.2012]
R&D Projects: GA ČR GAP102/10/1410; GA MŠMT EE.2.3.20.0103
Institutional support: RVO:68081731
Keywords : scintillation detector in SEM * modulation transfer function * e-beam scanning speed
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0215685 - 5.0379919 - ÚPT 2013 RIV AU eng C - Conference Paper (international conference)
Neděla, Vilém - Konvalina, Ivo - Lencová, B. - Zlámal, J. - Jirák, J.
New detection systems of secondary and backscattered electrons for environmental scanning electron microscopes.
Coneference Proceedings APMC-10, ICONN 2012 and ACMM-22. Wembley: EECW Pty Ltd, 2012, 370:1-2. ISBN 978-1-74052-245-8.
[Asia-Pacific Microscopy Conference (APMC-10) - International Conference on Nanoscience and Nanotechnology (ICONN 2012) - Australian Conference on Microscopy and Microanalysis (ACMM-22). Perth (AU), 05.02.2012-09.02.2012]
R&D Projects: GA ČR GAP102/10/1410; GA MŠMT EE.2.3.20.0103
Institutional support: RVO:68081731
Keywords : environmental scanning electron microscope * detection systems * secondary electrons * backscattered electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0210770 - 6.0367234 - ÚPT 2012 IT eng C - Conference Paper (international conference)
Flodrová, Eva - Neděla, Vilém - Sedláčková, M. - Hampl, A.
Human embryonic stem cells preparation for scanning electron microscopy.
Proceedings of the 10th Multinational Congress on Microscopy 2011. Urbino: SISM, 2011, s. 105-106.
[Multinational Congress on Microscopy 2011 /10./ - MCM 2011. Urbino (IT), 04.09.2011-09.09.2011]
R&D Projects: GA ČR GAP102/10/1410; GA MŠMT ED0017/01/01
Institutional research plan: CEZ:AV0Z20650511
Keywords : embryonic stem cell * tissue preparation * scanning electron microscope
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0201980 - 7.0367160 - ÚPT 2012 IT eng C - Conference Paper (international conference)
Neděla, Vilém - Hřib, J. - Runštuk, Jiří
Native conifer embryogenic tissues studied using the environmental scanning electron microscope.
Proceedings of the 10th Multinational Congress on Microscopy 2011. Urbino: SISM, 2011, s. 135-136.
[Multinational Congress on Microscopy 2011 /10./ - MCM 2011. Urbino (IT), 04.09.2011-09.09.2011]
R&D Projects: GA ČR GAP102/10/1410; GA MŠMT ED0017/01/01
Institutional research plan: CEZ:AV0Z20650511
Keywords : AQUASEM II * BSE-YAG detector * ionization detector, early somatic * , early somatic embryogenesis
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0201922 - 8.0367106 - ÚPT 2012 IT eng C - Conference Paper (international conference)
Bok, Jan - Schauer, Petr
Afterglow of YAG:Ce single crystal scintillators for S(T)EM electron detectors.
Proceedings of the 10th Multinational Congress on Microscopy 2011. Urbino: SISM, 2011, s. 61-62.
[Multinational Congress on Microscopy 2011 /10./ - MCM 2011. Urbino (IT), 04.09.2011-09.09.2011]
R&D Projects: GA ČR GAP102/10/1410; GA MŠMT ED0017/01/01
Institutional research plan: CEZ:AV0Z20650511
Keywords : electron detection * scintillator * YAG:Ce * afterglow * time response
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0201885 - 9.0353046 - ÚPT 2011 RIV BR eng C - Conference Paper (international conference)
Jirák, J. - Čudek, P. - Neděla, Vilém
Detection of Secondary Electrons by Scintillation Detector in Variable Pressure Scanning Electron Microscopes.
Proceedings of the 17th IFSM International Microscopy Congress. Rio de Janeiro: Sociedade Brasileira de Microscopia e Microanilise, 2010, I10.14: 1-2. ISBN 978-85-63273-06-2.
[International Microscopy Congress (IMC17) /17./. Rio de Janeiro (BR), 19.09.2010-24.09.2010]
R&D Projects: GA ČR GAP102/10/1410
Institutional research plan: CEZ:AV0Z20650511
Keywords : VPSEM * scintillation detector
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0192396 - 10.0353039 - ÚPT 2011 RIV BR eng C - Conference Paper (international conference)
Neděla, Vilém - Jirák, J.
Newly Designed Ionisation Secondary Electron Detector with Electrostatic Separators for VP-ESEM.
Proceedings of the 17th IFSM International Microscopy Congress. Rio de Janeiro: Sociedade Brasileira de Microscopia e Microanilise, 2010, I10.9: 1-2. ISBN 978-85-63273-06-2.
[International Microscopy Congress (IMC17) /17./. Rio de Janeiro (BR), 19.09.2010-24.09.2010]
R&D Projects: GA ČR GAP102/10/1410
Institutional research plan: CEZ:AV0Z20650511
Keywords : ISEDS * VPSEM * ESEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0192389