Search results
- 1.0584778 - ÚPT 2024 CZ cze A - Abstract
Brunn, Ondřej - Knápek, Alexandr - Matějka, Milan - Krátký, Stanislav - Horáček, Miroslav - Meluzín, Petr - Chlumská, Jana - Sadílek, Jakub - Burda, Daniel - Král, Stanislav - Ondříšková, Martina - Podstránský, Jáchym - Košelová, Zuzana - Allaham, Mohammad M. - Kolařík, Vladimír
Elektronová litografie a funkční nanostruktury.
IMAPS Flash Conference. 9th International Microelectronics Assembly and Packaging Society Flash Conference. Extended abstracts. Brno: Brno University of Technology, FEEC, 2023 - (Otáhal, A.; Szendiuch, I.; Skácel, J.). s. 12-13. ISBN 978-80-214-6185-7.
[IMAPS Flash Conference 2023. International Microelectronics Assembly and Packaging Society Flash Conference /9./. 26.10.2023-27.10.2023, Brno]
Research Infrastructure: CzechNanoLab - 90110
Institutional support: RVO:68081731
OECD category: Electrical and electronic engineering
Permanent Link: https://hdl.handle.net/11104/0352625 - 2.0495256 - ÚPT 2019 CZ eng A - Abstract
Horáček, Miroslav - Meluzín, Petr - Krátký, Stanislav - Matějka, Milan - Knápek, Alexandr - Kolařík, Vladimír
Spiral Arrangement: from Nanostructures to Packaging.
IMAPS Flash Conference. 4th Interrnational Microelectronics Assembly and Packaging Society Flash Conference. Book of Abstracts. Brno: University of Technbology Brno, 2018. s. 62-63. ISBN 978-80-214-5680-8.
[IMAPS Flash Conference. Interrnational Microelectronics Assembly and Packaging Society Flash Conference /4./. 25.10.2018-26.10.2018, Brno]
Institutional support: RVO:68081731
Keywords : electron beam lithography * phyllotaxis * spiral arrangement * parastichy
OECD category: Electrical and electronic engineering
Permanent Link: http://hdl.handle.net/11104/0288490 - 3.0429465 - ÚPT 2015 GB eng A - Abstract
Krátký, Stanislav - Kolařík, Vladimír - Urbánek, Michal - Matějka, Milan - Horáček, Miroslav - Chlumská, Jana - Neděla, Vilém - Jaffrezic-Renault, N. - Krejčí, J. - Kučerová, R. - Plička, R. - Krejčí, T.
Differential conductometry biosensors prepared by lift-off technique by using of e-beam writer with shaped beam.
39th International Conference on Micro and Nano Engineering MNE2013. Book of Abstracts. Cambridge: University of Cambridge, 2013. s. 387.
[MNE2013. International Conference on Micro and Nano Engineering /39./. 16.09.2013-19.09.2013, London]
Institutional support: RVO:68081731
Keywords : differential conductometry biosensor * electron-beam lithography * microorganism detection
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0234577 - 4.0429463 - ÚPT 2015 GB eng A - Abstract
Urbánek, Michal - Matějka, Milan - Kolařík, Vladimír - Horáček, Miroslav - Krátký, Stanislav - Bok, Jan - Chlumská, Jana - Mikšík, P. - Vašina, J.
Variable shape E-beam writing: proximity effect simulation and correction of binary and relief structures.
39th International Conference on Micro and Nano Engineering MNE2013. Book of Abstracts. Cambridge: University of Cambridge, 2013. s. 582.
[MNE2013. International Conference on Micro and Nano Engineering /39./. 16.09.2013-19.09.2013, London]
Institutional support: RVO:68081731
Keywords : rectangular shaped beam * proximity effect simulation * binary structures and relief structures
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0234576 - 5.0325106 - ÚPT 2009 CZ eng A - Abstract
Horáček, Miroslav - Zobač, Martin - Vlček, Ivan
Floating Power Supply for Specimen Bias in Scanning Electron Microscope.
[Plovoucí zdroj pro předpětí vzorku v REM.]
Mikroskopia 2009. Brno: Tribun EU, 2009. s. 24. ISBN 978-80-7399-739-7.
[Mikroskopia 2009. 25.03.2009-26.03.2009, Stará Lesná]
R&D Projects: GA AV ČR IAA100650803
Institutional research plan: CEZ:AV0Z20650511
Keywords : floating power supply * scanning electron microscope
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0172632 - 6.0205305 - UPT-D 20000084 BG eng A - Abstract
Horáček, Miroslav - Dupák, Jan
Temperature Controlled Cathode Heating in Electron Beam Welding Machine.
Abstract Book - 6th International Conference on Electron Beam Technologies EBT 2000. Varna: Joliot Curie International House of Scientists, 2000. s. 46-47.
[EBT /6./ - Electron Beam Technologies. 04.06.2000-07.06.2000, Varna]
Institutional research plan: CEZ:AV0Z2065902
Subject RIV: JR - Other Machinery
Permanent Link: http://hdl.handle.net/11104/0100920 - 7.0205042 - UPT-D 980090 CZ cze A - Abstract
Dupák, Jan - Finger, M. - Finger jr., M. - Hanzelka, Pavel - Horáček, Miroslav - Janata, A. - Jarolímek, O. - Jelínek, Josef - Kasal, Miroslav - Kracíková, T. I. - Laub, M. - Linka, A. - Novák, R. - Nováková, D. - Ota, J. - Picek, J. - Slunečka, M. - Slunečková, V. - Sonský, M. - Srnka, Aleš - Šulc, M. - Virius, M. - Vognar, M. - Volf, P. - Zícha, J.
COMPASS - Common Muon and Proton Apparatus for Structure and Spetroscopy.
Sborník abstrakt Nukleonika '98. Praha: FJFI ČVUT, 1998. s. 23. ISBN 80-7073-066-8.
[NUKLEONIKA '98. 09.09.1998-10.09.1998, Praha]
Subject RIV: BG - Nuclear, Atomic and Molecular Physics, Colliders
Permanent Link: http://hdl.handle.net/11104/0100662 - 8.0204707 - UPT-D 950008 SI eng A - Abstract
Dupák, Jan - Kapounek, Petr - Horáček, Miroslav
Application of a New Welding Technology in Vacuum Equipment Design.
Book of Abstracts of Slovenian-Hungarian-Croatian-Austrian Sixth Joint Vacuum Conference. Bled: Slovenian Vacuum Society, 1995. s. 84.
[Vacuum Conference /6./ - Joint Slovenian-Hungarian-Croatian-Austrian. 04.04.1995-07.04.1995, Bled]
Permanent Link: http://hdl.handle.net/11104/0100327 - 9.0109072 - UPT-D 20040075 CZ cze A - Abstract
Horáček, Miroslav
Modulační přenosová funkce elektrony bombardovaného CCD.
[Modulation transfer function of electron-bombarded CCD.]
Mikroskopie 2004 - Přednášky. Brno: Československá mikroskopická společnost, 2004. s. 24.
[Mikroskopie 2004. 11.03.2004-12.03.2004, Nové Město na Moravě]
Institutional research plan: CEZ:AV0Z2065902
Keywords : electron-bombarded CCD
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0016184