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  1. 1.
    0352427 - ÚPT 2011 SG eng A - Abstract
    Oral, Martin - Lencová, Bohumila
    Correction of sample tilt in FIB instruments.
    Eighth International Conference on Charged Particle Optics CPO-8. Singapore: National University of Singapore, 2010. s. 75-76.
    [CPO /8./ International Conference on Charged Particle Optics. 12.07.2010-16.07.2010, Singapore]
    R&D Projects: GA AV ČR IAA100650805
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : particle optical instruments * elliptical spot * astigmatic focusing * optimization computation
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0191934
     
     
  2. 2.
    0352426 - ÚPT 2011 SG eng A - Abstract
    Zlámal, J. - Lencová, Bohumila
    Development of EOD for the design in electron and ion microscopy.
    Eighth International Conference on Charged Particle Optics CPO-8. Singapore: National University of Singapore, 2010. s. 73-74.
    [CPO /8./ International Conference on Charged Particle Optics. 12.07.2010-16.07.2010, Singapore]
    R&D Projects: GA AV ČR IAA100650805
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : EOD * electron microscopy * ion microscopy
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0191933
     
     


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