Search results
- 1.0552272 - ÚPT 2022 CZ eng A - Abstract
Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Piňos, Jakub - Průcha, Lukáš - Frank, Luděk - Müllerová, Ilona - Materna-Mikmeková, Eliška
Study of Graphene by a Time‑of‑Flight Spectrometer for Low Landing Energies.
15th International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) expanded to Geo-Eerth Science & Civil Design / Engineering (ES&CDE). Abstract book. Institute of Scientific Instruments of the CAS: Brno, 2021. s. 84.
[International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) /15./. 18.10.2021-19.10.2021, online]
Grant - others: AV ČR(CZ) StrategieAV21/6
Program: StrategieAV
Institutional support: RVO:68081731
Keywords : time‑of‑flight spectrometer * graphene * inelastic mean free path * energy‑loss spectrum * density‑functional theory
OECD category: Electrical and electronic engineering
https://icpmat2021.com/_files/200001189-a9feaa9fec/icpmat-2021-abstract-book.pdf
Permanent Link: http://hdl.handle.net/11104/0327405
- 2.0552271 - ÚPT 2022 CZ eng A - Abstract
Jozefovič, Patrik - Watanabe, S. - Matsuda, K. - Müllerová, Ilona - Mikmeková, Šárka
Characterization of Al‑based composites reinforced with CeNF by advanced SEM techniques.
15th International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) expanded to Geo-Eerth Science & Civil Design / Engineering (ES&CDE). Abstract book. Institute of Scientific Instruments of the CAS: Brno, 2021. s. 70.
[International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) /15./. 18.10.2021-19.10.2021, online]
Institutional support: RVO:68081731
Keywords : Al‑based composites * energy and angular filtering * advanced SEM
https://icpmat2021.com/_files/200001189-a9feaa9fec/icpmat-2021-abstract-book.pdf
Permanent Link: http://hdl.handle.net/11104/0327404
- 3.0552268 - ÚPT 2022 CZ eng A - Abstract
Mikmeková, Šárka - Konvalina, Ivo - Müllerová, Ilona - Matsuda, K. - Ikeno, S.
Prospect of advanced microscopy in material research.
15th International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) expanded to Geo-Eerth Science & Civil Design / Engineering (ES&CDE). Abstract book. Institute of Scientific Instruments of the CAS: Brno, 2021. s. 88.
[International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) /15./. 18.10.2021-19.10.2021, online]
Institutional support: RVO:68081731
Keywords : SEM * SLEEM * advanced steels * light metals
https://icpmat2021.com/_files/200001189-a9feaa9fec/icpmat-2021-abstract-book.pdf
Permanent Link: http://hdl.handle.net/11104/0327400
- 4.0551134 - ÚPT 2022 RIV US eng A - Abstract
Materna-Mikmeková, Eliška - Konvalina, Ivo - Müllerová, Ilona - Lejeune, M. - Asefa, T.
Treatment and Observation of Advanced Carbon-based Nanomaterials by Slow Electrons.
Microscopy and Microanalysis. Roč. 27, S2 (2020), s. 2682-2684. ISSN 1431-9276. E-ISSN 1435-8115
Institutional support: RVO:68081731
Keywords : carbon based nanomaterials * low energy electron microscopy * contamination * cleaning
OECD category: Materials engineering
https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/treatment-and-observation-of-advanced-carbonbased-nanomaterials-by-slow-electrons/6CE85FB178C91C6867E73A3AEBD6DE2D
Permanent Link: http://hdl.handle.net/11104/0326579
- 5.0551132 - ÚPT 2022 RIV US eng A - Abstract
Müllerová, Ilona - Konvalina, Ivo - Materna-Mikmeková, Eliška
Methods of the electron induced cleanning in SEM.
