Search results
- 1.0574279 - ÚPT 2024 RIV NL eng J - Journal Article
Průcha, Lukáš - Lejeune, M. - Kizovský, Martin - Materna Mikmeková, Eliška
In-situ thermal Raman spectroscopy of single-layer graphene on different substrates.
Materials Today Communications. Roč. 35, June (2023), č. článku 105921. ISSN 2352-4928. E-ISSN 2352-4928
R&D Projects: GA ČR(CZ) GA22-34286S
Institutional support: RVO:68081731
Keywords : Graphene * Raman spectroscopy * Thermal measurements * Graphene decomposition * Thermal decomposition
OECD category: Atomic, molecular and chemical physics (physics of atoms and molecules including collision, interaction with radiation, magnetic resonances, Mössbauer effect)
Impact factor: 3.8, year: 2022
Method of publishing: Limited access
https://www.sciencedirect.com/science/article/pii/S2352492823006128
Permanent Link: https://hdl.handle.net/11104/0344614 - 2.0558867 - ÚPT 2023 RIV US eng J - Journal Article
Tang, C. - Thomas, B. - Ramirez-Hernandez, M. - Materna Mikmeková, Eliška - Asefa, T.
Metal-Functionalized Hydrogels as Efficient Oxygen Evolution Electrocatalysts.
ACS Applied Materials and Interfaces. Roč. 14, č. 18 (2022), s. 20919-20929. ISSN 1944-8244. E-ISSN 1944-8252
Institutional support: RVO:68081731
Keywords : hydrogel * conducting polymer * oxygen evolution reaction * phytic acid * polyaniline
OECD category: Electrical and electronic engineering
Impact factor: 9.5, year: 2022
Method of publishing: Limited access
https://pubs.acs.org/doi/10.1021/acsami.2c01667
Permanent Link: https://hdl.handle.net/11104/0333399 - 3.0551125 - ÚPT 2023 RIV CH eng J - Journal Article
Konvalina, Ivo - Paták, Aleš - Zouhar, Martin - Müllerová, Ilona - Fořt, Tomáš - Unčovský, M. - Materna Mikmeková, Eliška
Quantification of stem images in high resolution sem for segmented and pixelated detectors.
Nanomaterials. Roč. 12, č. 1 (2022), č. článku 71. E-ISSN 2079-4991
R&D Projects: GA TA ČR(CZ) TN01000008
Grant - others:AV ČR(CZ) StrategieAV21/6
Program: StrategieAV
Institutional support: RVO:68081731
Keywords : STEM segmented detector * pixelated detector * scanning electron microscopy * Monte Carlo simulations * ray tracing * quantitative imaging
OECD category: Electrical and electronic engineering
Impact factor: 5.3, year: 2022
Method of publishing: Open access
https://www.mdpi.com/2079-4991/12/1/71
Permanent Link: http://hdl.handle.net/11104/0326569 - 4.0546409 - ÚPT 2022 RIV CH eng J - Journal Article
Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Müllerová, Ilona - Frank, Luděk - Piňos, Jakub - Průcha, Lukáš - Radlička, Tomáš - Werner, W. S. M. - Mikmeková, Eliška
Low-energy electron inelastic mean free path of graphene measured by a time-of-flight spectrometer.
Nanomaterials. Roč. 11, č. 9 (2021), č. článku 2435. E-ISSN 2079-4991
R&D Projects: GA TA ČR(CZ) TN01000008
Grant - others:AV ČR(CZ) StrategieAV21/6
Program: StrategieAV
Institutional support: RVO:68081731
Keywords : time-of-flight spectrometer * inelastic mean free path * density-functional theory * many-body perturbation theory * energy-loss spectrum * density of states * band structure * graphene
OECD category: Electrical and electronic engineering
Impact factor: 5.719, year: 2021
Method of publishing: Open access
https://www.mdpi.com/2079-4991/11/9/2435
Permanent Link: http://hdl.handle.net/11104/0322930
Research data: Zenodo - 5.0544223 - ÚPT 2022 RIV US eng J - Journal Article
Ma, Haili - Mikmeková, Šárka - Konvalina, Ivo - Yin, X. - Sun, F. - Piňos, Jakub - Vaškovicová, Naděžda - Průcha, Lukáš - Müllerová, Ilona - Mikmeková, Eliška - Chen, D.
Imaging ferroelectric nanodomains in strained BiFeO3 nanoscale films using scanning low-energy electron microscopy: Implications for low-power devices.
