Search results

  1. 1.
    0571040 - ÚPT 2024 GB eng A - Abstract
    Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Průcha, Lukáš - Piňos, Jakub - Müllerová, Ilona - Materna-Mikmeková, Eliška
    Study of Graphene and Thin Foils by a Time-of-Flight Spectrometer for Low Landing Energies.
    Microscopy and Microanalysis. Cambridge University Press. Roč. 28, S1 (2022), s. 2432-2434. ISSN 1431-9276. E-ISSN 1435-8115
    R&D Projects: GA TA ČR(CZ) TN01000008
    Grant - others: AV ČR(CZ) StrategieAV21/26
    Program: StrategieAV
    Institutional support: RVO:68081731
    OECD category: Electrical and electronic engineering
    https://academic.oup.com/mam/article/28/S1/2432/6997288
    Permanent Link: https://hdl.handle.net/11104/0342355

               
     
     
  2. 2.
    0568482 - ÚPT 2023 RIV CZ eng A - Abstract
    Paták, Aleš - Zouhar, Martin - Konvalina, Ivo - Materna-Mikmeková, Eliška - Průcha, Lukáš - Müllerová, Ilona - Charvátová Campbell, A.
    Ab initio study of angle-resolved electron spectroscopy of graphene.
    16th Multinational Congress on Microscopy, 16MCM, 04-09 September 2022, Brno, Czech Republic. Book of abstracts. Brno: Czechoslovak Microscopy Society, 2022 - (Krzyžánek, V.; Hrubanová, K.; Hozák, P.; Müllerová, I.; Šlouf, M.). s. 156-157. ISBN 978-80-11-02253-2.
    [Multinational Congress on Microscopy /16./. 04.09.2022-09.09.2022, Brno]
    R&D Projects: GA TA ČR(CZ) TN01000008
    Institutional support: RVO:68081731
    Keywords : density-functional theory * low-energy electron microscopy * many-body perturbation theory
    OECD category: Electrical and electronic engineering
    https://www.16mcm.cz/wp-content/uploads/2022/09/16MCM-abstract-book.pdf
    Permanent Link: https://hdl.handle.net/11104/0339786

               
     
     
  3. 3.
    0567516 - ÚPT 2023 RIV CZ eng A - Abstract
    Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Průcha, Lukáš - Piňos, Jakub - Müllerová, Ilona - Materna-Mikmeková, Eliška
    Time-of-Flight Spectrometer for Low Landing Energies.
    16th Multinational Congress on Microscopy, 16MCM, 04-09 September 2022, Brno, Czech Republic. Book of abstracts. Brno: Czechoslovak Microscopy Society, 2022 - (Krzyžánek, V.; Hrubanová, K.; Hozák, P.; Müllerová, I.; Šlouf, M.). s. 160-161. ISBN 978-80-11-02253-2.
    [Multinational Congress on Microscopy /16./. 04.09.2022-09.09.2022, Brno]
    R&D Projects: GA TA ČR(CZ) TN01000008
    Institutional support: RVO:68081731
    Keywords : time‑of‑flight spectrometer * graphene * inelastic mean free path * energy‑loss spectrum
    OECD category: Electrical and electronic engineering
    https://www.16mcm.cz/wp-content/uploads/2022/09/16MCM-abstract-book.pdf
    Permanent Link: https://hdl.handle.net/11104/0338771

               
     
     
  4. 4.
    0552272 - ÚPT 2022 CZ eng A - Abstract
    Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Piňos, Jakub - Průcha, Lukáš - Frank, Luděk - Müllerová, Ilona - Materna-Mikmeková, Eliška
    Study of Graphene by a Time‑of‑Flight Spectrometer for Low Landing Energies.
    15th International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) expanded to Geo-Eerth Science & Civil Design / Engineering (ES&CDE). Abstract book. Institute of Scientific Instruments of the CAS: Brno, 2021. s. 84.
    [International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) /15./. 18.10.2021-19.10.2021, online]
    Grant - others: AV ČR(CZ) StrategieAV21/6
    Program: StrategieAV
    Institutional support: RVO:68081731
    Keywords : time‑of‑flight spectrometer * graphene * inelastic mean free path * energy‑loss spectrum * density‑functional theory
    OECD category: Electrical and electronic engineering
    https://ava2016-autumn.webnode.cz/
    Permanent Link: http://hdl.handle.net/11104/0327405

               
     
     
  5. 5.
    0552271 - ÚPT 2022 CZ eng A - Abstract
    Jozefovič, Patrik - Watanabe, S. - Matsuda, K. - Müllerová, Ilona - Mikmeková, Šárka
    Characterization of Al‑based composites reinforced with CeNF by advanced SEM techniques.
    15th International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) expanded to Geo-Eerth Science & Civil Design / Engineering (ES&CDE). Abstract book. Institute of Scientific Instruments of the CAS: Brno, 2021. s. 70.
    [International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) /15./. 18.10.2021-19.10.2021, online]
    Institutional support: RVO:68081731
    Keywords : Al‑based composites * energy and angular filtering * advanced SEM
    https://icpmat2021.com/_files/200001189-a9feaa9fec/icpmat-2021-abstract-book.pdf
    Permanent Link: http://hdl.handle.net/11104/0327404

