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Records found: 61  
Your query: Author Sysno/Doc.kind = "^cav_un_auth 0101598 za^"
  1. 1.
    0552272 - ÚPT 2022 CZ eng A - Abstract
    Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Piňos, Jakub - Průcha, Lukáš - Frank, Luděk - Müllerová, Ilona - Materna-Mikmeková, Eliška
    Study of Graphene by a Time‑of‑Flight Spectrometer for Low Landing Energies.
    15th International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) expanded to Geo-Eerth Science & Civil Design / Engineering (ES&CDE). Abstract book. Institute of Scientific Instruments of the CAS: Brno, 2021. s. 84.
    [International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) /15./. 18.10.2021-19.10.2021, online]
    Grant - others: AV ČR(CZ) StrategieAV21/6
    Program: StrategieAV
    Institutional support: RVO:68081731
    Keywords : time‑of‑flight spectrometer * graphene * inelastic mean free path * energy‑loss spectrum * density‑functional theory
    OECD category: Electrical and electronic engineering
    https://icpmat2021.com/_files/200001189-a9feaa9fec/icpmat-2021-abstract-book.pdf
    Permanent Link: http://hdl.handle.net/11104/0327405
     
     
  2. 2.
    0552271 - ÚPT 2022 CZ eng A - Abstract
    Jozefovič, Patrik - Watanabe, S. - Matsuda, K. - Müllerová, Ilona - Mikmeková, Šárka
    Characterization of Al‑based composites reinforced with CeNF by advanced SEM techniques.
    15th International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) expanded to Geo-Eerth Science & Civil Design / Engineering (ES&CDE). Abstract book. Institute of Scientific Instruments of the CAS: Brno, 2021. s. 70.
    [International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) /15./. 18.10.2021-19.10.2021, online]
    Institutional support: RVO:68081731
    Keywords : Al‑based composites * energy and angular filtering * advanced SEM
    https://icpmat2021.com/_files/200001189-a9feaa9fec/icpmat-2021-abstract-book.pdf
    Permanent Link: http://hdl.handle.net/11104/0327404
     
     
  3. 3.
    0552268 - ÚPT 2022 CZ eng A - Abstract
    Mikmeková, Šárka - Konvalina, Ivo - Müllerová, Ilona - Matsuda, K. - Ikeno, S.
    Prospect of advanced microscopy in material research.
    15th International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) expanded to Geo-Eerth Science & Civil Design / Engineering (ES&CDE). Abstract book. Institute of Scientific Instruments of the CAS: Brno, 2021. s. 88.
    [International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) /15./. 18.10.2021-19.10.2021, online]
    Institutional support: RVO:68081731
    Keywords : SEM * SLEEM * advanced steels * light metals
    https://icpmat2021.com/_files/200001189-a9feaa9fec/icpmat-2021-abstract-book.pdf
    Permanent Link: http://hdl.handle.net/11104/0327400
     
     
  4. 4.
    0551134 - ÚPT 2022 RIV US eng A - Abstract
    Materna-Mikmeková, Eliška - Konvalina, Ivo - Müllerová, Ilona - Lejeune, M. - Asefa, T.
    Treatment and Observation of Advanced Carbon-based Nanomaterials by Slow Electrons.
    Microscopy and Microanalysis. Roč. 27, S2 (2020), s. 2682-2684. ISSN 1431-9276. E-ISSN 1435-8115
    Institutional support: RVO:68081731
    Keywords : carbon based nanomaterials * low energy electron microscopy * contamination * cleaning
    OECD category: Materials engineering
    https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/treatment-and-observation-of-advanced-carbonbased-nanomaterials-by-slow-electrons/6CE85FB178C91C6867E73A3AEBD6DE2D
    Permanent Link: http://hdl.handle.net/11104/0326579
     
     
  5. 5.
    0551132 - ÚPT 2022 RIV US eng A - Abstract
    Müllerová, Ilona - Konvalina, Ivo - Materna-Mikmeková, Eliška
    Methods of the electron induced cleanning in SEM.
    Microscopy and Microanalysis. Roč. 27, S1 (2021), s. 2016-2017. ISSN 1431-9276. E-ISSN 1435-8115
    Institutional support: RVO:68081731
    Keywords : SEM * contamination * electron beam cleaning * graphene
    OECD category: Electrical and electronic engineering
    https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/methods-of-the-electron-induced-cleanning-in-sem/54D0340450B8B0BEA7DAD306BCE1C21B
    Permanent Link: http://hdl.handle.net/11104/0326577
     
