Search results
- 1.0494380 - ÚPT 2019 RIV CZ eng C - Conference Paper (international conference)
Zouhar, Martin - Radlička, Tomáš - Oral, Martin - Konvalina, Ivo
Inelastic mean free path from raw data measured by low-energy electrons time-of-flight spectrometer.
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 86-87. ISBN 978-80-87441-23-7.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731
Keywords : electron microscopy * time of flight * inelastic mean free path * low energy
OECD category: Atomic, molecular and chemical physics (physics of atoms and molecules including collision, interaction with radiation, magnetic resonances, Mössbauer effect)
Permanent Link: http://hdl.handle.net/11104/0287642 - 2.0494372 - ÚPT 2019 RIV CZ eng C - Conference Paper (international conference)
Radlička, Tomáš - Kolařík, V. - Oral, Martin
Electron optical properties of a new low-energy scanning electron microscope with beam separator.
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 64-65. ISBN 978-80-87441-23-7.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
R&D Projects: GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : low energy scanning electron microscopy * beam separation * aberrations
OECD category: Electrical and electronic engineering
Permanent Link: http://hdl.handle.net/11104/0287628 - 3.0494368 - ÚPT 2019 RIV CZ eng C - Conference Paper (international conference)
Oral, Martin - Číp, Ondřej - Slodička, L.
Analysis of linear ion Paul traps using 3-D FEM and the azimuthal multipole expansion.
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 52-55. ISBN 978-80-87441-23-7.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
R&D Projects: GA ČR GB14-36681G
Institutional support: RVO:68081731
Keywords : linear ion traps * atomic clock * electric RF fields * simulation of electrostatic fields * finite element method * multipole field expansion * ion trajectories * particle tracing
OECD category: Atomic, molecular and chemical physics (physics of atoms and molecules including collision, interaction with radiation, magnetic resonances, Mössbauer effect)
Permanent Link: http://hdl.handle.net/11104/0287623 - 4.0460210 - ÚPT 2017 RIV CZ eng C - Conference Paper (international conference)
Radlička, Tomáš - Oral, Martin
Correction of misalignment aberrations of a hexapole corrector using the differential algebra method.
Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016 - (Mika, F.), s. 50-53. ISBN 978-80-87441-17-6.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./. Skalský dvůr (CZ), 29.05.2016-03.06.2016]
R&D Projects: GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01; GA MŠMT(CZ) 7H13015
Institutional support: RVO:68081731
Keywords : electron microscopy * Schertzer theorem * TEM * STEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://www.trends.isibrno.cz/
Permanent Link: http://hdl.handle.net/11104/0260342 - 5.0460207 - ÚPT 2017 RIV CZ eng C - Conference Paper (international conference)
Rozbořil, Jakub - Oral, Martin - Radlička, Tomáš
Optimal X-ray detection for thin samples in low-energy STEM.
Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016 - (Mika, F.), s. 44-45. ISBN 978-80-87441-17-6.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./. Skalský dvůr (CZ), 29.05.2016-03.06.2016]
Institutional support: RVO:68081731
Keywords : electron microscopy * EDS * STEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://www.trends.isibrno.cz/
Permanent Link: http://hdl.handle.net/11104/0260339 - 6.0431219 - ÚPT 2015 RIV CZ eng C - Conference Paper (international conference)
Oral, Martin - Radlička, Tomáš
Computations in Charged Particle Optics.
Workshop of Interesting Topics of SEM and ESEM. Brno: Institute of Scientific Instruments AS CR, v. v. i, 2014, s. 23-24. ISBN 978-80-87441-12-1.
[Workshop of Interesting Topics of SEM and ESEM. Mikulov (CZ), 26.08.2014-31.08.2014]
R&D Projects: GA MŠMT EE.2.3.20.0103
Institutional support: RVO:68081731
Keywords : charged Particle Optics * computations
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0235965 - 7.0386396 - ÚPT 2013 RIV CZ eng C - Conference Paper (international conference)
Oral, Martin
Fast simulation of ToF spectrometers.
Proceedings of the 13th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2012 - (Mika, F.), s. 51-54. ISBN 978-80-87441-07-7.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /13./. Skalský dvůr (CZ), 25.06.2012-29.06.2012]
R&D Projects: GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : ToF SIMS * fast simulation method
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0215695 - 8.0350668 - ÚPT 2011 RIV CZ eng C - Conference Paper (international conference)
Oral, Martin
Ray tracing, aberration coefficients and intensity distribution.
Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010 - (Mika, F.), s. 49-52. ISBN 978-80-254-6842-5.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./. Skalský dvůr (CZ), 31.05.2010-04.06.2010]
R&D Projects: GA AV ČR IAA100650805
Institutional research plan: CEZ:AV0Z20650511
Keywords : ray tracing * aberration coefficients * intensity distribution
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://arl-repository.lib.cas.cz/uloziste_av/UPT-D/cav_un_epca-0350668_01.pdf
Permanent Link: http://hdl.handle.net/11104/0190608 - 9.0205597 - UPT-D 20020147 RIV CZ cze C - Conference Paper (international conference)
Oral, Martin
Určení přesných trajektorií nabitých částic a vad soustav v částicové optice.
[The assessment of accurate trajectories of charged particles and errors of systems in particle optics.]
Sborník prací prezentovaných na Semináři doktorandů oboru Elektronová optika konaném dne 16. 12. 2002. Brno: Ústav přístrojové techniky AV ČR, 2002 - (Müllerová, I.), s. 29 - 32. ISBN 80-238-9915-5.
[PDS 2002. Brno (CZ), 16.12.2002]
Institutional research plan: CEZ:AV0Z2065902
Keywords : trajectories of electrons * particle-optical systems
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0101210 - 10.0205502 - UPT-D 20020052 RIV CZ eng C - Conference Paper (international conference)
Oral, Martin
Calculation of the beam profile.
Proceedings of the 8th international seminar, held in Skalský dvůr. Brno: Ústav přístrojové techniky Akademie věd České republiky, 2002 - (Frank, L.), s. 19 - 20. ISBN 80-238-8986-9.
[Recent trends in charged particle optics and surface physics instrumentation. Skalský dvůr (CZ), 08.07.2002-12.07.2002]
Institutional research plan: CEZ:AV0Z2065902
Keywords : particle beam * beam aberrations * aberration theory
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0101115