Search results
- 1.0507068 - ÚPT 2020 RIV GB eng C - Conference Paper (international conference)
Fojtíková, P. - Sázavská, V. - Mika, Filip - Krčma, F.
Effect of Hydrogen Plasma on Model Corrosion Layers of Bronze.
5th International Workshop and Summer School on Plasma Physics (IWSSPP). Proceedeings. Vol. 715. Bristol: IOP, 2016, č. článku 012006. ISSN 1742-6588.
[International Workshop and Summer School on Plasma Physics (IWSSPP) /5./. Kiten (BG), 25.06.2012-30.06.2012]
Institutional support: RVO:68081731
Keywords : hydrogen plasma * layers of bronze
OECD category: Coating and films
Permanent Link: http://hdl.handle.net/11104/0298343
- 2.0494374 - ÚPT 2019 RIV CZ eng C - Conference Paper (international conference)
Rodenburg, C. - Masters, R. - Abrams, K. - Dapor, M. - Krátký, Stanislav - Mika, Filip
Secondary electron hyper spectral imaging in helios nanolab - mapping materials properties or artefacts?
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 68-69. ISBN 978-80-87441-23-7.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
Institutional support: RVO:68081731
Keywords : secondary electrons * polymers * hyperspectral imaging
OECD category: Coating and films
Permanent Link: http://hdl.handle.net/11104/0288492
- 3.0494373 - ÚPT 2019 RIV CZ eng C - Conference Paper (international conference)
Řiháček, Tomáš - Horák, M. - Schachinger, T. - Matějka, Milan - Mika, Filip - Müllerová, Ilona
Creation of electron vortex beams using the holographic reconstruction method in a scanning electron microscope.
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 66-67. ISBN 978-80-87441-23-7.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠk(CZ) LO1212; GA MŠk ED0017/01/01
Institutional support: RVO:68081731
Keywords : electron vortex beams * scanning electron microscopy * electron diffraction
OECD category: Nano-materials (production and properties)
Permanent Link: http://hdl.handle.net/11104/0287630
- 4.0494367 - ÚPT 2019 RIV CZ eng C - Conference Paper (international conference)
Mika, Filip - Pokorná, Zuzana - Konvalina, Ivo - Khursheed, A.
Possibilites of a secondary electrons bandpass filter for standard SEM.
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 46-47. ISBN 978-80-87441-23-7.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
R&D Projects: GA MŠk(CZ) LO1212; GA MŠk ED0017/01/01
Institutional support: RVO:68081731
Keywords : secondary electron * filtering * imaging
OECD category: Coating and films
Permanent Link: http://hdl.handle.net/11104/0288493
- 5.0494365 - ÚPT 2019 RIV CZ eng C - Conference Paper (international conference)
Konvalina, Ivo - Paták, Aleš - Mikmeková, Eliška - Mika, Filip - Müllerová, Ilona
STEM modes in SEM.
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 40-41. ISBN 978-80-87441-23-7.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠk(CZ) LO1212; GA MŠk ED0017/01/01
Institutional support: RVO:68081731
Keywords : SEM * STEM
OECD category: Electrical and electronic engineering
Permanent Link: http://hdl.handle.net/11104/0287599
- 6.0494364 - ÚPT 2019 RIV CZ eng C - Conference Paper (international conference)
Horáček, Miroslav - Knápek, Alexandr - Matějka, Milan - Krátký, Stanislav - Urbánek, M. - Mika, Filip - Kolařík, Vladimír
Hiding e-beam exposure fields by deterministic 2D pattering.
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 36-37. ISBN 978-80-87441-23-7.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
R&D Projects: GA TA ČR TE01020233; GA TA ČR TG03010046; GA MŠk(CZ) LO1212; GA MŠk ED0017/01/01
Institutional support: RVO:68081731
Keywords : phyllotaxis * electron beam lithography
OECD category: Optics (including laser optics and quantum optics)
Permanent Link: http://hdl.handle.net/11104/0287595
- 7.0482751 - ÚPT 2018 RIV CZ cze C - Conference Paper (international conference)
Horáček, Miroslav - Meluzín, Petr - Krátký, Stanislav - Knápek, Alexandr - Mika, Filip - Chlumská, Jana - Matějka, František - Král, Stanislav - Brunn, Ondřej - Giričová, D. - Kopal, Jaroslav - Kolařík, Vladimír
Deterministicky aperiodické obrazové zařízení.
[Deterministic Aperiodic Image Device.]
Sborník příspěvků multioborové konference LASER57. Brno: Ústav přístrojové techniky AV ČR, 2017 - (Růžička, B.), s. 34-35. ISBN 978-80-87441-21-3.
[LASER57. Třešť (CZ), 08.11.2017-10.11.2017]
R&D Projects: GA MŠk(CZ) LO1212; GA MŠk ED0017/01/01; GA TA ČR TE01020233; GA TA ČR(CZ) TG03010046; GA MPO(CZ) FV10618
Institutional support: RVO:68081731
Keywords : e–beam lithography * diffractive optically variable image device
OECD category: Nano-processes (applications on nano-scale)
Permanent Link: http://hdl.handle.net/11104/0278201
- 8.0481585 - ÚPT 2018 RIV HR eng C - Conference Paper (international conference)
Konvalina, Ivo - Paták, Aleš - Mika, Filip - Müllerová, Ilona
STEM modes in SEM – simulations and experiments.
13th Multinational Congress on Microscopy: Book of Abstracts. Zagreb: Ruder Bošković Institute, Croatian Microscopy Society, 2017 - (Gajović, A.; Weber, I.; Kovačević, G.; Čadež, V.; Šegota, S.; Peharec Štefanić, P.; Vidoš, A.), s. 140-141. ISBN 978-953-7941-19-2.
[Multinational Congress on Microscopy /13./. Rovinj (HR), 24.09.2017-29.09.2017]
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731
Keywords : STEM detector * trajectory simulations * cathode lens * collection efficiency
OECD category: Electrical and electronic engineering
Permanent Link: http://hdl.handle.net/11104/0277129
- 9.0464578 - ÚPT 2020 RIV US eng C - Conference Paper (international conference)
Šikula, J. - Grmela, L. - Bartlová, M. - Kuparowitz, T. - Knápek, Alexandr - Mika, Filip
Noise of Low-Energy Electron Beam.
2015 International Conference on Noise and Fluctuations (ICNF) (Proceedings IEEE). Piscataway: IEEE, 2015. ISBN 978-1-4673-8335-6.
[International Conference on Noise and Fluctuations (ICNF) /23./. Xi’an (CN), 02.06.2015-06.06.2015]
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731
Keywords : thermal-emission cathode * electronic noise * loe-energy electron beam
OECD category: Electrical and electronic engineering
Permanent Link: http://hdl.handle.net/11104/0263430
- 10.0460213 - ÚPT 2017 RIV CZ eng C - Conference Paper (international conference)
Šiler, Martin - Brzobohatý, Oto - Chvátal, Lukáš - Karásek, Vítězslav - Paták, Aleš - Pokorná, Zuzana - Mika, Filip - Zemánek, Pavel
Golden nanoparticle in optical tweezers: influence of shape and orientation on optical trapping.
Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016 - (Mika, F.), s. 64-65. ISBN 978-80-87441-17-6.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./. Skalský dvůr (CZ), 29.05.2016-03.06.2016]
R&D Projects: GA ČR GB14-36681G
Institutional support: RVO:68081731
Keywords : NPs * plasmon resonance
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://www.trends.isibrno.cz/
Permanent Link: http://hdl.handle.net/11104/0260345