Search results
- 1.0365927 - ÚPT 2012 RIV NL eng J - Journal Article
Kroupa, M. - Jakubek, J. - Krejčí, F. - Žemlička, J. - Horáček, Miroslav - Radlička, Tomáš - Vlček, Ivan
Coincidence imaging system with electron optics.
Nuclear Instruments & Methods in Physics Research Section A. Roč. 633, Supl. 1 (2011), S270-S273. ISSN 0168-9002. E-ISSN 1872-9576
R&D Projects: GA AV ČR IAA100650803
Institutional research plan: CEZ:AV0Z20650511
Keywords : electron optics * coincidence
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.207, year: 2011
Permanent Link: http://hdl.handle.net/11104/0201054 - 2.0340745 - ÚPT 2010 RIV JP eng J - Journal Article
Hovorka, Miloš - Mika, Filip - Mikulík, P. - Frank, Luděk
Profiling N-Type Dopants in Silicon.
Materials Transactions. Roč. 51, č. 2 (2010), s. 237-242. ISSN 1345-9678. E-ISSN 1347-5320
R&D Projects: GA ČR GP102/09/P543; GA AV ČR IAA100650803
Institutional research plan: CEZ:AV0Z20650511
Keywords : silicon * dopant contrast * photoemission electron microscopy * scanning electron microscopy
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 0.779, year: 2010
http://www.jim.or.jp/journal/e/51/02/237.html
Permanent Link: http://hdl.handle.net/11104/0183926 - 3.0333617 - ÚPT 2010 RIV GB eng J - Journal Article
Müllerová, Ilona - Konvalina, Ivo
Collection of secondary electrons in scanning electron microscopes.
Journal of Microscopy. Roč. 236, č. 3 (2009), s. 203-210. ISSN 0022-2720. E-ISSN 1365-2818
R&D Projects: GA MŠMT OE08012; GA AV ČR IAA100650803
Institutional research plan: CEZ:AV0Z20650511
Keywords : detection of electrons * magnetic lenses * secondary electrons * SEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.612, year: 2009
Permanent Link: http://hdl.handle.net/11104/0178559