Microscopy and Microanalysis. Roč. 27, S1 (2021), s. 2016-2017. ISSN 1431-9276. E-ISSN 1435-8115
Institutional support: RVO:68081731
Keywords : SEM * contamination * electron beam cleaning * graphene
OECD category: Electrical and electronic engineering
https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/methods-of-the-electron-induced-cleanning-in-sem/54D0340450B8B0BEA7DAD306BCE1C21B
Permanent Link: http://hdl.handle.net/11104/0326577
- 6.0551131 - ÚPT 2022 RIV US eng A - Abstract
Konvalina, Ivo - Zouhar, Martin - Daniel, Benjamin - Paták, Aleš - Piňos, Jakub - Frank, Luděk - Müllerová, Ilona - Materna-Mikmeková, Eliška
The time-of-flight (ToF) analysis of transmitted electrons at energies of hundred of eV for pure elements.
Microscopy and Microanalysis. Roč. 27, S1 (2021), s. 612-615. ISSN 1431-9276. E-ISSN 1435-8115
Institutional support: RVO:68081731
Keywords : time of flight spectrometer * inelastic mean free path * energy loss spectrum * density functional theory
OECD category: Electrical and electronic engineering
https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/timeofflight-tof-analysis-of-transmitted-electrons-at-energies-of-hundred-of-ev-for-pure-elements/13DD7110753D4BB9830773B5B732F086
Permanent Link: http://hdl.handle.net/11104/0326576
- 7.0540306 - ÚPT 2021 CZ eng A - Abstract
Řiháček, Tomáš - Horák, M. - Schachinger, T. - Mika, Filip - Matějka, Milan - Fořt, Tomáš - Radlička, Tomáš - Novák, L. - Seďa, B. - McMorran, B.J. - Béché, A. - Verbeeck, J. - Müllerová, Ilona
Electron vortex beams in the scanning electron microscope.
Microscopy 2020. Praha: Československá mikroskopická společnost, 2020. s. 42.
[Microscopy 2020. 06.10.2020-07.10.2020, Lednice]
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : electron vortex beams * SEM
OECD category: Electrical and electronic engineering
Permanent Link: http://hdl.handle.net/11104/0317957
- 8.0536979 - ÚPT 2021 CZ eng A - Abstract
Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Piňos, Jakub - Radlička, Tomáš - Frank, Luděk - Müllerová, Ilona - Materna-Mikmeková, Eliška
Study of electron scattering phenomena of advanced materials by UHV SLEEM/ToF.
Microscopy 2020. Praha: Československá mikroskopická společnost, 2020. s. 95-96.
[Microscopy 2020. 06.10.2020-07.10.2020, Lednice]
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : electron scattering phenomena
OECD category: Electrical and electronic engineering
Permanent Link: http://hdl.handle.net/11104/0314731
- 9.0522221 - ÚPT 2020 US eng A - Abstract
Mikmeková, Šárka - Jánský, P. - Kolařík, V. - Müllerová, Ilona
Surface imaging with UHV SLEEM and SEM LEEM.
Microscopy and Microanalysis. Roč. 25, S2 (2019), s. 444-445. ISSN 1431-9276. E-ISSN 1435-8115.
[Microscopy & Microanalysis 2019 Meeting. 04.08.2019-08.08.2019, Portland]
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731
Keywords : surface imaging * UHV SLEEM * SEM LEEM
OECD category: Materials engineering
Permanent Link: http://hdl.handle.net/11104/0306716
- 10.0521251 - ÚPT 2020 DE eng A - Abstract
Vaškovicová, Naděžda - Nakamura, N. - Matsuda, K. - Mikmeková, Šárka - Müllerová, Ilona
Cathodoluminescence analysis of AlO2Sr4/Al.
Microscopy Conference: MC 2019. Abstracts. Berlin: DSE, 2019. s. 194-195.
[Microscopy Conference : MC 2019. 01.09.2019-05.09.2019, Berlin]
Institutional support: RVO:68081731
Keywords : strontium * nanophospors * BSE
OECD category: Nano-processes (applications on nano-scale)
https://www.microscopy-conference.de
Permanent Link: http://hdl.handle.net/11104/0305879