Search results
- 1.0494380 - ÚPT 2019 RIV CZ eng C - Conference Paper (international conference)
Zouhar, Martin - Radlička, Tomáš - Oral, Martin - Konvalina, Ivo
Inelastic mean free path from raw data measured by low-energy electrons time-of-flight spectrometer.
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 86-87. ISBN 978-80-87441-23-7.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731
Keywords : electron microscopy * time of flight * inelastic mean free path * low energy
OECD category: Atomic, molecular and chemical physics (physics of atoms and molecules including collision, interaction with radiation, magnetic resonances, Mössbauer effect)
Permanent Link: http://hdl.handle.net/11104/0287642 - 2.0494372 - ÚPT 2019 RIV CZ eng C - Conference Paper (international conference)
Radlička, Tomáš - Kolařík, V. - Oral, Martin
Electron optical properties of a new low-energy scanning electron microscope with beam separator.
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 64-65. ISBN 978-80-87441-23-7.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
R&D Projects: GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : low energy scanning electron microscopy * beam separation * aberrations
OECD category: Electrical and electronic engineering
Permanent Link: http://hdl.handle.net/11104/0287628 - 3.0494360 - ÚPT 2019 RIV CZ eng C - Conference Paper (international conference)
Daniel, Benjamin - Radlička, Tomáš - Piňos, Jakub - Mikmeková, Šárka - Konvalina, Ivo - Frank, Luděk - Müllerová, Ilona
Very low energy electron transmission spectromicroscopy.
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 14-15. ISBN 978-80-87441-23-7.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
EU Projects: European Commission(XE) 606988 - SIMDALEE2
Institutional support: RVO:68081731
Keywords : low energy scanning electron microscopy * electron microscopy * time of flight * electron energy lost spectroscopy
OECD category: Electrical and electronic engineering
Permanent Link: http://hdl.handle.net/11104/0287590 - 4.0460210 - ÚPT 2017 RIV CZ eng C - Conference Paper (international conference)
Radlička, Tomáš - Oral, Martin
Correction of misalignment aberrations of a hexapole corrector using the differential algebra method.
Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016 - (Mika, F.), s. 50-53. ISBN 978-80-87441-17-6.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./. Skalský dvůr (CZ), 29.05.2016-03.06.2016]
R&D Projects: GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01; GA MŠMT(CZ) 7H13015
Institutional support: RVO:68081731
Keywords : electron microscopy * Schertzer theorem * TEM * STEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://www.trends.isibrno.cz/
Permanent Link: http://hdl.handle.net/11104/0260342 - 5.0460207 - ÚPT 2017 RIV CZ eng C - Conference Paper (international conference)
Rozbořil, Jakub - Oral, Martin - Radlička, Tomáš
Optimal X-ray detection for thin samples in low-energy STEM.
Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016 - (Mika, F.), s. 44-45. ISBN 978-80-87441-17-6.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./. Skalský dvůr (CZ), 29.05.2016-03.06.2016]
Institutional support: RVO:68081731
Keywords : electron microscopy * EDS * STEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://www.trends.isibrno.cz/
Permanent Link: http://hdl.handle.net/11104/0260339 - 6.0460199 - ÚPT 2017 RIV CZ eng C - Conference Paper (international conference)
Daniel, Benjamin - Radlička, Tomáš - Piňos, Jakub - Frank, Luděk - Müllerová, Ilona
Very low energy STEM/TOF system.
Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016 - (Mika, F.), s. 6-7. ISBN 978-80-87441-17-6.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./. Skalský dvůr (CZ), 29.05.2016-03.06.2016]
EU Projects: European Commission(XE) 606988 - SIMDALEE2
Institutional support: RVO:68081731
Keywords : elecvtron microscopy * SLEEM * UHV SLEEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://www.trends.isibrno.cz/
Permanent Link: http://hdl.handle.net/11104/0260331 - 7.0431219 - ÚPT 2015 RIV CZ eng C - Conference Paper (international conference)
Oral, Martin - Radlička, Tomáš
Computations in Charged Particle Optics.
Workshop of Interesting Topics of SEM and ESEM. Brno: Institute of Scientific Instruments AS CR, v. v. i, 2014, s. 23-24. ISBN 978-80-87441-12-1.
[Workshop of Interesting Topics of SEM and ESEM. Mikulov (CZ), 26.08.2014-31.08.2014]
R&D Projects: GA MŠMT EE.2.3.20.0103
Institutional support: RVO:68081731
Keywords : charged Particle Optics * computations
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0235965 - 8.0431216 - ÚPT 2015 RIV CZ eng C - Conference Paper (international conference)
Müllerová, Ilona - Radlička, Tomáš - Mika, Filip - Krzyžánek, Vladislav - Neděla, Vilém - Sobota, Jaroslav - Zobač, Martin - Kolařík, Vladimír - Starčuk jr., Zenon - Srnka, Aleš - Jurák, Pavel - Zemánek, Pavel - Číp, Ondřej - Lazar, Josef - Mrňa, Libor
Main Activites of the Institute of Scientific Instruments.
Workshop of Interesting Topics of SEM and ESEM. Brno: Institute of Scientific Instruments AS CR, v. v. i, 2014, s. 7-8. ISBN 978-80-87441-12-1.
[Workshop of Interesting Topics of SEM and ESEM. Mikulov (CZ), 26.08.2014-31.08.2014]
R&D Projects: GA MŠMT EE.2.3.20.0103
Institutional support: RVO:68081731
Keywords : Institute of Scientific Instruments * electron microscopes * nuclear magnetic resonance equipment * coherent optics and related techniques
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0235960 - 9.0386398 - ÚPT 2013 RIV CZ eng C - Conference Paper (international conference)
Radlička, Tomáš
Calculation of difraction aberration using differential algebra.
Proceedings of the 13th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2012 - (Mika, F.), s. 59-62. ISBN 978-80-87441-07-7.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /13./. Skalský dvůr (CZ), 25.06.2012-29.06.2012]
Institutional support: RVO:68081731
Keywords : Diffraction in electron optics * diferential algebra method
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0215697 - 10.0350670 - ÚPT 2011 RIV CZ eng C - Conference Paper (international conference)
Radlička, Tomáš
Properties of Bi LMIS with ion clusters.
Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010 - (Mika, F.), s. 57-58. ISBN 978-80-254-6842-5.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./. Skalský dvůr (CZ), 31.05.2010-04.06.2010]
Grant - others:EC 7FP(XE) NMP4-SE-2008-200613
Institutional research plan: CEZ:AV0Z20650511
Source of funding: R - Framework programmes of European Commission
Keywords : SIMS * liquid–metal ion sources (LMIS) * discrete coulomb interactions (DCI)
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://arl-repository.lib.cas.cz/uloziste_av/UPT-D/cav_un_epca-0350670_01.pdf
Permanent Link: http://hdl.handle.net/11104/0190610