Search results

0494380 - ÚPT 2019 RIV CZ eng C - Conference Paper (international conference)
Zouhar, Martin - Radlička, Tomáš - Oral, Martin - Konvalina, Ivo
Inelastic mean free path from raw data measured by low-energy electrons time-of-flight spectrometer.
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 86-87. ISBN 978-80-87441-23-7.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731
Keywords : electron microscopy * time of flight * inelastic mean free path * low energy
OECD category: Atomic, molecular and chemical physics (physics of atoms and molecules including collision, interaction with radiation, magnetic resonances, Mössbauer effect)
Permanent Link: http://hdl.handle.net/11104/0287642

0494365 - ÚPT 2019 RIV CZ eng C - Conference Paper (international conference)
Konvalina, Ivo - Paták, Aleš - Mikmeková, Eliška - Mika, Filip - Müllerová, Ilona
STEM modes in SEM.
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 40-41. ISBN 978-80-87441-23-7.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : SEM * STEM
OECD category: Electrical and electronic engineering
Permanent Link: http://hdl.handle.net/11104/0287599

0481585 - ÚPT 2018 RIV HR eng C - Conference Paper (international conference)
Konvalina, Ivo - Paták, Aleš - Mika, Filip - Müllerová, Ilona
STEM modes in SEM – simulations and experiments.
13th Multinational Congress on Microscopy: Book of Abstracts. Zagreb: Ruder Bošković Institute, Croatian Microscopy Society, 2017 - (Gajović, A.; Weber, I.; Kovačević, G.; Čadež, V.; Šegota, S.; Peharec Štefanić, P.; Vidoš, A.), s. 140-141. ISBN 978-953-7941-19-2.
[Multinational Congress on Microscopy /13./. Rovinj (HR), 24.09.2017-29.09.2017]
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731
Keywords : STEM detector * trajectory simulations * cathode lens * collection efficiency
OECD category: Electrical and electronic engineering
Permanent Link: http://hdl.handle.net/11104/0277129

0460205 - ÚPT 2017 RIV CZ eng C - Conference Paper (international conference)
Mika, Filip - Konvalina, Ivo - Krátký, Stanislav - Müllerová, Ilona
Bandpass filter for secondary electrons in SEM - experiments.
Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016 - (Mika, F.), s. 36-37. ISBN 978-80-87441-17-6.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./. Skalský dvůr (CZ), 29.05.2016-03.06.2016]
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : electron microscopy * TLD
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://www.trends.isibrno.cz/
Permanent Link: http://hdl.handle.net/11104/0260337

0450822 - ÚPT 2016 RIV HU eng C - Conference Paper (international conference)
Pokorná, Zuzana - Frank, Luděk - Knápek, Alexandr - Konvalina, Ivo - Mikmeková, Eliška - Mikmeková, Šárka - Walker, Christopher - Müllerová, Ilona
Scanning low-and very low energy electron microscopy.
12th Multinational Congress on Microscopy. Budapest: Akadémiai Kiadó, 2015, s. 218-220. ISBN 978-963-05-9653-4.
[MCM 2015. Multinational Congress on Microscopy /12./. Eger (HU), 23.08.2015-28.08.2015]
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731
Keywords : very low energy * scanning low energy electron microscopy * crystallography, graphene * tissue sections
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0252034