Search results
- 1.0588543 - ÚPT 2025 RIV NL eng J - Journal Article
Materna Mikmeková, Eliška - Materna, J. - Konvalina, Ivo - Mikmeková, Šárka - Müllerová, Ilona - Asefa, T.
A soft touch with electron beams: Digging out structural information of nanomaterials with advanced scanning low energy electron microscopy coupled with deep learning.
Ultramicroscopy. Roč. 262, August (2024), č. článku 113965. ISSN 0304-3991. E-ISSN 1879-2723
R&D Projects: GA ČR(CZ) GA22-34286S
Grant - others:AV ČR(CZ) LQ100652201; AV ČR(CZ) StrategieAV21/26
Program: Prémie Lumina quaeruntur; StrategieAV
Institutional support: RVO:68081731
Keywords : Scanning low energy electron microscopy * Deep learning * Mesoporous silica
OECD category: Materials engineering
Impact factor: 2.1, year: 2023 ; AIS: 0.686, rok: 2023
Method of publishing: Limited access
Result website:
https://www.sciencedirect.com/science/article/pii/S0304399124000445DOI: https://doi.org/10.1016/j.ultramic.2024.113965
Permanent Link: https://hdl.handle.net/11104/0355407 - 2.0564387 - ÚPT 2023 RIV JP eng J - Journal Article
Lee, S. - Watanabe, S. - Tsuchiya, T. - Mikmeková, Šárka - Müllerová, Ilona - Ono, Y. - Takaguchi, Y. - Ikeno, S. - Matsuda, K.
Fabrication of Al-Based Composite Extruded Plates Containing Cellulose Nanofibers and Their Microstructure and Mechanical Properties.
Materials Transactions. Roč. 63, č. 11 (2022), s. 1590-1596. ISSN 1345-9678. E-ISSN 1347-5320
Institutional support: RVO:68081731
Keywords : aluminum * cellulose nanofiber * composite materials * extrusion * microstructure
OECD category: Materials engineering
Impact factor: 1.2, year: 2022 ; AIS: 0.213, rok: 2022
Method of publishing: Open access
Result website:
https://www.jstage.jst.go.jp/article/matertrans/63/11/63_MT-M2022107/_articleDOI: https://doi.org/10.2320/matertrans.MT-M2022107
Permanent Link: https://hdl.handle.net/11104/0336063 - 3.0551125 - ÚPT 2023 RIV CH eng J - Journal Article
Konvalina, Ivo - Paták, Aleš - Zouhar, Martin - Müllerová, Ilona - Fořt, Tomáš - Unčovský, M. - Materna Mikmeková, Eliška
Quantification of stem images in high resolution sem for segmented and pixelated detectors.
Nanomaterials. Roč. 12, č. 1 (2022), č. článku 71. ISSN 2079-4991. E-ISSN 2079-4991
R&D Projects: GA TA ČR(CZ) TN01000008
Grant - others:AV ČR(CZ) StrategieAV21/6
Program: StrategieAV
Institutional support: RVO:68081731
Keywords : STEM segmented detector * pixelated detector * scanning electron microscopy * Monte Carlo simulations * ray tracing * quantitative imaging
OECD category: Electrical and electronic engineering
Impact factor: 5.3, year: 2022 ; AIS: 0.712, rok: 2022
Method of publishing: Open access
Result website:
https://www.mdpi.com/2079-4991/12/1/71DOI: https://doi.org/10.3390/nano12010071
Permanent Link: http://hdl.handle.net/11104/0326569 - 4.0546409 - ÚPT 2022 RIV CH eng J - Journal Article
Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Müllerová, Ilona - Frank, Luděk - Piňos, Jakub - Průcha, Lukáš - Radlička, Tomáš - Werner, W. S. M. - Mikmeková, Eliška
Low-energy electron inelastic mean free path of graphene measured by a time-of-flight spectrometer.
Nanomaterials. Roč. 11, č. 9 (2021), č. článku 2435. ISSN 2079-4991. E-ISSN 2079-4991
R&D Projects: GA TA ČR(CZ) TN01000008
Grant - others:AV ČR(CZ) StrategieAV21/6
Program: StrategieAV
Institutional support: RVO:68081731
Keywords : time-of-flight spectrometer * inelastic mean free path * density-functional theory * many-body perturbation theory * energy-loss spectrum * density of states * band structure * graphene
OECD category: Electrical and electronic engineering
Impact factor: 5.719, year: 2021 ; AIS: 0.738, rok: 2021
Method of publishing: Open access
Result website:
https://www.mdpi.com/2079-4991/11/9/2435DOI: https://doi.org/10.3390/nano11092435
Permanent Link: http://hdl.handle.net/11104/0322930Research data: Zenodo - 5.0544223 - ÚPT 2022 RIV US eng J - Journal Article
Ma, Haili - Mikmeková, Šárka - Konvalina, Ivo - Yin, X. - Sun, F. - Piňos, Jakub - Vaškovicová, Naděžda - Průcha, Lukáš - Müllerová, Ilona - Mikmeková, Eliška - Chen, D.
Imaging ferroelectric nanodomains in strained BiFeO3 nanoscale films using scanning low-energy electron microscopy: Implications for low-power devices.
