Search results
- 1.0434469 - ÚPT 2015 RIV US eng J - Journal Article
Čudek, P. - Jirák, Josef - Neděla, Vilém
Optimization of Signal Detection in Scintillation Secondary Electron Detector for ESEM and SEM.
Microscopy and Microanalysis. Roč. 19, S2 (2014), s. 40-41. ISSN 1431-9276. E-ISSN 1435-8115
R&D Projects: GA MŠMT EE.2.3.20.0103; GA ČR(CZ) GA14-22777S
Institutional support: RVO:68081731
Keywords : signal detection * scintillation secondary electron detector * ESEM * SEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.872, year: 2014
Permanent Link: http://hdl.handle.net/11104/0238537 - 2.0421170 - ÚPT 2014 RIV CZ eng J - Journal Article
Vyroubal, P. - Maxa, J. - Neděla, Vilém - Jirák, Josef - Hladká, K.
Apertures with Laval Nozzle and Circular Orifice in Secondary Electron Detector for Environmental Scanning Electron Microscope.
Advances in Military Technology. Roč. 8, č. 1 (2013), s. 59-69. ISSN 1802-2308
R&D Projects: GA ČR GAP102/10/1410
Institutional support: RVO:68081731
Keywords : Aperture * Laval nozzle * circular orifice * pressure * detector * Mach number * flow * trajectory of secondary electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0227591 - 3.0383890 - ÚPT 2013 RIV US eng J - Journal Article
Jirák, Josef - Čudek, P. - Neděla, Vilém
Scintillation secondary electron detector for ESEM and SEM.
Microscopy and Microanalysis. Roč. 18, Suppl. 2 (2012), s. 1266-1267. ISSN 1431-9276. E-ISSN 1435-8115
R&D Projects: GA ČR GAP102/10/1410; GA MŠMT EE.2.3.20.0103
Institutional support: RVO:68081731
Keywords : environmental scanning electron microscopes * scintillation detector * secondary electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 2.495, year: 2012
Permanent Link: http://hdl.handle.net/11104/0213687 - 4.0205644 - UPT-D 20030026 RIV US eng J - Journal Article
Autrata, Rudolf - Roubalíková, L. - Wandrol, Petr - Jirák, Josef
Study of Surface Tooth Treatment using Low-Vacuum Scanning Electron Microscopy.
Microscopy and Microanalysis. Roč. 9, Sup. 3 (2003), s. 428 - 429. ISSN 1431-9276. E-ISSN 1435-8115.
[MC 2003. Dresden, 07.09.2003-12.09.2003]
R&D Projects: GA ČR GA102/01/1271
Institutional research plan: CEZ:AV0Z2065902
Keywords : surface tooth treatment * scanning electron microscope * backscattered electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.648, year: 2003
Permanent Link: http://hdl.handle.net/11104/0101257 - 5.0204854 - UPT-D 960096 RIV CZ cze J - Journal Article
Autrata, Rudolf - Jirák, Josef - Špinka, Jiří
Rastrovací elektronová mikroskopie vlhkých vzorků a izolantů.
Jemná mechanika a optika. Roč. 41, č. 4 (1996), s. 98-100. ISSN 0447-6441
Permanent Link: http://hdl.handle.net/11104/0100474