Search results
- 1.0375383 - ÚPT 2012 RIV GB eng J - Journal Article
Müllerová, Ilona - Hovorka, Miloš - Mika, Filip - Mikmeková, Eliška - Mikmeková, Šárka - Pokorná, Zuzana - Frank, Luděk
Very low energy scanning electron microscopy in nanotechnology.
International Journal of Nanotechnology. Roč. 9, 8/9 (2012), s. 695-716. ISSN 1475-7435. E-ISSN 1741-8151
R&D Projects: GA MŠMT OE08012; GA MŠMT ED0017/01/01; GA AV ČR IAA100650902
Institutional research plan: CEZ:AV0Z20650511
Keywords : scanning electron microscopy * very low energy electrons * cathode lens * grain contrast * strain contrast * imaging of participates * dopant contrast * very low energy STEM * graphene
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.087, year: 2012
Permanent Link: http://hdl.handle.net/11104/0208054 - 2.0365942 - ÚPT 2012 RIV JP eng J - Journal Article
Mikmeková, Šárka - Matsuda, K. - Watanabe, K. - Ikeno, S. - Müllerová, Ilona - Frank, Luděk
FIB Induced Damage Examined with the Low Energy SEM.
Materials Transactions. Roč. 52, č. 3 (2011), s. 292-296. ISSN 1345-9678. E-ISSN 1347-5320
R&D Projects: GA MŠMT OE08012
Institutional research plan: CEZ:AV0Z20650511
Keywords : scanning low energy electron microscopy * focused ion beam * beam induced damage * sputtering
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 0.699, year: 2011
Permanent Link: http://hdl.handle.net/11104/0201068 - 3.0358595 - ÚPT 2012 RIV NL eng J - Journal Article
Frank, Luděk - Hovorka, Miloš - Konvalina, Ivo - Mikmeková, Šárka - Müllerová, Ilona
Very low energy scanning electron microscopy.
Nuclear Instruments & Methods in Physics Research Section A. Roč. 645, č. 1 (2011), s. 46-54. ISSN 0168-9002. E-ISSN 1872-9576
R&D Projects: GA MŠMT OE08012
Institutional research plan: CEZ:AV0Z20650511
Keywords : scanning electron microscopy * low energy electrons * cathode lens * very low energy STEM * grain contrast
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.207, year: 2011
Permanent Link: http://hdl.handle.net/11104/0196580 - 4.0340746 - ÚPT 2010 RIV JP eng J - Journal Article
Mikmeková, Šárka - Hovorka, Miloš - Müllerová, Ilona - Man, O. - Pantělejev, L. - Frank, Luděk
Grain Contrast Imaging in UHV SLEEM.
Materials Transactions. Roč. 51, č. 2 (2010), s. 292-296. ISSN 1345-9678. E-ISSN 1347-5320
R&D Projects: GA MŠMT OE08012
Institutional research plan: CEZ:AV0Z20650511
Keywords : scanning low energy electron microscopy * electron backscatter diffraction (EBSD) * grain contrast * ultra-fine grained materials
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 0.779, year: 2010
http://www.jim.or.jp/journal/e/51/02/292.html
Permanent Link: http://hdl.handle.net/11104/0183927 - 5.0333617 - ÚPT 2010 RIV GB eng J - Journal Article
Müllerová, Ilona - Konvalina, Ivo
Collection of secondary electrons in scanning electron microscopes.
Journal of Microscopy. Roč. 236, č. 3 (2009), s. 203-210. ISSN 0022-2720. E-ISSN 1365-2818
R&D Projects: GA MŠMT OE08012; GA AV ČR IAA100650803
Institutional research plan: CEZ:AV0Z20650511
Keywords : detection of electrons * magnetic lenses * secondary electrons * SEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.612, year: 2009
Permanent Link: http://hdl.handle.net/11104/0178559