Search results

  1. 1.
    0507132 - ÚPT 2020 RIV CZ eng C - Conference Paper (international conference)
    Frank, Luděk - Nebesářová, Jana - Vancová, Marie - Paták, Aleš - Mikmeková, Eliška - Müllerová, Ilona
    Transmission of very slow electrons as a diagnostic tool.
    NANOCON 2013 - 5th International Conference Proceedings. Ostrava: TANGER Ltd, 2014, s. 503-508. ISBN 978-80-87294-47-5.
    [International Conference NANOCON 2013 /5./. Brno (CZ), 16.10.2013-18.10.2013]
    R&D Projects: GA ČR GAP108/11/2270; GA TA ČR(CZ) TE01020118
    Institutional support: RVO:68081731 ; RVO:60077344
    Keywords : electron microscopy * slow electrons * STEM * graphene * ultrathin tissue sections
    OECD category: Nano-materials (production and properties); Civil engineering (BC-A)
    Permanent Link: http://hdl.handle.net/11104/0298349
     
     
  2. 2.
    0499701 - ÚPT 2019 RIV CZ eng C - Conference Paper (international conference)
    Müllerová, Ilona
    Sixty years of the Institute os Scientific Instruments.
    Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018. ISBN 978-80-87441-23-7.
    [Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
    Institutional support: RVO:68081731
    Keywords : electron-microscopy * sem
    OECD category: Nano-materials (production and properties)
    Permanent Link: http://hdl.handle.net/11104/0291922
     
     
  3. 3.
    0494373 - ÚPT 2019 RIV CZ eng C - Conference Paper (international conference)
    Řiháček, Tomáš - Horák, M. - Schachinger, T. - Matějka, Milan - Mika, Filip - Müllerová, Ilona
    Creation of electron vortex beams using the holographic reconstruction method in a scanning electron microscope.
    Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 66-67. ISBN 978-80-87441-23-7.
    [Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
    R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠk(CZ) LO1212; GA MŠk ED0017/01/01
    Institutional support: RVO:68081731
    Keywords : electron vortex beams * scanning electron microscopy * electron diffraction
    OECD category: Nano-materials (production and properties)
    Permanent Link: http://hdl.handle.net/11104/0287630
     
     
  4. 4.
    0494365 - ÚPT 2019 RIV CZ eng C - Conference Paper (international conference)
    Konvalina, Ivo - Paták, Aleš - Mikmeková, Eliška - Mika, Filip - Müllerová, Ilona
    STEM modes in SEM.
    Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 40-41. ISBN 978-80-87441-23-7.
    [Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
    R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠk(CZ) LO1212; GA MŠk ED0017/01/01
    Institutional support: RVO:68081731
    Keywords : SEM * STEM
    OECD category: Electrical and electronic engineering
    Permanent Link: http://hdl.handle.net/11104/0287599
     
     
  5. 5.
    0494360 - ÚPT 2019 RIV CZ eng C - Conference Paper (international conference)
    Daniel, Benjamin - Radlička, Tomáš - Piňos, Jakub - Mikmeková, Šárka - Konvalina, Ivo - Frank, Luděk - Müllerová, Ilona
    Very low energy electron transmission spectromicroscopy.
    Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 14-15. ISBN 978-80-87441-23-7.
    [Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
    EU Projects: European Commission(XE) 606988 - SIMDALEE2
    Institutional support: RVO:68081731
    Keywords : low energy scanning electron microscopy * electron microscopy * time of flight * electron energy lost spectroscopy
    OECD category: Electrical and electronic engineering
    Permanent Link: http://hdl.handle.net/11104/0287590
     
     
  6. 6.
    0481585 - ÚPT 2018 RIV HR eng C - Conference Paper (international conference)
    Konvalina, Ivo - Paták, Aleš - Mika, Filip - Müllerová, Ilona
    STEM modes in SEM – simulations and experiments.
    13th Multinational Congress on Microscopy: Book of Abstracts. Zagreb: Ruder Bošković Institute, Croatian Microscopy Society, 2017 - (Gajović, A.; Weber, I.; Kovačević, G.; Čadež, V.; Šegota, S.; Peharec Štefanić, P.; Vidoš, A.), s. 140-141. ISBN 978-953-7941-19-2.
    [Multinational Congress on Microscopy /13./. Rovinj (HR), 24.09.2017-29.09.2017]
    R&D Projects: GA TA ČR(CZ) TE01020118
    Institutional support: RVO:68081731
    Keywords : STEM detector * trajectory simulations * cathode lens * collection efficiency
    OECD category: Electrical and electronic engineering
    Permanent Link: http://hdl.handle.net/11104/0277129
     
     
  7. 7.
    0467260 - ÚPT 2017 JP eng C - Conference Paper (international conference)
    Müllerová, Ilona - Mikmeková, Eliška - Mikmeková, Šárka - Pokorná, Zuzana - Frank, Luděk
    Reflected and transmitted mode in the scanning low energy electron microscope.
    2nd Forum of Center for ADvanced Materials Research and International Collaboration (CAMRIC-FORUM2). Toyama: University of Toyama, 2016, s. 29-30.
    [Forum of Center for ADvanced Materials Research and International Collaboration /2./ (CAMRIC-FORUM2). Toyama (JP), 13.10.2016-14.10.2016]
    R&D Projects: GA TA ČR(CZ) TE01020118
    Institutional support: RVO:68081731
    Keywords : SLEEM
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0265401
     
     
  8. 8.
    0460211 - ÚPT 2017 RIV CZ eng C - Conference Paper (international conference)
    Řiháček, Tomáš - Mika, Filip - Matějka, Milan - Krátký, Stanislav - Müllerová, Ilona
    Difraction in a scanning electron microscopie.
    Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016 - (Mika, F.), s. 56-57. ISBN 978-80-87441-17-6.
    [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./. Skalský dvůr (CZ), 29.05.2016-03.06.2016]
    R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠk(CZ) LO1212; GA MŠk ED0017/01/01
    Institutional support: RVO:68081731
    Keywords : electron microscopy * TEM * STEM
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    http://www.trends.isibrno.cz/
    Permanent Link: http://hdl.handle.net/11104/0260343
     
     
  9. 9.
    0460206 - ÚPT 2017 RIV CZ eng C - Conference Paper (international conference)
    Müllerová, Ilona - Mikmeková, Eliška - Konvalina, Ivo - Frank, Luděk
    Scanning transmission microscopy at very low energies.
    Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016 - (Mika, F.), s. 40-41. ISBN 978-80-87441-17-6.
    [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./. Skalský dvůr (CZ), 29.05.2016-03.06.2016]
    R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠk(CZ) LO1212
    Institutional support: RVO:68081731
    Keywords : electron microscopy * SEM
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    http://www.trends.isibrno.cz/
    Permanent Link: http://hdl.handle.net/11104/0260338
     
     
  10. 10.
    0460205 - ÚPT 2017 RIV CZ eng C - Conference Paper (international conference)
    Mika, Filip - Konvalina, Ivo - Krátký, Stanislav - Müllerová, Ilona
    Bandpass filter for secondary electrons in SEM - experiments.
    Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016 - (Mika, F.), s. 36-37. ISBN 978-80-87441-17-6.
    [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./. Skalský dvůr (CZ), 29.05.2016-03.06.2016]
    R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠk(CZ) LO1212; GA MŠk ED0017/01/01
    Institutional support: RVO:68081731
    Keywords : electron microscopy * TLD
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    http://www.trends.isibrno.cz/
    Permanent Link: http://hdl.handle.net/11104/0260337