Search results
- 1.0575427 - ÚPT 2024 RIV GB eng A - Abstract
Müllerová, Ilona - Konvalina, Ivo - Zouhar, Martin - Paták, Aleš - Daniel, Benjamin - Průcha, Lukáš - Piňos, Jakub - Materna-Mikmeková, Eliška
Study of Graphene by Scanning Low Energy Electron Microscopy and Time-of-Flight Spectroscopy.
Microscopy and Microanalysis. Cambridge University Press. Roč. 29, S1 (2023), s. 1861-1862. ISSN 1431-9276. E-ISSN 1435-8115.
[Microscopy & Microanalysis 2023. 23.07.2023-27.07.2023, Minneapolis]
R&D Projects: GA ČR(CZ) GA22-34286S
Grant - others:AV ČR(CZ) StrategieAV21/26
Program: StrategieAV
Institutional support: RVO:68081731
Keywords : scanning low energy electron microscopy (SLEEM) * time-of-flight spectroscopy * graphene
OECD category: Electrical and electronic engineering
https://academic.oup.com/mam/article/29/Supplement_1/1861/7229038
Permanent Link: https://hdl.handle.net/11104/0345212 - 2.0571040 - ÚPT 2024 GB eng A - Abstract
Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Průcha, Lukáš - Piňos, Jakub - Müllerová, Ilona - Materna-Mikmeková, Eliška
Study of Graphene and Thin Foils by a Time-of-Flight Spectrometer for Low Landing Energies.
Microscopy and Microanalysis. Cambridge University Press. Roč. 28, S1 (2022), s. 2432-2434. ISSN 1431-9276. E-ISSN 1435-8115
R&D Projects: GA TA ČR(CZ) TN01000008
Grant - others:AV ČR(CZ) StrategieAV21/26
Program: StrategieAV
Institutional support: RVO:68081731
OECD category: Electrical and electronic engineering
https://academic.oup.com/mam/article/28/S1/2432/6997288
Permanent Link: https://hdl.handle.net/11104/0342355 - 3.0568482 - ÚPT 2023 RIV CZ eng A - Abstract
Paták, Aleš - Zouhar, Martin - Konvalina, Ivo - Materna-Mikmeková, Eliška - Průcha, Lukáš - Müllerová, Ilona - Charvátová Campbell, A.
Ab initio study of angle-resolved electron spectroscopy of graphene.
16th Multinational Congress on Microscopy, 16MCM, 04-09 September 2022, Brno, Czech Republic. Book of abstracts. Brno: Czechoslovak Microscopy Society, 2022 - (Krzyžánek, V.; Hrubanová, K.; Hozák, P.; Müllerová, I.; Šlouf, M.). s. 156-157. ISBN 978-80-11-02253-2.
[Multinational Congress on Microscopy /16./. 04.09.2022-09.09.2022, Brno]
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : density-functional theory * low-energy electron microscopy * many-body perturbation theory
OECD category: Electrical and electronic engineering
https://www.16mcm.cz/wp-content/uploads/2022/09/16MCM-abstract-book.pdf
Permanent Link: https://hdl.handle.net/11104/0339786 - 4.0568420 - ÚPT 2023 RIV CZ eng A - Abstract
Zouhar, Martin - Paták, Aleš - Konvalina, Ivo - Fořt, Tomáš - Materna-Mikmeková, Eliška
Energy-based calibration for quantitative STEM measurements and comparison with 2D-PAD.
16th Multinational Congress on Microscopy, 16MCM, 04-09 September 2022, Brno, Czech Republic. Book of abstracts. Brno: Czechoslovak Microscopy Society, 2022 - (Krzyžánek, V.; Hrubanová, K.; Hozák, P.; Müllerová, I.; Šlouf, M.). s. 450-451. ISBN 978-80-11-02253-2.
[Multinational Congress on Microscopy /16./. 04.09.2022-09.09.2022, Brno]
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : STEM segmented detector * pixelated detector * scanning electron microscopy * Monte Carlo simulations * ray tracing * quantitative imaging
OECD category: Optics (including laser optics and quantum optics)
https://www.16mcm.cz/wp-content/uploads/2022/09/16MCM-abstract-book.pdf
Permanent Link: https://hdl.handle.net/11104/0339731 - 5.0567527 - ÚPT 2023 CZ eng A - Abstract
Zouhar, Martin - Daniel, Benjamin - Konvalina, Ivo - Paták, Aleš - Piňos, Jakub - Materna-Mikmeková, Eliška
Effective IMFP of thin samples via the time-of-flight method.
16th Multinational Congress on Microscopy, 16MCM, 04-09 September 2022, Brno, Czech Republic. Book of abstracts. Brno: Czechoslovak Microscopy Society, 2022 - (Krzyžánek, V.; Hrubanová, K.; Hozák, P.; Müllerová, I.; Šlouf, M.). s. 168. ISBN 978-80-11-02253-2.
