Search results
- 1.0588543 - ÚPT 2025 RIV NL eng J - Journal Article
Materna Mikmeková, Eliška - Materna, J. - Konvalina, Ivo - Mikmeková, Šárka - Müllerová, Ilona - Asefa, T.
A soft touch with electron beams: Digging out structural information of nanomaterials with advanced scanning low energy electron microscopy coupled with deep learning.
Ultramicroscopy. Roč. 262, August (2024), č. článku 113965. ISSN 0304-3991. E-ISSN 1879-2723
R&D Projects: GA ČR(CZ) GA22-34286S
Grant - others:AV ČR(CZ) LQ100652201; AV ČR(CZ) StrategieAV21/26
Program: Prémie Lumina quaeruntur; StrategieAV
Institutional support: RVO:68081731
Keywords : Scanning low energy electron microscopy * Deep learning * Mesoporous silica
Impact factor: 2.1, year: 2023
Method of publishing: Limited access
https://www.sciencedirect.com/science/article/pii/S0304399124000445
Permanent Link: https://hdl.handle.net/11104/0355407 - 2.0588163 - ÚPT 2025 RIV JO eng J - Journal Article
Pokorná, Zuzana - Knápek, Alexandr - Mika, Filip - Chlumská, Jana - Konvalina, Ivo - Walker, C. G. H. - Jaber, A. M. D.
Determination of Crystallographic Information by Means of Very Low Energy Electron Imaging.
Jordan Journal of Physics. Roč. 17, č. 2 (2024), s. 233-244. ISSN 1994-7607. E-ISSN 1994-7615
Institutional support: RVO:68081731
Keywords : SLEEM * LEEM * Very low energy electrons * Crystallographic orientation
OECD category: Electrical and electronic engineering
Impact factor: 0.5, year: 2023
https://jjp.yu.edu.jo/index.php/jjp/article/view/336/93
Permanent Link: https://hdl.handle.net/11104/0355166 - 3.0551125 - ÚPT 2023 RIV CH eng J - Journal Article
Konvalina, Ivo - Paták, Aleš - Zouhar, Martin - Müllerová, Ilona - Fořt, Tomáš - Unčovský, M. - Materna Mikmeková, Eliška
Quantification of stem images in high resolution sem for segmented and pixelated detectors.
Nanomaterials. Roč. 12, č. 1 (2022), č. článku 71. ISSN 2079-4991. E-ISSN 2079-4991
R&D Projects: GA TA ČR(CZ) TN01000008
Grant - others:AV ČR(CZ) StrategieAV21/6
Program: StrategieAV
Institutional support: RVO:68081731
Keywords : STEM segmented detector * pixelated detector * scanning electron microscopy * Monte Carlo simulations * ray tracing * quantitative imaging
OECD category: Electrical and electronic engineering
Impact factor: 5.3, year: 2022
Method of publishing: Open access
https://www.mdpi.com/2079-4991/12/1/71
Permanent Link: http://hdl.handle.net/11104/0326569 - 4.0546409 - ÚPT 2022 RIV CH eng J - Journal Article
Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Müllerová, Ilona - Frank, Luděk - Piňos, Jakub - Průcha, Lukáš - Radlička, Tomáš - Werner, W. S. M. - Mikmeková, Eliška
Low-energy electron inelastic mean free path of graphene measured by a time-of-flight spectrometer.
Nanomaterials. Roč. 11, č. 9 (2021), č. článku 2435. ISSN 2079-4991. E-ISSN 2079-4991
R&D Projects: GA TA ČR(CZ) TN01000008
Grant - others:AV ČR(CZ) StrategieAV21/6
Program: StrategieAV
Institutional support: RVO:68081731
Keywords : time-of-flight spectrometer * inelastic mean free path * density-functional theory * many-body perturbation theory * energy-loss spectrum * density of states * band structure * graphene
OECD category: Electrical and electronic engineering
Impact factor: 5.719, year: 2021
Method of publishing: Open access
https://www.mdpi.com/2079-4991/11/9/2435
Permanent Link: http://hdl.handle.net/11104/0322930
Research data: Zenodo - 5.0544223 - ÚPT 2022 RIV US eng J - Journal Article
Ma, Haili - Mikmeková, Šárka - Konvalina, Ivo - Yin, X. - Sun, F. - Piňos, Jakub - Vaškovicová, Naděžda - Průcha, Lukáš - Müllerová, Ilona - Mikmeková, Eliška - Chen, D.
Imaging ferroelectric nanodomains in strained BiFeO3 nanoscale films using scanning low-energy electron microscopy: Implications for low-power devices.
