Search results

  1. 1.
    0326715 - ÚCHP 2010 US eng C - Conference Paper (international conference)
    Klementová, Mariana - Dřínek, Vladislav - Fajgar, Radek - Šubrt, Jan
    Structure of Coated Ge-nanowires.
    [Sruktura obalených Ge nanodrárů.]
    Book of Abstracts. -: -, 2008 - (Baxter, D.; Bay, B.). ISBN N.
    [Microscopy and Microanalysis 2008. Albuquerque, New Mexico (US), 03.08.2008-07.08.2008]
    R&D Projects: GA AV ČR IAA400720616
    Institutional research plan: CEZ:AV0Z40720504; CEZ:AV0Z40320502
    Keywords : optical properties * catalytics properties * new technologies
    Subject RIV: CF - Physical ; Theoretical Chemistry
    Permanent Link: http://hdl.handle.net/11104/0173730
     
     
  2. 2.
    0320684 - ÚCHP 2009 DE eng C - Conference Paper (international conference)
    Dřínek, Vladislav - Fajgar, Radek - Klementová, Mariana - Šubrt, Jan
    From Shelled Germanium Nanowires to SiC Nanotubes.
    [Od obalených germanických nanodrátů k SiC nanotrubkám.]
    Delegate Manual. -: Elsevier, 2008, P3-34. ISBN N.
    [6th International Conference on Inorganic Materials. Dresden (DE), 28.09.2008-30.09.2008]
    R&D Projects: GA AV ČR IAA400720616
    Institutional research plan: CEZ:AV0Z40720504; CEZ:AV0Z40320502
    Keywords : pyrolysis * organogermane * nanowire
    Subject RIV: CF - Physical ; Theoretical Chemistry
    Permanent Link: http://hdl.handle.net/11104/0169487
     
     
  3. 3.
    0312463 - ÚCHP 2009 RIV CZ eng C - Conference Paper (international conference)
    Dřínek, Vladislav - Vacek, Karel
    Surface Point Defects in Silicon Related Nanopowders Produced by Pulsed Laser Ablation: IR Evidence of Peroxy Radical SiOO(.).
    [Povrchové bodové defekty v nanopráškách obsahující křemík připravené pomocí pulsní laserové ablace: IR důkaz peroxy radikálu SiOO(.).]
    Proceedings. Praha: ČSNMT, 2008, s. 117-122. ISBN 80-214-3331-0.
    [International Conference Nano 06. Brno (CZ), 13.11.2006-15.11.2006]
    R&D Projects: GA AV ČR IAA400720616
    Institutional research plan: CEZ:AV0Z4072921
    Keywords : pulser laser ablation * silicon dioxide * point defect
    Subject RIV: CF - Physical ; Theoretical Chemistry
    Permanent Link: http://hdl.handle.net/11104/0163524
     
     


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