Search results
- 1.0540306 - ÚPT 2021 CZ eng A - Abstract
Řiháček, Tomáš - Horák, M. - Schachinger, T. - Mika, Filip - Matějka, Milan - Fořt, Tomáš - Radlička, Tomáš - Novák, L. - Seďa, B. - McMorran, B.J. - Béché, A. - Verbeeck, J. - Müllerová, Ilona
Electron vortex beams in the scanning electron microscope.
Microscopy 2020. Praha: Československá mikroskopická společnost, 2020. s. 42.
[Microscopy 2020. 06.10.2020-07.10.2020, Lednice]
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : electron vortex beams * SEM
OECD category: Electrical and electronic engineering
Permanent Link: http://hdl.handle.net/11104/0317957 - 2.0511327 - ÚPT 2020 SK eng A - Abstract
Mika, Filip - Švarcová, Silvie - Pokorná, Zuzana - Hradil, David
Secondary electron hyperspectral imaging for the study of degradation processes in paintings.
7th Interdisciplinary ALMA Conference. Book of Abstracts. Bratislava: Slovak University of Technology, 2019. s. 72-73.
[Interdisciplinary ALMA Conference /7./. 16.10.2019-18.10.2019, Bratislava]
Grant - others:AV ČR(CZ) StrategieAV21/6
Program: StrategieAV
Institutional support: RVO:68081731 ; RVO:61388980
Keywords : secondary electron * hyperspectral imaging
OECD category: Coating and films
Permanent Link: http://hdl.handle.net/11104/0301628 - 3.0510323 - ÚPT 2020 DE eng A - Abstract
Řiháček, Tomáš - Mika, Filip - Horák, M. - Schachinger, T. - Matějka, Milan - Krátký, Stanislav - Müllerová, Ilona
Creation and detection of electron vortex beams in a scanning electron microscope.
Microscopy Conference: MC 2019. Abstracts. Berlin: DSE, 2019. s. 409-410.
[Microscopy Conference : MC 2019. 01.09.2019-05.09.2019, Berlin]
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : detection of electron vortex beams * SEM
OECD category: Nano-materials (production and properties)
https://www.microscopy-conference.de
Permanent Link: http://hdl.handle.net/11104/0300832 - 4.0482158 - ÚPT 2018 AT eng A - Abstract
Mika, Filip - Konvalina, Ivo
Application of the Bandpass Filter for Secondary Electrons in SEM.
Sources, Interaction with Matter, Detection and Analysis of Low Energy Electrons (SIMDALEE2017). Book of Abstracts. Wien: Technische Universitaet Wien, 2017. s. 72.
[SIMDALEE2017. Sources, Interaction with Matter, Detection and Analysis of Low Energy Electrons. 18.09.2017-22.09.2017, Pula]
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : bandpass filter * secondary electrons * SEM
OECD category: Coating and films
Permanent Link: http://hdl.handle.net/11104/0277553 - 5.0456254 - ÚPT 2016 CZ eng A - Abstract
Walker, Christopher - Mika, Filip - Konvalina, Ivo - Müllerová, Ilona - Frank, Luděk
Experiments and simulations of electron transport in materials.
Mikroskopie 2015. Praha: Československá mikroskopická společnost, 2015. s. 23-24.
[Mikroskopie 2015. 12.05.2015-13.05.2015, Lednice]
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : electron transport in materials
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0256812 - 6.0452656 - ÚPT 2016 AT eng A - Abstract
Walker, Christopher - Mika, Filip - Konvalina, Ivo - Müllerová, Ilona - Frank, Luděk
Experiment-Simulation comparison of the transmission of electrons through thin films in an SEM with a STEM Detector.
Low Energy Electrons: Dynamics and Correlation near Surfaces and Nanostructures (LEE2015). Vienna: IAP, 2015. s. 45.
[Low Energy Electrons: Dynamics and Correlation near Surfaces and Nanostructures (LEE2015). 07.09.2015-11.09.2015, Herstein]
R&D Projects: GA MŠMT(CZ) LO1212
Institutional support: RVO:68081731
Keywords : SEM * STEM detector * Monte-Carlo simulations
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0257883 - 7.0431334 - ÚPT 2015 CZ eng A - Abstract
Mika, Filip - Konvalina, Ivo - Walker, Christopher
Imaging with STEM detector, experiments vs. simulation.
9th International Conference on Charged Particle Optics. Book of Abstracts. Brno: Institute of Scientific Instruments AS CR, v. v. i, 2014. s. 64. ISBN 978-80-87441-11-4.
[International Conference on Charged Parrticle Optics /9./. 31.08.2014-05.09.2014, Brno]
R&D Projects: GA TA ČR TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : STEM * Monte-Carlo simulations * transmitted electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0236395 - 8.0430312 - ÚPT 2015 DE eng A - Abstract
Knápek, Alexandr - Mika, Filip - Prášek, J. - Majzlíková, P.
SEM Characterization of Carbon Nanotubes Based Active Layers of Chemical Sensors.
ISSE 2014. 37th International Spring Seminar on Electronics Technology: Advances in Electronic System Integration. Book of Abstracts. Dresden: Verlag Dr. Markus A. Deter, 2014. s. 166-167. ISBN 978-3-934142-49-7.
[International Spring Seminar on Electronics Technology /37./: Advances in Electronic system Integration. 07.05.2014-11.05.2014, Dresden]
R&D Projects: GA MŠMT(CZ) LO1212; GA MŠMT EE.2.3.20.0103
Institutional support: RVO:68081731
Keywords : SEM * MWCNT based working electrode * surface characterization
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0235372 - 9.0335497 - ÚPT 2010 CZ eng A - Abstract
Hovorka, Miloš - Mika, Filip - Frank, Luděk
Profiling N-Type Dopants in Silicon Structures.
Mikroskopia 2009. Brno: Tribun EU, 2009. s. 25. ISBN 978-80-7399-739-7.
[Mikroskopia 2009. 25.03.2009-26.03.2009, Stará Lesná]
R&D Projects: GA ČR GP102/09/P543; GA AV ČR IAA100650803
Institutional research plan: CEZ:AV0Z20650511
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0179946 - 10.0109076 - UPT-D 20040079 CZ cze A - Abstract
Mika, Filip - Ryšávka, J. - Lopour, F. - Zadražil, M. - Müllerová, Ilona - Frank, Luděk
Nízkoenergiový SEM řízený počítačem.
[Low energy SEM controlled by computer.]
Mikroskopie 2004 - Přednášky. Brno: Československá mikroskopická společnost, 2004. s. 32.
[Mikroskopie 2004. 11.03.2004-12.03.2004, Nové Město na Moravě]
Institutional research plan: CEZ:AV0Z2065902
Keywords : Low energy SEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0016188