Search results

  1. 1.
    0574303 - ÚFM 2024 RIV NL eng J - Journal Article
    Ronoh, K. - Sobola, Dinara - Mrňa, Libor - Novotný, Jan - Dallaev, R. - Knápek, Alexandr - Kolařík, Vladimír - Holcman, V.
    Characterization of the picosecond laser-ablated HOPG using Raman spectroscopy and SEM microscopy.
    Materials Today Communications. Roč. 34, MARCH (2023), č. článku 105181. ISSN 2352-4928. E-ISSN 2352-4928
    R&D Projects: GA TA ČR(CZ) TN01000008
    Research Infrastructure: CzechNanoLab - 90110
    Institutional support: RVO:68081723 ; RVO:68081731
    Keywords : Highly oriented pyrolytic graphite * Laser ablation * Raman spectroscopy
    OECD category: Coating and films; Materials engineering (UPT-D)
    Impact factor: 3.8, year: 2022
    Method of publishing: Limited access
    https://www.sciencedirect.com/science/article/pii/S2352492822020220?via%3Dihub
    Permanent Link: https://hdl.handle.net/11104/0344649
     
     
  2. 2.
    0570569 - ÚPT 2023 RIV CZ cze J - Journal Article
    Matějka, Milan - Kolařík, Vladimír - Pavlačík, P. - Škoda, D. - Brunn, Ondřej - Sadílek, Jakub
    Difraktivní optický element pro realizaci svítícího bodu v záměrném kříži pro puškohledovou optiku.
    [Diffractive optical element for creating a illuminated point in a reticle for rifle scopes.]
    Jemná mechanika a optika. Roč. 68, č. 4 (2023), s. 87-90. ISSN 0447-6441
    R&D Projects: GA MPO(CZ) FV40197
    Institutional support: RVO:68081731
    Keywords : diffractive optical elements * electron beam lithography * reactive ion etching * sports optics
    OECD category: Optics (including laser optics and quantum optics)
    Method of publishing: Limited access
    https://jmo.fzu.cz/sites/jmo.fzu.cz/files/oldweb/2023/2023-04/jmo_23_04_obsah.pdf
    Permanent Link: https://hdl.handle.net/11104/0341873
     
     
  3. 3.
    0559083 - ÚPT 2023 RIV CZ cze J - Journal Article
    Krátký, Stanislav - Venos, Š. - Kolařík, Vladimír - Pokorný, Pavel - Úlehla, L.
    Příprava DOE generujících korigovaný gaussovský svazek pro aplikace s vysoce výkonnými lasery.
    [The fabrication of DOE for Gaussian beam adjustment in the field of high power lasers.]
    Jemná mechanika a optika. Roč. 67, č. 6 (2022), s. 138-141. ISSN 0447-6441
    R&D Projects: GA MPO(CZ) FV40197
    Institutional support: RVO:68081731
    Keywords : diffractive optical element * grayscale e-beam lithography * glass etching * Gaussian beam * laser beam machining
    OECD category: Optics (including laser optics and quantum optics)
    Method of publishing: Limited access
    https://jmo.fzu.cz/sites/jmo.fzu.cz/files/oldweb/2022/2022-06/jmo_22_06_obsah.pdf
    Permanent Link: https://hdl.handle.net/11104/0332543
     
     
  4. 4.
    0535207 - ÚPT 2021 RIV CZ cze J - Journal Article
    Knápek, Alexandr - Horáček, Miroslav - Krátký, Stanislav - Matějka, Milan - Brunn, Ondřej - Burda, Daniel - Kolařík, Vladimír
    Vlastnosti kvaziperiodických spirálových mikrostruktur.
    [Properties of quasiperiodic spiral microstrictures.]
    Jemná mechanika a optika. Roč. 65, č. 6 (2020), s. 175-178. ISSN 0447-6441
    R&D Projects: GA MV(CZ) VI20192022147
    Institutional support: RVO:68081731
    Keywords : planar phyllotactit model * electron beam lithography * diffractive optically variable image device
    OECD category: Optics (including laser optics and quantum optics)
    Method of publishing: Limited access
    https://jmo.fzu.cz/sites/jmo.fzu.cz/files/oldweb/2020/2020-06/jmo_20_06_obsah.pdf
    Permanent Link: http://hdl.handle.net/11104/0313290
     
     
  5. 5.
    0532029 - ÚPT 2021 RIV JO eng J - Journal Article
    Knápek, Alexandr - Drozd, Michal - Matějka, Milan - Chlumská, Jana - Král, Stanislav - Kolařík, Vladimír
    Automated System for Optical Inspection of Defects in Resist-coated Non-patterned Wafer.
    Jordan Journal of Physics. Roč. 13, č. 2 (2020), s. 93-100. ISSN 1994-7607. E-ISSN 1994-7615
    R&D Projects: GA MPO FV10618
    Institutional support: RVO:68081731
    Keywords : optical inspection * resist layer * non-patterned wafer * quality control
    OECD category: Automation and control systems
    Method of publishing: Open access
    http://journals.yu.edu.jo/jjp/JJPIssues/Vol13No2pdf2020/1.html
    Permanent Link: http://hdl.handle.net/11104/0310631
     
