Search results
- 1.0308385 - ÚPT 2008 RIV CZ eng C - Conference Paper (international conference)
Pokorná, Zuzana - Frank, Luděk
Grain Contrast in Very Low Energy SEM.
[Kontrast zrn na velmi nízkých energiích v REM.]
Proceedings of the 8th Multinational Congress on Microscopy. Prague: Czechoslovak Microscopy Society, 2007 - (Nebesářová, J.; Hozák, P.), s. 63-64. ISBN 978-80-239-9397-4.
[Multinational Congress on Microscopy /8./. Prague (CZ), 17.06.2007-21.06.2007]
R&D Projects: GA ČR GA202/04/0281
Institutional research plan: CEZ:AV0Z20650511
Keywords : grain contrast * very low energy * SEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0160884 - 2.0099045 - MBÚ 2008 RIV CZ eng C - Conference Paper (international conference)
Benada, Oldřich - Kofroňová, Olga - Weiser, Jaroslav
Life cycle SEM monitoring of Streptomycetes cultured on ballotina.
[Životní cyklus Streptomycet rostoucích na balotine sledovaný pomocí řádkovací elektronové mikroskopie.]
Multinational Congress on Microscopy /8./. Praha: Springer, 2007, s. 15-16.
[Multinational Congress on Microscopy /8./. Prague (CZ), 17.06.2007-21.06.2007]
R&D Projects: GA AV ČR IAA600200702
Institutional research plan: CEZ:AV0Z50200510
Keywords : sem * streptomycetes
Subject RIV: EE - Microbiology, Virology
Permanent Link: http://hdl.handle.net/11104/0157798 - 3.0093061 - ÚFM 2008 RIV CZ eng C - Conference Paper (international conference)
Svoboda, Milan - Buršík, Jiří - Janovec, J. - Dolinšek, J.
Microstructure Characterisation of Al77,5 Cr16,5Fe6 Quasicrystalline Approximant.
[Charakterizace mikrostrtuktury kvazikrystalického aproximantu Al77,5Cr16,5Fe6.]
8th Multinational Congress on Microscopy. Proceedings. Praha: Czechoslovak Microscopy Society, 2007 - (Nebesářová, J.; Hozák, P.), s. 309-310. ISBN 978-80-239-9397-4.
[Multinational Congress on Microscopy /8./. Prague (CZ), 17.06.2007-21.06.2007]
R&D Projects: GA ČR GA106/07/1259
Institutional research plan: CEZ:AV0Z20410507
Keywords : quasicrystalline approximant Al77,5Cr16,5Fe6 * characterisation
Subject RIV: JG - Metallurgy
Permanent Link: http://hdl.handle.net/11104/0153203 - 4.0092593 - ÚPT 2008 RIV CZ eng C - Conference Paper (international conference)
Schauer, Petr
Enhancement of single crystal scintillators for scintillation detectors in S(T)EM.
[Zdokonalení monokrystalických scintilátorů pro scintilační detektory v S(T)EM.]
Proceedings of the 8th Multinational Congress on Microscopy. Prague: Czechoslovak Microscopy Society, 2007 - (Nebesářová, J.; Hozák, P.), s. 105-106. ISBN 978-80-239-9397-4.
[Multinational Congress on Microscopy /8./. Prague (CZ), 17.06.2007-21.06.2007]
R&D Projects: GA ČR GA102/04/2144
Institutional research plan: CEZ:AV0Z20650511
Keywords : single crystal scintillators * scintillation detector * S(T)EM * MTF * kinetics of luminescence
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0152871 - 5.0092592 - ÚPT 2008 RIV CZ eng C - Conference Paper (international conference)
Horák, Petr - Schauer, Petr
Analysis of Electron Beam Degraded poly[methyl(phenyl)silylene].
[Analýza poly[methyl(phenyl)silylene] degradovaného elektronovým svazkem.]
Proceedings of the 8th Multinational Congress on Microscopy. Prague: Czechoslovak Microscopy Society, 2007 - (Nebesářová, J.; Hozák, P.), s. 157-258. ISBN 978-80-239-9397-4.
