Search results
- 1.0546409 - ÚPT 2022 RIV CH eng J - Journal Article
Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Müllerová, Ilona - Frank, Luděk - Piňos, Jakub - Průcha, Lukáš - Radlička, Tomáš - Werner, W. S. M. - Mikmeková, Eliška
Low-energy electron inelastic mean free path of graphene measured by a time-of-flight spectrometer.
Nanomaterials. Roč. 11, č. 9 (2021), č. článku 2435. E-ISSN 2079-4991
R&D Projects: GA TA ČR(CZ) TN01000008
Grant - others:AV ČR(CZ) StrategieAV21/6
Program: StrategieAV
Institutional support: RVO:68081731
Keywords : time-of-flight spectrometer * inelastic mean free path * density-functional theory * many-body perturbation theory * energy-loss spectrum * density of states * band structure * graphene
OECD category: Electrical and electronic engineering
Impact factor: 5.719, year: 2021
Method of publishing: Open access
https://www.mdpi.com/2079-4991/11/9/2435
Permanent Link: http://hdl.handle.net/11104/0322930
Research data: Zenodo - 2.0543063 - ÚPT 2022 RIV NL eng J - Journal Article
Řiháček, Tomáš - Horák, M. - Schachinger, T. - Mika, Filip - Matějka, Milan - Krátký, Stanislav - Fořt, Tomáš - Radlička, Tomáš - Johnson, C. W. - Novák, L. - Seďa, B. - McMorran, B.J. - Müllerová, Ilona
Beam shaping and probe characterization in the scanning electron microscope.
Ultramicroscopy. Roč. 225, June (2021), č. článku 113268. ISSN 0304-3991. E-ISSN 1879-2723
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : Electron diffraction * SEM * Electron beam structuring * Spot shape measurement * Electron vortex beam
OECD category: Particles and field physics
Impact factor: 2.994, year: 2021
Method of publishing: Open access
https://www.sciencedirect.com/science/article/pii/S0304399121000589
Permanent Link: http://hdl.handle.net/11104/0320365 - 3.0536755 - ÚPT 2021 RIV US eng J - Journal Article
Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Piňos, Jakub - Radlička, Tomáš - Frank, Luděk - Müllerová, Ilona - Materna Mikmeková, Eliška
Very Low Energy Electron Transmission Spectroscopy of 2D Materials.
Microscopy and Microanalysis. Roč. 26, S2 (2020), s. 2636-2638. ISSN 1431-9276. E-ISSN 1435-8115
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : spectroscopy * very low energy electron transmission * 2D materials
OECD category: Electrical and electronic engineering
Impact factor: 4.127, year: 2020
Method of publishing: Open access
https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/very-low-energy-electron-transmission-spectroscopy-of-2d-materials/2F6DF5F745E2CCA1AFA45F451D68BD41
Permanent Link: http://hdl.handle.net/11104/0314644 - 4.0522074 - ÚPT 2020 RIV US eng J - Journal Article
Werner, W. S. M. - Oral, Martin - Radlička, Tomáš - Zelinka, Jiří - Müllerová, Ilona - Bellissimo, A. - Bertolini, G. - Cabrera, H. - Gurlu, O.
Scanning tunneling microscopy in the field-emission regime: Formation of a two-dimensional electron cascade.
Applied Physics Letters. Roč. 115, č. 25 (2019), č. článku 251604. ISSN 0003-6951. E-ISSN 1077-3118
EU Projects: European Commission(XE) 606988 - SIMDALEE2
Institutional support: RVO:68081731
Keywords : spin polarization * diffraction
OECD category: Atomic, molecular and chemical physics (physics of atoms and molecules including collision, interaction with radiation, magnetic resonances, Mössbauer effect)
Impact factor: 3.597, year: 2019
Method of publishing: Limited access
https://aip.scitation.org/doi/10.1063/1.5128300
Permanent Link: http://hdl.handle.net/11104/0306577 - 5.0508150 - ÚPT 2020 RIV NL eng J - Journal Article
Radlička, Tomáš
Correction of parasitic aberrations of hexapole corrector using differential algebra method.
Ultramicroscopy. Roč. 204, SEP (2019), s. 81-90. ISSN 0304-3991. E-ISSN 1879-2723
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : electron optics * correctors * aberrations * differential algebra method
OECD category: Electrical and electronic engineering
Impact factor: 2.452, year: 2019
Method of publishing: Limited access
https://www.sciencedirect.com/science/article/pii/S030439911930035X?via%3Dihub
Permanent Link: http://hdl.handle.net/11104/0299133 - 6.0491708 - ÚPT 2019 RIV NL eng J - Journal Article
Radlička, Tomáš - Unčovský, M. - Oral, Martin
In lens BSE detector with energy filtering.
Ultramicroscopy. Roč. 189, JUN (2018), s. 102-108. ISSN 0304-3991. E-ISSN 1879-2723
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : electron optics * scanning electron microscopy * back scattered electrons * energy filtering
OECD category: Electrical and electronic engineering
Impact factor: 2.644, year: 2018
Permanent Link: http://hdl.handle.net/11104/0285349 - 7.0489598 - ÚPT 2019 RIV NL eng J - Journal Article
Zelinka, Jiří - Oral, Martin - Radlička, Tomáš
Novel simulation method of space charge effects in electron optical systems including emission of electrons.
Ultramicroscopy. Roč. 184, JAN (2018), s. 66-76. ISSN 0304-3991. E-ISSN 1879-2723
R&D Projects: GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : space charge * self-consistent simulation * aberration polynomial * electron emission
OECD category: Electrical and electronic engineering
Impact factor: 2.644, year: 2018
Permanent Link: http://hdl.handle.net/11104/0283982 - 8.0481767 - ÚPT 2018 RIV CZ cze J - Journal Article
Zelinka, Jiří - Oral, Martin - Radlička, Tomáš
Simulace elktronově optických systémů s vysokým proudem ve svazku.
[Simulation of electron-optical system with high beam current.]
Jemná mechanika a optika. Roč. 62, č. 10 (2017), s. 266-269. ISSN 0447-6441
R&D Projects: GA MŠMT(CZ) LO1212
Institutional support: RVO:68081731
Keywords : space charge * electron emission * self-consistent simulation * aberation polynomial
OECD category: Particles and field physics
Permanent Link: http://hdl.handle.net/11104/0277305 - 9.0451588 - ÚPT 2016 RIV US eng J - Journal Article
Zelinka, Jiří - Oral, Martin - Radlička, Tomáš
Simulation of Space Charge Effects in Electron Optical System Based on the Calculations of Current Density.
Microscopy and Microanalysis. Roč. 21, S4 (2015), s. 246-251. ISSN 1431-9276. E-ISSN 1435-8115
R&D Projects: GA MŠMT(CZ) LO1212
Institutional support: RVO:68081731
Keywords : electron optical system * calculations of current density
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.730, year: 2015
Permanent Link: http://hdl.handle.net/11104/0252723 - 10.0451582 - ÚPT 2016 RIV US eng J - Journal Article
Radlička, Tomáš
Wave Optical Calculation of Probe Size in Low Energy Scanning Electron Microscope.
Microscopy and Microanalysis. Roč. 21, S4 (2015), s. 212-217. ISSN 1431-9276. E-ISSN 1435-8115
R&D Projects: GA MŠMT(CZ) LO1212
Institutional support: RVO:68081731
Keywords : scanning electron microscope * optical calculation
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.730, year: 2015
Permanent Link: http://hdl.handle.net/11104/0252721