     
  6. 6.
    0551131 - ÚPT 2022 RIV US eng A - Abstract
    Konvalina, Ivo - Zouhar, Martin - Daniel, Benjamin - Paták, Aleš - Piňos, Jakub - Frank, Luděk - Müllerová, Ilona - Materna-Mikmeková, Eliška
    The time-of-flight (ToF) analysis of transmitted electrons at energies of hundred of eV for pure elements.
    Microscopy and Microanalysis. Roč. 27, S1 (2021), s. 612-615. ISSN 1431-9276. E-ISSN 1435-8115
    Institutional support: RVO:68081731
    Keywords : time of flight spectrometer * inelastic mean free path * energy loss spectrum * density functional theory
    OECD category: Electrical and electronic engineering
    https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/timeofflight-tof-analysis-of-transmitted-electrons-at-energies-of-hundred-of-ev-for-pure-elements/13DD7110753D4BB9830773B5B732F086
    Permanent Link: http://hdl.handle.net/11104/0326576
     
     
  7. 7.
    0540306 - ÚPT 2021 CZ eng A - Abstract
    Řiháček, Tomáš - Horák, M. - Schachinger, T. - Mika, Filip - Matějka, Milan - Fořt, Tomáš - Radlička, Tomáš - Novák, L. - Seďa, B. - McMorran, B.J. - Béché, A. - Verbeeck, J. - Müllerová, Ilona
    Electron vortex beams in the scanning electron microscope.
    Microscopy 2020. Praha: Československá mikroskopická společnost, 2020. s. 42.
    [Microscopy 2020. 06.10.2020-07.10.2020, Lednice]
    R&D Projects: GA TA ČR(CZ) TN01000008
    Institutional support: RVO:68081731
    Keywords : electron vortex beams * SEM
    OECD category: Electrical and electronic engineering
    Permanent Link: http://hdl.handle.net/11104/0317957
     
     
  8. 8.
    0536979 - ÚPT 2021 CZ eng A - Abstract
    Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Piňos, Jakub - Radlička, Tomáš - Frank, Luděk - Müllerová, Ilona - Materna-Mikmeková, Eliška
    Study of electron scattering phenomena of advanced materials by UHV SLEEM/ToF.
    Microscopy 2020. Praha: Československá mikroskopická společnost, 2020. s. 95-96.
    [Microscopy 2020. 06.10.2020-07.10.2020, Lednice]
    R&D Projects: GA TA ČR(CZ) TN01000008
    Institutional support: RVO:68081731
    Keywords : electron scattering phenomena
    OECD category: Electrical and electronic engineering
    Permanent Link: http://hdl.handle.net/11104/0314731
     
     
  9. 9.
    0522221 - ÚPT 2020 US eng A - Abstract
    Mikmeková, Šárka - Jánský, P. - Kolařík, V. - Müllerová, Ilona
    Surface imaging with UHV SLEEM and SEM LEEM.
    Microscopy and Microanalysis. Roč. 25, S2 (2019), s. 444-445. ISSN 1431-9276. E-ISSN 1435-8115.
    [Microscopy & Microanalysis 2019 Meeting. 04.08.2019-08.08.2019, Portland]
    R&D Projects: GA TA ČR(CZ) TE01020118
    Institutional support: RVO:68081731
    Keywords : surface imaging * UHV SLEEM * SEM LEEM
    OECD category: Materials engineering
    Permanent Link: http://hdl.handle.net/11104/0306716
     
     
  10. 10.
    0521251 - ÚPT 2020 DE eng A - Abstract
    Vaškovicová, Naděžda - Nakamura, N. - Matsuda, K. - Mikmeková, Šárka - Müllerová, Ilona
    Cathodoluminescence analysis of AlO2Sr4/Al.
    Microscopy Conference: MC 2019. Abstracts. Berlin: DSE, 2019. s. 194-195.
    [Microscopy Conference : MC 2019. 01.09.2019-05.09.2019, Berlin]
    Institutional support: RVO:68081731
    Keywords : strontium * nanophospors * BSE
    OECD category: Nano-processes (applications on nano-scale)
    https://www.microscopy-conference.de
    Permanent Link: http://hdl.handle.net/11104/0305879