Search results

  1. 1.
    0384092 - ÚPT 2013 RIV US eng J - Journal Article
    Flodrová, Eva - Neděla, Vilém - Hampl, A. - Sedláčková, M.
    Comparative Study Of Human Embryonic Stem Cell Surface Structure Using SEM And ESEM.
    Microscopy and Microanalysis. Roč. 18, Suppl. 2 (2012), s. 1268-1269. ISSN 1431-9276. E-ISSN 1435-8115
    R&D Projects: GA ČR GAP102/10/1410; GA MPO FR-TI1/305; GA MPO FR-TI1/118; GA MŠMT EE.2.3.20.0103
    Institutional support: RVO:68081731
    Keywords : human embryonic stem cells * environmental scanning electron microscopy
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Impact factor: 2.495, year: 2012
    Permanent Link: http://hdl.handle.net/11104/0213841
     
     
  2. 2.
    0384090 - ÚPT 2013 RIV US eng J - Journal Article
    Neděla, Vilém - Hřib, J. - Svidenská, S. - Vooková, B. - Runštuk, Jiří
    Environmental Scanning Electron Microscope As A Tool For Imaging Of Native State Somatic Embryogenesis.
    Microscopy and Microanalysis. Roč. 18, Suppl. 2 (2012), s. 1270-1271. ISSN 1431-9276. E-ISSN 1435-8115
    R&D Projects: GA ČR GAP102/10/1410; GA MPO FR-TI1/305; GA MPO FR-TI1/118; GA MŠMT EE.2.3.20.0103
    Institutional support: RVO:68081731
    Keywords : environmental scanning electron microscopy * somatic embryogenesis
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Impact factor: 2.495, year: 2012
    Permanent Link: http://hdl.handle.net/11104/0217617
     
     
  3. 3.
    0358591 - ÚPT 2012 RIV NL eng J - Journal Article
    Neděla, Vilém - Konvalina, Ivo - Lencová, Bohumila - Zlámal, J.
    Comparison of calculated, simulated and measured signal amplification in variable pressure SEM.
    Nuclear Instruments & Methods in Physics Research Section A. Roč. 645, č. 1 (2011), s. 79-83. ISSN 0168-9002. E-ISSN 1872-9576
    R&D Projects: GA ČR GAP102/10/1410; GA MPO FR-TI1/118; GA MPO FR-TI1/305
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : electron-gas interactions * Monte Carlo simulations * signal amplification * analytical models
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Impact factor: 1.207, year: 2011
    Permanent Link: http://hdl.handle.net/11104/0196577
     
     


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