     
  6. 6.
    0525191 - ÚPT 2021 RIV SK eng J - Journal Article
    Matějka, Milan - Krátký, Stanislav - Řiháček, Tomáš - Knápek, Alexandr - Kolařík, Vladimír
    Functional nano-structuring of thin silicon nitride membranes.
    Journal of Electrical Engineering - Elektrotechnický časopis. Roč. 71, č. 2 (2020), s. 127-130. ISSN 1335-3632. E-ISSN 1339-309X
    R&D Projects: GA TA ČR(CZ) TN01000008; GA MŠMT ED0017/01/01
    Institutional support: RVO:68081731
    Keywords : membrane * nano optical device * electron optics * electron beam lithography * silicon nitride * reactive ion etching * silicon etching * microfabrication
    OECD category: Nano-processes (applications on nano-scale)
    Impact factor: 0.647, year: 2020
    Method of publishing: Open access
    https://content.sciendo.com/view/journals/jee/71/2/article-p127.xml
    Permanent Link: http://hdl.handle.net/11104/0309382
     
     
  7. 7.
    0517570 - ÚPT 2020 RIV CH eng J - Journal Article
    Knápek, Alexandr - Sobola, D. - Burda, Daniel - Daňhel, Aleš - Mousa, M. - Kolařík, Vladimír
    Polymer Graphite Pencil Lead as a Cheap Alternative for Classic Conductive SPM Probes.
    Nanomaterials. Roč. 9, č. 12 (2019), č. článku 1756. E-ISSN 2079-4991
    R&D Projects: GA MPO FV10618
    Institutional support: RVO:68081731 ; RVO:68081707
    Keywords : scanning tunneling microscopy * sharp tip formation * graphite
    OECD category: Nano-materials (production and properties); Nano-materials (production and properties) (BFU-R)
    Impact factor: 4.324, year: 2019
    Method of publishing: Open access
    https://www.mdpi.com/2079-4991/9/12/1756/htm
    Permanent Link: http://hdl.handle.net/11104/0302907
     
     
  8. 8.
    0501458 - ÚPT 2020 RIV SK eng J - Journal Article
    Kolařík, Vladimír - Horáček, Miroslav - Knápek, Alexandr - Krátký, Stanislav - Matějka, Milan - Meluzín, Petr
    Spiral arrangement: From nanostructures to packaging.
    Journal of Electrical Engineering - Elektrotechnický časopis. Roč. 70, č. 1 (2019), s. 74-77. ISSN 1335-3632. E-ISSN 1339-309X
    R&D Projects: GA MPO FV10618; GA TA ČR TG03010046; GA TA ČR TE01020233; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
    Institutional support: RVO:68081731
    Keywords : electron beam lithography * phyllotaxis * spiral arrangement * parastichy
    OECD category: Electrical and electronic engineering
    Impact factor: 0.686, year: 2019
    Method of publishing: Open access
    https://content.sciendo.com/view/journals/jee/70/1/article-p74.xml?lang=en
    Permanent Link: http://hdl.handle.net/11104/0293484
     
     
  9. 9.
    0477782 - ÚPT 2018 RIV NL eng J - Journal Article
    Krátký, Stanislav - Kolařík, Vladimír - Horáček, Miroslav - Meluzín, Petr - Král, Stanislav
    Combined e-beam lithography using different energies.
    Microelectronic Engineering. Roč. 177, JUN (2017), s. 30-34. ISSN 0167-9317. E-ISSN 1873-5568
    R&D Projects: GA TA ČR TE01020233; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
    Institutional support: RVO:68081731
    Keywords : grayscale e-beam lithography * mix and match process * absorbed energy density * resist sensitivity * micro-optical elements
    OECD category: Nano-processes (applications on nano-scale)
    Impact factor: 2.020, year: 2017
    Permanent Link: http://hdl.handle.net/11104/0274006
     
     
  10. 10.
    0454665 - ÚPT 2016 RIV NL eng J - Journal Article
    Bok, Jan - Horáček, Miroslav - Kolařík, Vladimír - Urbánek, Michal - Matějka, Milan - Krzyžánek, Vladislav
    Measurements of current density distribution in shaped e-beam writers.
    Microelectronic Engineering. Roč. 149, JAN 5 (2016), s. 117-124. ISSN 0167-9317. E-ISSN 1873-5568
    R&D Projects: GA ČR(CZ) GA14-20012S; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
    Institutional support: RVO:68081731
    Keywords : shaped e-beam writer * electron beam * current density
    Subject RIV: JB - Sensors, Measurment, Regulation
    Impact factor: 1.806, year: 2016
    Permanent Link: http://hdl.handle.net/11104/0255378
     
     

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