ACS Applied Nano Materials. Roč. 4, č. 4 (2021), s. 3725-3733. ISSN 2574-0970
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : scanning low-energy electron microscopy (SLEEM) * BiFeO3 nanoscale films * ferroelectric nanodomains * low-loss backscattered electrons * multiferroic
OECD category: Electrical and electronic engineering
Impact factor: 6.140, year: 2021
Method of publishing: Limited access
https://pubs.acs.org/doi/10.1021/acsanm.1c00204
Permanent Link: http://hdl.handle.net/11104/0321265 - 6.0536755 - ÚPT 2021 RIV US eng J - Journal Article
Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Piňos, Jakub - Radlička, Tomáš - Frank, Luděk - Müllerová, Ilona - Materna Mikmeková, Eliška
Very Low Energy Electron Transmission Spectroscopy of 2D Materials.
Microscopy and Microanalysis. Roč. 26, S2 (2020), s. 2636-2638. ISSN 1431-9276. E-ISSN 1435-8115
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : spectroscopy * very low energy electron transmission * 2D materials
OECD category: Electrical and electronic engineering
Impact factor: 4.127, year: 2020
Method of publishing: Open access
https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/very-low-energy-electron-transmission-spectroscopy-of-2d-materials/2F6DF5F745E2CCA1AFA45F451D68BD41
Permanent Link: http://hdl.handle.net/11104/0314644 - 7.0532408 - ÚPT 2021 RIV GB eng J - Journal Article
Pérez-Pacheco, A. - García, E. - Calderón-Olvera, R. M. - Muhl, S. - Camps, E. - Lejeune, M. - Mikmeková, Eliška
Nanocomposite films of a-C:H/Bi made using a toroidal planar hollow cathode.
FlatChem. Roč. 20, MAR (2020), č. článku 100160. ISSN 2452-2627. E-ISSN 2452-2627
Institutional support: RVO:68081731
Keywords : hollow cathode * nanoparticles * amorphous carbon * bismuth
OECD category: Coating and films
Impact factor: 5.227, year: 2020
Method of publishing: Limited access
https://www.sciencedirect.com/science/article/abs/pii/S245226272030009X
Permanent Link: http://hdl.handle.net/11104/0310909 - 8.0532376 - ÚPT 2021 RIV DE eng J - Journal Article
Zhang, T. - Low, J. - Yu, J. - Tyryshkin, A.M. - Mikmeková, Eliška - Asefa, T.
A Blinking Mesoporous TiO(2-x)Composed of Nanosized Anatase with Unusually Long-Lived Trapped Charge Carriers.
Angewandte Chemie - International Edition. Roč. 59, č. 35 (2020), s. 15000-15007. ISSN 1433-7851. E-ISSN 1521-3773
Institutional support: RVO:68081731
Keywords : electron-paramagnetic-res * nanostructured materials * photocatalytic activity * oxygen vacancy * doped tio2 * nanoparticles * nanomaterials
OECD category: Electrochemistry (dry cells, batteries, fuel cells, corrosion metals, electrolysis)
Impact factor: 15.336, year: 2020
Method of publishing: Limited access
https://onlinelibrary.wiley.com/doi/abs/10.1002/anie.202005143
Permanent Link: http://hdl.handle.net/11104/0310878 - 9.0525529 - ÚPT 2021 RIV NL eng J - Journal Article
Materna Mikmeková, Eliška - Müllerová, Ilona - Frank, Luděk - Paták, Aleš - Polčák, J. - Sluyterman, S. - Lejeune, M. - Konvalina, Ivo
Low-energy electron microscopy of graphene outside UHV: electron-induced removal of PMMA residues used for graphene transfer.
Journal of Electron Spectroscopy and Related Phenomena. Roč. 241, MAY (2020), č. článku 146873. ISSN 0368-2048. E-ISSN 1873-2526
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
EU Projects: European Commission(XE) 606988 - SIMDALEE2
Institutional support: RVO:68081731
Keywords : graphene * PMMA * slow electron treatment * XPS * Raman spectroscopy
OECD category: Electrical and electronic engineering
Impact factor: 1.957, year: 2020
Method of publishing: Open access
https://www.sciencedirect.com/science/article/pii/S0368204818302068
Permanent Link: http://hdl.handle.net/11104/0309642 - 10.0525062 - ÚPT 2021 RIV NL eng J - Journal Article
Frank, Luděk - Hovorka, Miloš - El Gomati, M. M. - Müllerová, Ilona - Mika, Filip - Mikmeková, Eliška
Acquisition of the dopant contrast in semiconductors with slow electrons.
Journal of Electron Spectroscopy and Related Phenomena. Roč. 241, MAY (2020), č. článku 146836. ISSN 0368-2048. E-ISSN 1873-2526
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
EU Projects: European Commission(XE) 606988 - SIMDALEE2
Institutional support: RVO:68081731
Keywords : semiconductors * dopant contrast * low energy SEM * PEEM * mirror electron microscopy * surface treatments
OECD category: Electrical and electronic engineering
Impact factor: 1.957, year: 2020
Method of publishing: Open access
https://www.sciencedirect.com/science/article/pii/S036820481830135X
Permanent Link: http://hdl.handle.net/11104/0309284