Search results

  1. 1.
    0540306 - ÚPT 2021 CZ eng A - Abstract
    Řiháček, Tomáš - Horák, M. - Schachinger, T. - Mika, Filip - Matějka, Milan - Fořt, Tomáš - Radlička, Tomáš - Novák, L. - Seďa, B. - McMorran, B.J. - Béché, A. - Verbeeck, J. - Müllerová, Ilona
    Electron vortex beams in the scanning electron microscope.
    Microscopy 2020. Praha: Československá mikroskopická společnost, 2020. s. 42.
    [Microscopy 2020. 06.10.2020-07.10.2020, Lednice]
    R&D Projects: GA TA ČR(CZ) TN01000008
    Institutional support: RVO:68081731
    Keywords : electron vortex beams * SEM
    OECD category: Electrical and electronic engineering
    Permanent Link: http://hdl.handle.net/11104/0317957
     
     
  2. 2.
    0511327 - ÚPT 2020 SK eng A - Abstract
    Mika, Filip - Švarcová, Silvie - Pokorná, Zuzana - Hradil, David
    Secondary electron hyperspectral imaging for the study of degradation processes in paintings.
    7th Interdisciplinary ALMA Conference. Book of Abstracts. Bratislava: Slovak University of Technology, 2019. s. 72-73.
    [Interdisciplinary ALMA Conference /7./. 16.10.2019-18.10.2019, Bratislava]
    Grant - others: AV ČR(CZ) StrategieAV21/6
    Program: StrategieAV
    Institutional support: RVO:68081731 ; RVO:61388980
    Keywords : secondary electron * hyperspectral imaging
    OECD category: Coating and films
    Permanent Link: http://hdl.handle.net/11104/0301628
     
     
  3. 3.
    0510323 - ÚPT 2020 DE eng A - Abstract
    Řiháček, Tomáš - Mika, Filip - Horák, M. - Schachinger, T. - Matějka, Milan - Krátký, Stanislav - Müllerová, Ilona
    Creation and detection of electron vortex beams in a scanning electron microscope.
    Microscopy Conference: MC 2019. Abstracts. Berlin: DSE, 2019. s. 409-410.
    [Microscopy Conference : MC 2019. 01.09.2019-05.09.2019, Berlin]
    R&D Projects: GA TA ČR(CZ) TN01000008
    Institutional support: RVO:68081731
    Keywords : detection of electron vortex beams * SEM
    OECD category: Nano-materials (production and properties)
    https://www.microscopy-conference.de
    Permanent Link: http://hdl.handle.net/11104/0300832
     
     
  4. 4.
    0482158 - ÚPT 2018 AT eng A - Abstract
    Mika, Filip - Konvalina, Ivo
    Application of the Bandpass Filter for Secondary Electrons in SEM.
    Sources, Interaction with Matter, Detection and Analysis of Low Energy Electrons (SIMDALEE2017). Book of Abstracts. Wien: Technische Universitaet Wien, 2017. s. 72.
    [SIMDALEE2017. Sources, Interaction with Matter, Detection and Analysis of Low Energy Electrons. 18.09.2017-22.09.2017, Pula]
    R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠk(CZ) LO1212; GA MŠk ED0017/01/01
    Institutional support: RVO:68081731
    Keywords : bandpass filter * secondary electrons * SEM
    OECD category: Coating and films
    Permanent Link: http://hdl.handle.net/11104/0277553
     
     
  5. 5.
    0456254 - ÚPT 2016 CZ eng A - Abstract
    Walker, Christopher - Mika, Filip - Konvalina, Ivo - Müllerová, Ilona - Frank, Luděk
    Experiments and simulations of electron transport in materials.
    Mikroskopie 2015. Praha: Československá mikroskopická společnost, 2015. s. 23-24.
    [Mikroskopie 2015. 12.05.2015-13.05.2015, Lednice]
    R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠk(CZ) LO1212; GA MŠk ED0017/01/01
    Institutional support: RVO:68081731
    Keywords : electron transport in materials
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0256812
     