ACS Applied Nano Materials. Roč. 4, č. 4 (2021), s. 3725-3733. ISSN 2574-0970. E-ISSN 2574-0970
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : scanning low-energy electron microscopy (SLEEM) * BiFeO3 nanoscale films * ferroelectric nanodomains * low-loss backscattered electrons * multiferroic
OECD category: Electrical and electronic engineering
Impact factor: 6.140, year: 2021
Method of publishing: Limited access
https://pubs.acs.org/doi/10.1021/acsanm.1c00204
Permanent Link: http://hdl.handle.net/11104/0321265 - 6.0536755 - ÚPT 2021 RIV US eng J - Journal Article
Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Piňos, Jakub - Radlička, Tomáš - Frank, Luděk - Müllerová, Ilona - Materna Mikmeková, Eliška
Very Low Energy Electron Transmission Spectroscopy of 2D Materials.
Microscopy and Microanalysis. Roč. 26, S2 (2020), s. 2636-2638. ISSN 1431-9276. E-ISSN 1435-8115
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : spectroscopy * very low energy electron transmission * 2D materials
OECD category: Electrical and electronic engineering
Impact factor: 4.127, year: 2020
Method of publishing: Open access
https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/very-low-energy-electron-transmission-spectroscopy-of-2d-materials/2F6DF5F745E2CCA1AFA45F451D68BD41
Permanent Link: http://hdl.handle.net/11104/0314644 - 7.0525529 - ÚPT 2021 RIV NL eng J - Journal Article
Materna Mikmeková, Eliška - Müllerová, Ilona - Frank, Luděk - Paták, Aleš - Polčák, J. - Sluyterman, S. - Lejeune, M. - Konvalina, Ivo
Low-energy electron microscopy of graphene outside UHV: electron-induced removal of PMMA residues used for graphene transfer.
Journal of Electron Spectroscopy and Related Phenomena. Roč. 241, MAY (2020), č. článku 146873. ISSN 0368-2048. E-ISSN 1873-2526
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
EU Projects: European Commission(XE) 606988 - SIMDALEE2
Institutional support: RVO:68081731
Keywords : graphene * PMMA * slow electron treatment * XPS * Raman spectroscopy
OECD category: Electrical and electronic engineering
Impact factor: 1.957, year: 2020
Method of publishing: Open access
https://www.sciencedirect.com/science/article/pii/S0368204818302068
Permanent Link: http://hdl.handle.net/11104/0309642 - 8.0510248 - ÚPT 2020 RIV US eng J - Journal Article
Abrams, K.J. - Dapor, M. - Stehling, N. - Azzolini, M. - Kyle, S.J. - Schäfer, J.S. - Quade, A. - Mika, Filip - Krátký, Stanislav - Pokorná, Zuzana - Konvalina, Ivo - Mehta, D. - Black, K. - Rodenburg, C.
Making Sense of Complex Carbon and Metal/Carbon Systems by Secondary Electron Hyperspectral Imaging.
Advanced Science. Roč. 6, č. 19 (2019), č. článku 1900719. ISSN 2198-3844. E-ISSN 2198-3844
R&D Projects: GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : carbon orientations * carbon surface analysis * characterization * modeling * secondary electron emission * secondary electron hyperspectral imaging * secondary electron spectroscopy
OECD category: Coating and films
Impact factor: 15.840, year: 2019
Method of publishing: Open access
https://onlinelibrary.wiley.com/doi/full/10.1002/advs.201900719
Permanent Link: http://hdl.handle.net/11104/0300765 - 9.0508751 - ÚPT 2020 RIV CH eng J - Journal Article
Konvalina, Ivo - Mika, Filip - Krátký, Stanislav - Materna Mikmeková, Eliška - Müllerová, Ilona
In-Lens Band-Pass Filter for Secondary Electrons in Ultrahigh Resolution SEM.
Materials. Roč. 12, č. 14 (2019), č. článku 2307. ISSN 1996-1944. E-ISSN 1996-1944
R&D Projects: GA TA ČR(CZ) TE01020118; GA TA ČR TE01020233; GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : band-pass filter of signal electrons * SE detection * trajectory simulations
OECD category: Electrical and electronic engineering
Impact factor: 3.057, year: 2019
Method of publishing: Open access
https://www.mdpi.com/1996-1944/12/14/2307/htm
Permanent Link: http://hdl.handle.net/11104/0299576 - 10.0489596 - ÚPT 2019 RIV NL eng J - Journal Article
Walker, Christopher - Konvalina, Ivo - Mika, Filip - Frank, Luděk - Müllerová, Ilona
Quantitative comparison of simulated and measured signals in the STEM mode of a SEM.
Nuclear Instruments & Methods in Physics Research Section B. Roč. 415, JAN (2018), s. 17-24. ISSN 0168-583X. E-ISSN 1872-9584
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
EU Projects: European Commission(XE) 606988 - SIMDALEE2
Institutional support: RVO:68081731
Keywords : low-energy electrons * multiple scattering * elastic-scattering * transmission
OECD category: Coating and films
Impact factor: 1.210, year: 2018
Permanent Link: http://hdl.handle.net/11104/0283980