Search results
- 1.0507132 - ÚPT 2020 RIV CZ eng C - Conference Paper (international conference)
Frank, Luděk - Nebesářová, Jana - Vancová, Marie - Paták, Aleš - Mikmeková, Eliška - Müllerová, Ilona
Transmission of very slow electrons as a diagnostic tool.
NANOCON 2013 - 5th International Conference Proceedings. Ostrava: TANGER Ltd, 2014, s. 503-508. ISBN 978-80-87294-47-5.
[International Conference NANOCON 2013 /5./. Brno (CZ), 16.10.2013-18.10.2013]
R&D Projects: GA ČR GAP108/11/2270; GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731 ; RVO:60077344
Keywords : electron microscopy * slow electrons * STEM * graphene * ultrathin tissue sections
OECD category: Nano-materials (production and properties); Civil engineering (BC-A)
Permanent Link: http://hdl.handle.net/11104/0298349 - 2.0494371 - ÚPT 2019 RIV CZ eng C - Conference Paper (international conference)
Průcha, Lukáš - Daniel, Benjamin - Piňos, Jakub - Mikmeková, Eliška
Thermal desorption spectroscopy in prototype furnace for chemical vapor deposition.
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 60-61. ISBN 978-80-87441-23-7.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : thermal desorption spectroscopy * CVD * surface cleaning * silicon
OECD category: Electrical and electronic engineering
Permanent Link: http://hdl.handle.net/11104/0287627 - 3.0494365 - ÚPT 2019 RIV CZ eng C - Conference Paper (international conference)
Konvalina, Ivo - Paták, Aleš - Mikmeková, Eliška - Mika, Filip - Müllerová, Ilona
STEM modes in SEM.
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 40-41. ISBN 978-80-87441-23-7.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : SEM * STEM
OECD category: Electrical and electronic engineering
Permanent Link: http://hdl.handle.net/11104/0287599 - 4.0481591 - ÚPT 2018 RIV HR eng C - Conference Paper (international conference)
Mikmeková, Eliška - Frank, Luděk - Polčák, J. - Paták, Aleš - Lejeune, M.
Examination of 2D crystals in a low voltage SEM/STEM.
13th Multinational Congress on Microscopy: Book of Abstracts. Zagreb: Ruder Bošković Institute, Croatian Microscopy Society, 2017 - (Gajović, A.; Weber, I.; Kovačević, G.; Čadež, V.; Šegota, S.; Peharec Štefanić, P.; Vidoš, A.), s. 618-619. ISBN 978-953-7941-19-2.
[Multinational Congress on Microscopy /13./. Rovinj (HR), 24.09.2017-29.09.2017]
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731
Keywords : low voltage SEM/STEM * 2D crystals * contamination
OECD category: Coating and films
Permanent Link: http://hdl.handle.net/11104/0277164 - 5.0467260 - ÚPT 2017 JP eng C - Conference Paper (international conference)
Müllerová, Ilona - Mikmeková, Eliška - Mikmeková, Šárka - Pokorná, Zuzana - Frank, Luděk
Reflected and transmitted mode in the scanning low energy electron microscope.
2nd Forum of Center for ADvanced Materials Research and International Collaboration (CAMRIC-FORUM2). Toyama: University of Toyama, 2016, s. 29-30.
[Forum of Center for ADvanced Materials Research and International Collaboration /2./ (CAMRIC-FORUM2). Toyama (JP), 13.10.2016-14.10.2016]
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731
Keywords : SLEEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0265401 - 6.0460206 - ÚPT 2017 RIV CZ eng C - Conference Paper (international conference)
Müllerová, Ilona - Mikmeková, Eliška - Konvalina, Ivo - Frank, Luděk
Scanning transmission microscopy at very low energies.
Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016 - (Mika, F.), s. 40-41. ISBN 978-80-87441-17-6.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./. Skalský dvůr (CZ), 29.05.2016-03.06.2016]
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212
Institutional support: RVO:68081731
Keywords : electron microscopy * SEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://www.trends.isibrno.cz/
Permanent Link: http://hdl.handle.net/11104/0260338 - 7.0460200 - ÚPT 2017 RIV CZ eng C - Conference Paper (international conference)
Frank, Luděk - Mikmeková, Eliška
Treatment of surfaces with slow electrons.
Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016 - (Mika, F.), s. 10-11. ISBN 978-80-87441-17-6.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./. Skalský dvůr (CZ), 29.05.2016-03.06.2016]
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : electron microscopy * SEM * STEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://www.trends.isibrno.cz/
Permanent Link: http://hdl.handle.net/11104/0260332 - 8.0450825 - ÚPT 2016 RIV HU eng C - Conference Paper (international conference)
Frank, Luděk - Mikmeková, Eliška
Graphene examined with very slow electrons.
12th Multinational Congress on Microscopy. Budapest: Akadémiai Kiadó, 2015, s. 182-183. ISBN 978-963-05-9653-4.
[MCM 2015. Multinational Congress on Microscopy /12./. Eger (HU), 23.08.2015-28.08.2015]
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731
Keywords : graphene * 2D crystals * ultra-low-energy STEM * ultra-low-energy SEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0252038 - 9.0450822 - ÚPT 2016 RIV HU eng C - Conference Paper (international conference)
Pokorná, Zuzana - Frank, Luděk - Knápek, Alexandr - Konvalina, Ivo - Mikmeková, Eliška - Mikmeková, Šárka - Walker, Christopher - Müllerová, Ilona
Scanning low-and very low energy electron microscopy.
12th Multinational Congress on Microscopy. Budapest: Akadémiai Kiadó, 2015, s. 218-220. ISBN 978-963-05-9653-4.
[MCM 2015. Multinational Congress on Microscopy /12./. Eger (HU), 23.08.2015-28.08.2015]
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731
Keywords : very low energy * scanning low energy electron microscopy * crystallography, graphene * tissue sections
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0252034 - 10.0437839 - ÚPT 2015 RIV CZ eng C - Conference Paper (international conference)
Mikmeková, Eliška - Frank, Luděk
Examination of Graphene with Very Slow Electrons.
NANOCON 2014. 6th International conference proceedings. Ostrava: TANGER, 2014. ISBN 978-80-87294-55-0.
[NANOCON 2014. International Conference /6./. Brno (CZ), 05.11.2014-07.11.2014]
R&D Projects: GA TA ČR TE01020118; GA MŠMT(CZ) LO1212
Institutional support: RVO:68081731
Keywords : graphene * slow electrons * very low energy scanning electron microscopy * ultralow energy STEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0241324