     
  6. 6.
    0452656 - ÚPT 2016 AT eng A - Abstract
    Walker, Christopher - Mika, Filip - Konvalina, Ivo - Müllerová, Ilona - Frank, Luděk
    Experiment-Simulation comparison of the transmission of electrons through thin films in an SEM with a STEM Detector.
    Low Energy Electrons: Dynamics and Correlation near Surfaces and Nanostructures (LEE2015). Vienna: IAP, 2015. s. 45.
    [Low Energy Electrons: Dynamics and Correlation near Surfaces and Nanostructures (LEE2015). 07.09.2015-11.09.2015, Herstein]
    R&D Projects: GA MŠk(CZ) LO1212
    Institutional support: RVO:68081731
    Keywords : SEM * STEM detector * Monte-Carlo simulations
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0257883
     
     
  7. 7.
    0431334 - ÚPT 2015 CZ eng A - Abstract
    Mika, Filip - Konvalina, Ivo - Walker, Christopher
    Imaging with STEM detector, experiments vs. simulation.
    9th International Conference on Charged Particle Optics. Book of Abstracts. Brno: Institute of Scientific Instruments AS CR, v. v. i, 2014. s. 64. ISBN 978-80-87441-11-4.
    [International Conference on Charged Parrticle Optics /9./. 31.08.2014-05.09.2014, Brno]
    R&D Projects: GA TA ČR TE01020118; GA MŠk(CZ) LO1212; GA MŠk ED0017/01/01
    Institutional support: RVO:68081731
    Keywords : STEM * Monte-Carlo simulations * transmitted electrons
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0236395
     
     
  8. 8.
    0430312 - ÚPT 2015 DE eng A - Abstract
    Knápek, Alexandr - Mika, Filip - Prášek, J. - Majzlíková, P.
    SEM Characterization of Carbon Nanotubes Based Active Layers of Chemical Sensors.
    ISSE 2014. 37th International Spring Seminar on Electronics Technology: Advances in Electronic System Integration. Book of Abstracts. Dresden: Verlag Dr. Markus A. Deter, 2014. s. 166-167. ISBN 978-3-934142-49-7.
    [International Spring Seminar on Electronics Technology /37./: Advances in Electronic system Integration. 07.05.2014-11.05.2014, Dresden]
    R&D Projects: GA MŠk(CZ) LO1212; GA MŠk EE.2.3.20.0103
    Institutional support: RVO:68081731
    Keywords : SEM * MWCNT based working electrode * surface characterization
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0235372
     
     
  9. 9.
    0335497 - ÚPT 2010 CZ eng A - Abstract
    Hovorka, Miloš - Mika, Filip - Frank, Luděk
    Profiling N-Type Dopants in Silicon Structures.
    Mikroskopia 2009. Brno: Tribun EU, 2009. s. 25. ISBN 978-80-7399-739-7.
    [Mikroskopia 2009. 25.03.2009-26.03.2009, Stará Lesná]
    R&D Projects: GA ČR GP102/09/P543; GA AV ČR IAA100650803
    Institutional research plan: CEZ:AV0Z20650511
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0179946
     
     
  10. 10.
    0109076 - UPT-D 20040079 CZ cze A - Abstract
    Mika, Filip - Ryšávka, J. - Lopour, F. - Zadražil, M. - Müllerová, Ilona - Frank, Luděk
    Nízkoenergiový SEM řízený počítačem.
    [Low energy SEM controlled by computer.]
    Mikroskopie 2004 - Přednášky. Brno: Československá mikroskopická společnost, 2004. s. 32.
    [Mikroskopie 2004. 11.03.2004-12.03.2004, Nové Město na Moravě]
    Institutional research plan: CEZ:AV0Z2065902
    Keywords : Low energy SEM
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0016188