Search results

  1. 1.
    0507132 - ÚPT 2020 RIV CZ eng C - Conference Paper (international conference)
    Frank, Luděk - Nebesářová, Jana - Vancová, Marie - Paták, Aleš - Mikmeková, Eliška - Müllerová, Ilona
    Transmission of very slow electrons as a diagnostic tool.
    NANOCON 2013 - 5th International Conference Proceedings. Ostrava: TANGER Ltd, 2014, s. 503-508. ISBN 978-80-87294-47-5.
    [International Conference NANOCON 2013 /5./. Brno (CZ), 16.10.2013-18.10.2013]
    R&D Projects: GA ČR GAP108/11/2270; GA TA ČR(CZ) TE01020118
    Institutional support: RVO:68081731 ; RVO:60077344
    Keywords : electron microscopy * slow electrons * STEM * graphene * ultrathin tissue sections
    OECD category: Nano-materials (production and properties); Civil engineering (BC-A)
    Permanent Link: http://hdl.handle.net/11104/0298349
     
     
  2. 2.
    0494371 - ÚPT 2019 RIV CZ eng C - Conference Paper (international conference)
    Průcha, Lukáš - Daniel, Benjamin - Piňos, Jakub - Mikmeková, Eliška
    Thermal desorption spectroscopy in prototype furnace for chemical vapor deposition.
    Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 60-61. ISBN 978-80-87441-23-7.
    [Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
    R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
    Institutional support: RVO:68081731
    Keywords : thermal desorption spectroscopy * CVD * surface cleaning * silicon
    OECD category: Electrical and electronic engineering
    Permanent Link: http://hdl.handle.net/11104/0287627
     
     
  3. 3.
    0494365 - ÚPT 2019 RIV CZ eng C - Conference Paper (international conference)
    Konvalina, Ivo - Paták, Aleš - Mikmeková, Eliška - Mika, Filip - Müllerová, Ilona
    STEM modes in SEM.
    Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 40-41. ISBN 978-80-87441-23-7.
    [Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
    R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
    Institutional support: RVO:68081731
    Keywords : SEM * STEM
    OECD category: Electrical and electronic engineering
    Permanent Link: http://hdl.handle.net/11104/0287599
     
     
  4. 4.
    0481591 - ÚPT 2018 RIV HR eng C - Conference Paper (international conference)
    Mikmeková, Eliška - Frank, Luděk - Polčák, J. - Paták, Aleš - Lejeune, M.
    Examination of 2D crystals in a low voltage SEM/STEM.
    13th Multinational Congress on Microscopy: Book of Abstracts. Zagreb: Ruder Bošković Institute, Croatian Microscopy Society, 2017 - (Gajović, A.; Weber, I.; Kovačević, G.; Čadež, V.; Šegota, S.; Peharec Štefanić, P.; Vidoš, A.), s. 618-619. ISBN 978-953-7941-19-2.
    [Multinational Congress on Microscopy /13./. Rovinj (HR), 24.09.2017-29.09.2017]
    R&D Projects: GA TA ČR(CZ) TE01020118
    Institutional support: RVO:68081731
    Keywords : low voltage SEM/STEM * 2D crystals * contamination
    OECD category: Coating and films
    Permanent Link: http://hdl.handle.net/11104/0277164
     
     
  5. 5.
    0467260 - ÚPT 2017 JP eng C - Conference Paper (international conference)
    Müllerová, Ilona - Mikmeková, Eliška - Mikmeková, Šárka - Pokorná, Zuzana - Frank, Luděk
    Reflected and transmitted mode in the scanning low energy electron microscope.
    2nd Forum of Center for ADvanced Materials Research and International Collaboration (CAMRIC-FORUM2). Toyama: University of Toyama, 2016, s. 29-30.
    [Forum of Center for ADvanced Materials Research and International Collaboration /2./ (CAMRIC-FORUM2). Toyama (JP), 13.10.2016-14.10.2016]
    R&D Projects: GA TA ČR(CZ) TE01020118
    Institutional support: RVO:68081731
    Keywords : SLEEM
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0265401
     