               
     
     
  6. 6.
    0552268 - ÚPT 2022 CZ eng A - Abstract
    Mikmeková, Šárka - Konvalina, Ivo - Müllerová, Ilona - Matsuda, K. - Ikeno, S.
    Prospect of advanced microscopy in material research.
    15th International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) expanded to Geo-Eerth Science & Civil Design / Engineering (ES&CDE). Abstract book. Institute of Scientific Instruments of the CAS: Brno, 2021. s. 88.
    [International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) /15./. 18.10.2021-19.10.2021, online]
    Institutional support: RVO:68081731
    Keywords : SEM * SLEEM * advanced steels * light metals
    https://icpmat2021.com/_files/200001189-a9feaa9fec/icpmat-2021-abstract-book.pdf
    Permanent Link: http://hdl.handle.net/11104/0327400

               
     
     
  7. 7.
    0551134 - ÚPT 2022 RIV US eng A - Abstract
    Materna-Mikmeková, Eliška - Konvalina, Ivo - Müllerová, Ilona - Lejeune, M. - Asefa, T.
    Treatment and Observation of Advanced Carbon-based Nanomaterials by Slow Electrons.
    Microscopy and Microanalysis. Cambridge University Press. Roč. 27, S2 (2020), s. 2682-2684. ISSN 1431-9276. E-ISSN 1435-8115
    Institutional support: RVO:68081731
    Keywords : carbon based nanomaterials * low energy electron microscopy * contamination * cleaning
    OECD category: Materials engineering
    https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/treatment-and-observation-of-advanced-carbonbased-nanomaterials-by-slow-electrons/6CE85FB178C91C6867E73A3AEBD6DE2D
    Permanent Link: http://hdl.handle.net/11104/0326579

               
     
     
  8. 8.
    0551132 - ÚPT 2022 RIV US eng A - Abstract
    Müllerová, Ilona - Konvalina, Ivo - Materna-Mikmeková, Eliška
    Methods of the electron induced cleanning in SEM.
    Microscopy and Microanalysis. Cambridge University Press. Roč. 27, S1 (2021), s. 2016-2017. ISSN 1431-9276. E-ISSN 1435-8115
    Institutional support: RVO:68081731
    Keywords : SEM * contamination * electron beam cleaning * graphene
    OECD category: Electrical and electronic engineering
    https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/methods-of-the-electron-induced-cleanning-in-sem/54D0340450B8B0BEA7DAD306BCE1C21B
    Permanent Link: http://hdl.handle.net/11104/0326577

               
     
     
  9. 9.
    0551131 - ÚPT 2022 RIV US eng A - Abstract
    Konvalina, Ivo - Zouhar, Martin - Daniel, Benjamin - Paták, Aleš - Piňos, Jakub - Frank, Luděk - Müllerová, Ilona - Materna-Mikmeková, Eliška
    The time-of-flight (ToF) analysis of transmitted electrons at energies of hundred of eV for pure elements.
    Microscopy and Microanalysis. Cambridge University Press. Roč. 27, S1 (2021), s. 612-615. ISSN 1431-9276. E-ISSN 1435-8115
    Institutional support: RVO:68081731
    Keywords : time of flight spectrometer * inelastic mean free path * energy loss spectrum * density functional theory
    OECD category: Electrical and electronic engineering
    https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/timeofflight-tof-analysis-of-transmitted-electrons-at-energies-of-hundred-of-ev-for-pure-elements/13DD7110753D4BB9830773B5B732F086
    Permanent Link: http://hdl.handle.net/11104/0326576

               
     
     
  10. 10.
    0540306 - ÚPT 2021 CZ eng A - Abstract
    Řiháček, Tomáš - Horák, M. - Schachinger, T. - Mika, Filip - Matějka, Milan - Fořt, Tomáš - Radlička, Tomáš - Novák, L. - Seďa, B. - McMorran, B.J. - Béché, A. - Verbeeck, J. - Müllerová, Ilona
    Electron vortex beams in the scanning electron microscope.
    Microscopy 2020. Praha: Československá mikroskopická společnost, 2020. s. 42.
    [Microscopy 2020. 06.10.2020-07.10.2020, Lednice]
    R&D Projects: GA TA ČR(CZ) TN01000008
    Institutional support: RVO:68081731
    Keywords : electron vortex beams * SEM
    OECD category: Electrical and electronic engineering
    Permanent Link: http://hdl.handle.net/11104/0317957

               
     
     

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