[Multinational Congress on Microscopy /8./. Prague (CZ), 17.06.2007-21.06.2007]
R&D Projects: GA AV ČR IAA100100622
Institutional research plan: CEZ:AV0Z20650511
Keywords : poly[methyl(phenyl)silylene] * polysilanes * PSi * cathodoluminescence * electron beam degradation
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0152870 - 6.0092591 - ÚPT 2008 RIV CZ eng C - Conference Paper (international conference)
Šafářová, K. - Dvořák, A. - Kubínek, R. - Rek, Antonín - Vůjtek, M.
Research of Carbon Nanotubes by TEM, SEM and AFM Methods.
[Výzkum uhlíkových nanotrubek metodami TEM, SEM a AFM.]
Proceedings of the 8th Multinational Congress on Microscopy. Prague: Czechoslovak Microscopy Society, 2007 - (Nebesářová, J.; Hozák, P.), s. 301-302. ISBN 978-80-239-9397-4.
[Multinational Congress on Microscopy /8./. Prague (CZ), 17.06.2007-21.06.2007]
Institutional research plan: CEZ:AV0Z20650511
Keywords : carbon nanotubes * TEM * SEM * AFM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0152869 - 7.0092590 - ÚPT 2008 RIV CZ eng C - Conference Paper (international conference)
Mika, Filip - Frank, Luděk
Dynamic Behaviour of the Dopant Contrast in LVSEM.
[Dynamické chování kontrastu dopantů v LVSEM.]
Proceedings of the 8th Multinational Congress on Microscopy. Prague: Czechoslovak Microscopy Society, 2007 - (Nebesářová, J.; Hozák, P.), s. 95-96. ISBN 978-80-239-9397-4.
[Multinational Congress on Microscopy /8./. Prague (CZ), 17.06.2007-21.06.2007]
R&D Projects: GA ČR GA102/05/2327
Institutional research plan: CEZ:AV0Z20650511
Keywords : dopant contrast * LVSEM * secondary electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0152868 - 8.0092589 - ÚPT 2008 RIV CZ eng C - Conference Paper (international conference)
Matějka, František - Horáček, Miroslav - Lencová, Bohumila - Kolařík, Vladimír
Reducing the Size of a Rectangular-Shaped Electron Beam in E-Beam Writing System.
[Zmenšení rozměru pravoúhlého elektronového svazku v elektronovém litografu.]
Proceedings of the 8th Multinational Congress on Microscopy. Prague: Czechoslovak Microscopy Society, 2007 - (Nebesářová, J.; Hozák, P.), s. 87-88. ISBN 978-80-239-9397-4.
[Multinational Congress on Microscopy /8./. Prague (CZ), 17.06.2007-21.06.2007]
R&D Projects: GA ČR GA102/05/2325
Institutional research plan: CEZ:AV0Z20650511
Keywords : rectangular-shaped electron beam * e-beam writing system.
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0152867 - 9.0092588 - ÚPT 2008 RIV CZ eng C - Conference Paper (international conference)
Černoch, P. - Jirák, Josef
Optimization of Secondary Electron Detection by Segmental lonization Detector in Environmental SEM.
[Optimalizace detekce sekundárních elektronů segmentovým ionizačním detektorem v environmentálním REM.]
Proceedings of the 8th Multinational Congress on Microscopy. Prague: Czechoslovak Microscopy Society, 2007 - (Nebesářová, J.; Hozák, P.), s. 79-80. ISBN 978-80-239-9397-4.
[Multinational Congress on Microscopy /8./. Prague (CZ), 17.06.2007-21.06.2007]
R&D Projects: GA ČR(CZ) GA102/05/0886
Institutional research plan: CEZ:AV0Z20650511
Keywords : secondary electron detection * segmental ionization detector * environmental SEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0152866 - 10.0092382 - ÚPT 2008 RIV CZ eng C - Conference Paper (international conference)
Lencová, Bohumila
CAD in Electron Optics.
[CAD v elektronové optice.]
Proceedings of the 8th Multinational Congress on Microscopy. Prague: Czechoslovak Microscopy Society, 2007 - (Nebesářová, J.; Hozák, P.), s. 19-20. ISBN 978-80-239-9397-4.
[Multinational Congress on Microscopy /8./. Prague (CZ), 17.06.2007-21.06.2007]
R&D Projects: GA ČR GA102/05/2325; GA ČR(CZ) GA102/05/0886
Institutional research plan: CEZ:AV0Z20650511
Keywords : CAD * electron optics * user interfaces
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0152720