     
  6. 6.
    0460206 - ÚPT 2017 RIV CZ eng C - Conference Paper (international conference)
    Müllerová, Ilona - Mikmeková, Eliška - Konvalina, Ivo - Frank, Luděk
    Scanning transmission microscopy at very low energies.
    Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016 - (Mika, F.), s. 40-41. ISBN 978-80-87441-17-6.
    [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./. Skalský dvůr (CZ), 29.05.2016-03.06.2016]
    R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212
    Institutional support: RVO:68081731
    Keywords : electron microscopy * SEM
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    http://www.trends.isibrno.cz/
    Permanent Link: http://hdl.handle.net/11104/0260338
     
     
  7. 7.
    0460200 - ÚPT 2017 RIV CZ eng C - Conference Paper (international conference)
    Frank, Luděk - Mikmeková, Eliška
    Treatment of surfaces with slow electrons.
    Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016 - (Mika, F.), s. 10-11. ISBN 978-80-87441-17-6.
    [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./. Skalský dvůr (CZ), 29.05.2016-03.06.2016]
    R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
    Institutional support: RVO:68081731
    Keywords : electron microscopy * SEM * STEM
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    http://www.trends.isibrno.cz/
    Permanent Link: http://hdl.handle.net/11104/0260332
     
     
  8. 8.
    0450825 - ÚPT 2016 RIV HU eng C - Conference Paper (international conference)
    Frank, Luděk - Mikmeková, Eliška
    Graphene examined with very slow electrons.
    12th Multinational Congress on Microscopy. Budapest: Akadémiai Kiadó, 2015, s. 182-183. ISBN 978-963-05-9653-4.
    [MCM 2015. Multinational Congress on Microscopy /12./. Eger (HU), 23.08.2015-28.08.2015]
    R&D Projects: GA TA ČR(CZ) TE01020118
    Institutional support: RVO:68081731
    Keywords : graphene * 2D crystals * ultra-low-energy STEM * ultra-low-energy SEM
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0252038
     
     
  9. 9.
    0450822 - ÚPT 2016 RIV HU eng C - Conference Paper (international conference)
    Pokorná, Zuzana - Frank, Luděk - Knápek, Alexandr - Konvalina, Ivo - Mikmeková, Eliška - Mikmeková, Šárka - Walker, Christopher - Müllerová, Ilona
    Scanning low-and very low energy electron microscopy.
    12th Multinational Congress on Microscopy. Budapest: Akadémiai Kiadó, 2015, s. 218-220. ISBN 978-963-05-9653-4.
    [MCM 2015. Multinational Congress on Microscopy /12./. Eger (HU), 23.08.2015-28.08.2015]
    R&D Projects: GA TA ČR(CZ) TE01020118
    Institutional support: RVO:68081731
    Keywords : very low energy * scanning low energy electron microscopy * crystallography, graphene * tissue sections
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0252034
     
     
  10. 10.
    0437839 - ÚPT 2015 RIV CZ eng C - Conference Paper (international conference)
    Mikmeková, Eliška - Frank, Luděk
    Examination of Graphene with Very Slow Electrons.
    NANOCON 2014. 6th International conference proceedings. Ostrava: TANGER, 2014. ISBN 978-80-87294-55-0.
    [NANOCON 2014. International Conference /6./. Brno (CZ), 05.11.2014-07.11.2014]
    R&D Projects: GA TA ČR TE01020118; GA MŠMT(CZ) LO1212
    Institutional support: RVO:68081731
    Keywords : graphene * slow electrons * very low energy scanning electron microscopy * ultralow energy STEM
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0241324
     
     

  This site uses cookies to make them easier to browse. Learn more about how we use cookies.