ACS Applied Nano Materials. Roč. 4, č. 4 (2021), s. 3725-3733. ISSN 2574-0970. E-ISSN 2574-0970
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : scanning low-energy electron microscopy (SLEEM) * BiFeO3 nanoscale films * ferroelectric nanodomains * low-loss backscattered electrons * multiferroic
OECD category: Electrical and electronic engineering
Impact factor: 6.140, year: 2021 ; AIS: 0.949, rok: 2021
Method of publishing: Limited access
Result website:
https://pubs.acs.org/doi/10.1021/acsanm.1c00204DOI: https://doi.org/10.1021/acsanm.1c00204
Permanent Link: http://hdl.handle.net/11104/0321265 - 6.0543063 - ÚPT 2022 RIV NL eng J - Journal Article
Řiháček, Tomáš - Horák, M. - Schachinger, T. - Mika, Filip - Matějka, Milan - Krátký, Stanislav - Fořt, Tomáš - Radlička, Tomáš - Johnson, C. W. - Novák, L. - Seďa, B. - McMorran, B.J. - Müllerová, Ilona
Beam shaping and probe characterization in the scanning electron microscope.
Ultramicroscopy. Roč. 225, June (2021), č. článku 113268. ISSN 0304-3991. E-ISSN 1879-2723
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : Electron diffraction * SEM * Electron beam structuring * Spot shape measurement * Electron vortex beam
OECD category: Particles and field physics
Impact factor: 2.994, year: 2021 ; AIS: 0.857, rok: 2021
Method of publishing: Open access
Result website:
https://www.sciencedirect.com/science/article/pii/S0304399121000589DOI: https://doi.org/10.1016/j.ultramic.2021.113268
Permanent Link: http://hdl.handle.net/11104/0320365 - 7.0536755 - ÚPT 2021 RIV US eng J - Journal Article
Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Piňos, Jakub - Radlička, Tomáš - Frank, Luděk - Müllerová, Ilona - Materna Mikmeková, Eliška
Very Low Energy Electron Transmission Spectroscopy of 2D Materials.
Microscopy and Microanalysis. Roč. 26, S2 (2020), s. 2636-2638. ISSN 1431-9276. E-ISSN 1435-8115
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : spectroscopy * very low energy electron transmission * 2D materials
OECD category: Electrical and electronic engineering
Impact factor: 4.127, year: 2020 ; AIS: 0.968, rok: 2020
Method of publishing: Open access
Result website:
https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/very-low-energy-electron-transmission-spectroscopy-of-2d-materials/2F6DF5F745E2CCA1AFA45F451D68BD41DOI: https://doi.org/10.1017/S1431927620022278
Permanent Link: http://hdl.handle.net/11104/0314644 - 8.0535210 - ÚPT 2021 RIV CZ cze J - Journal Article
Řiháček, Tomáš - Müllerová, Ilona
Optimalizce amplitudové difrakční mřížky pro tvorbu vírových svazků v elektronovém mikroskopu.
[Optimization of an amplitude diffraction grating for electron vortex beams creation.]
Jemná mechanika a optika. Roč. 65, č. 6 (2020), s. 185-187. ISSN 0447-6441
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : vortex electron beam * diffraction grating * holographic reconstruction
OECD category: Electrical and electronic engineering
Method of publishing: Limited access
Result website:
https://jmo.fzu.cz/sites/jmo.fzu.cz/files/oldweb/2020/2020-06/jmo_20_06_obsah.pdf
Permanent Link: http://hdl.handle.net/11104/0313293 - 9.0525529 - ÚPT 2021 RIV NL eng J - Journal Article
Materna Mikmeková, Eliška - Müllerová, Ilona - Frank, Luděk - Paták, Aleš - Polčák, J. - Sluyterman, S. - Lejeune, M. - Konvalina, Ivo
Low-energy electron microscopy of graphene outside UHV: electron-induced removal of PMMA residues used for graphene transfer.
Journal of Electron Spectroscopy and Related Phenomena. Roč. 241, MAY (2020), č. článku 146873. ISSN 0368-2048. E-ISSN 1873-2526
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
EU Projects: European Commission(XE) 606988 - SIMDALEE2
Institutional support: RVO:68081731
Keywords : graphene * PMMA * slow electron treatment * XPS * Raman spectroscopy
OECD category: Electrical and electronic engineering
Impact factor: 1.957, year: 2020 ; AIS: 0.507, rok: 2020
Method of publishing: Open access
Result website:
https://www.sciencedirect.com/science/article/pii/S0368204818302068DOI: https://doi.org/10.1016/j.elspec.2019.06.005
Permanent Link: http://hdl.handle.net/11104/0309642 - 10.0525062 - ÚPT 2021 RIV NL eng J - Journal Article
Frank, Luděk - Hovorka, Miloš - El Gomati, M. M. - Müllerová, Ilona - Mika, Filip - Mikmeková, Eliška
Acquisition of the dopant contrast in semiconductors with slow electrons.
Journal of Electron Spectroscopy and Related Phenomena. Roč. 241, MAY (2020), č. článku 146836. ISSN 0368-2048. E-ISSN 1873-2526
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
EU Projects: European Commission(XE) 606988 - SIMDALEE2
Institutional support: RVO:68081731
Keywords : semiconductors * dopant contrast * low energy SEM * PEEM * mirror electron microscopy * surface treatments
OECD category: Electrical and electronic engineering
Impact factor: 1.957, year: 2020 ; AIS: 0.507, rok: 2020
Method of publishing: Open access
Result website:
https://www.sciencedirect.com/science/article/pii/S036820481830135XDOI: https://doi.org/10.1016/j.elspec.2019.03.004
Permanent Link: http://hdl.handle.net/11104/0309284