[Multinational Congress on Microscopy /16./. 04.09.2022-09.09.2022, Brno]
R&D Projects: GA ČR(CZ) GA22-34286S
Institutional support: RVO:68081731
Keywords : time‑of‑flight spectrometer * SLEEM * inelastic mean free path
OECD category: Electrical and electronic engineering
https://www.16mcm.cz/wp-content/uploads/2022/09/16MCM-abstract-book.pdf
Permanent Link: https://hdl.handle.net/11104/0338780 - 6.0567516 - ÚPT 2023 RIV CZ eng A - Abstract
Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Průcha, Lukáš - Piňos, Jakub - Müllerová, Ilona - Materna-Mikmeková, Eliška
Time-of-Flight Spectrometer for Low Landing Energies.
16th Multinational Congress on Microscopy, 16MCM, 04-09 September 2022, Brno, Czech Republic. Book of abstracts. Brno: Czechoslovak Microscopy Society, 2022 - (Krzyžánek, V.; Hrubanová, K.; Hozák, P.; Müllerová, I.; Šlouf, M.). s. 160-161. ISBN 978-80-11-02253-2.
[Multinational Congress on Microscopy /16./. 04.09.2022-09.09.2022, Brno]
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : time‑of‑flight spectrometer * graphene * inelastic mean free path * energy‑loss spectrum
OECD category: Electrical and electronic engineering
https://www.16mcm.cz/wp-content/uploads/2022/09/16MCM-abstract-book.pdf
Permanent Link: https://hdl.handle.net/11104/0338771 - 7.0552272 - ÚPT 2022 CZ eng A - Abstract
Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Piňos, Jakub - Průcha, Lukáš - Frank, Luděk - Müllerová, Ilona - Materna-Mikmeková, Eliška
Study of Graphene by a Time‑of‑Flight Spectrometer for Low Landing Energies.
15th International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) expanded to Geo-Eerth Science & Civil Design / Engineering (ES&CDE). Abstract book. Institute of Scientific Instruments of the CAS: Brno, 2021. s. 84.
[International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) /15./. 18.10.2021-19.10.2021, online]
Grant - others:AV ČR(CZ) StrategieAV21/6
Program: StrategieAV
Institutional support: RVO:68081731
Keywords : time‑of‑flight spectrometer * graphene * inelastic mean free path * energy‑loss spectrum * density‑functional theory
OECD category: Electrical and electronic engineering
https://ava2016-autumn.webnode.cz/
Permanent Link: http://hdl.handle.net/11104/0327405 - 8.0552268 - ÚPT 2022 CZ eng A - Abstract
Mikmeková, Šárka - Konvalina, Ivo - Müllerová, Ilona - Matsuda, K. - Ikeno, S.
Prospect of advanced microscopy in material research.
15th International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) expanded to Geo-Eerth Science & Civil Design / Engineering (ES&CDE). Abstract book. Institute of Scientific Instruments of the CAS: Brno, 2021. s. 88.
[International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) /15./. 18.10.2021-19.10.2021, online]
Institutional support: RVO:68081731
Keywords : SEM * SLEEM * advanced steels * light metals
https://icpmat2021.com/_files/200001189-a9feaa9fec/icpmat-2021-abstract-book.pdf
Permanent Link: http://hdl.handle.net/11104/0327400 - 9.0551134 - ÚPT 2022 RIV US eng A - Abstract
Materna-Mikmeková, Eliška - Konvalina, Ivo - Müllerová, Ilona - Lejeune, M. - Asefa, T.
Treatment and Observation of Advanced Carbon-based Nanomaterials by Slow Electrons.
Microscopy and Microanalysis. Cambridge University Press. Roč. 27, S2 (2020), s. 2682-2684. ISSN 1431-9276. E-ISSN 1435-8115
Institutional support: RVO:68081731
Keywords : carbon based nanomaterials * low energy electron microscopy * contamination * cleaning
OECD category: Materials engineering
https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/treatment-and-observation-of-advanced-carbonbased-nanomaterials-by-slow-electrons/6CE85FB178C91C6867E73A3AEBD6DE2D
Permanent Link: http://hdl.handle.net/11104/0326579 - 10.0551133 - ÚPT 2022 RIV US eng A - Abstract
Mikmeková, Šárka - Man, Jiří - Konvalina, Ivo
Microstructural characterization of 316L stainless steel fabricated by selective laser melting by advanced electron microscopy techniques.
Microscopy and Microanalysis. Cambridge University Press. Roč. 27, S1 (2021), s. 2666-2668. ISSN 1431-9276. E-ISSN 1435-8115
Institutional support: RVO:68081731 ; RVO:68081723
Keywords : SLM process * 316L steel * microstructure characterization
OECD category: Materials engineering; Materials engineering (UFM-A)
https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/microstructural-characterization-of-316l-stainless-steel-fabricated-by-selective-laser-melting-by-advanced-electron-microscopy-techniques/A40184BD363CD59B9DC79F83BB4627F0
Permanent Link: http://hdl.handle.net/11104/0326578